JPWO2023167162A1 - - Google Patents

Info

Publication number
JPWO2023167162A1
JPWO2023167162A1 JP2024504685A JP2024504685A JPWO2023167162A1 JP WO2023167162 A1 JPWO2023167162 A1 JP WO2023167162A1 JP 2024504685 A JP2024504685 A JP 2024504685A JP 2024504685 A JP2024504685 A JP 2024504685A JP WO2023167162 A1 JPWO2023167162 A1 JP WO2023167162A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2024504685A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2023167162A1 publication Critical patent/JPWO2023167162A1/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2545Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2024504685A 2022-03-01 2023-02-28 Pending JPWO2023167162A1 (enExample)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022031209 2022-03-01
PCT/JP2023/007197 WO2023167162A1 (ja) 2022-03-01 2023-02-28 ドットパターン生成方法及び3次元計測装置

Publications (1)

Publication Number Publication Date
JPWO2023167162A1 true JPWO2023167162A1 (enExample) 2023-09-07

Family

ID=87883708

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024504685A Pending JPWO2023167162A1 (enExample) 2022-03-01 2023-02-28

Country Status (3)

Country Link
EP (1) EP4488619A1 (enExample)
JP (1) JPWO2023167162A1 (enExample)
WO (1) WO2023167162A1 (enExample)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59182689A (ja) 1983-03-31 1984-10-17 Toshiba Corp ステレオ視処理装置
US10054430B2 (en) * 2011-08-09 2018-08-21 Apple Inc. Overlapping pattern projector
JP2020071034A (ja) * 2018-10-29 2020-05-07 セイコーエプソン株式会社 三次元計測方法、三次元計測装置、及び、ロボットシステム
US11029408B2 (en) * 2019-04-03 2021-06-08 Varjo Technologies Oy Distance-imaging system and method of distance imaging
JP7741875B2 (ja) * 2021-05-31 2025-09-18 興和株式会社 3次元計測装置

Also Published As

Publication number Publication date
WO2023167162A1 (ja) 2023-09-07
EP4488619A1 (en) 2025-01-08

Similar Documents

Publication Publication Date Title
BR102022025291A2 (enExample)
BR102023014872A2 (enExample)
BR102023010976A2 (enExample)
BR102023009641A2 (enExample)
BR102023008688A2 (enExample)
BR102023007252A2 (enExample)
BR102023005164A2 (enExample)
BR102023001987A2 (enExample)
BR102023000289A2 (enExample)
BR202022009269U2 (enExample)
BR202022005961U2 (enExample)
BR202022001779U2 (enExample)
BR202022000931U2 (enExample)
BY13144U (enExample)
BY13153U (enExample)
BY13135U (enExample)
BY13136U (enExample)
BY13137U (enExample)
BY13138U (enExample)
BY13139U (enExample)
BY13140U (enExample)
BY13141U (enExample)
BY13142U (enExample)
BY13143U (enExample)
CN307048439S (enExample)