JPWO2023120189A5 - - Google Patents

Download PDF

Info

Publication number
JPWO2023120189A5
JPWO2023120189A5 JP2023569285A JP2023569285A JPWO2023120189A5 JP WO2023120189 A5 JPWO2023120189 A5 JP WO2023120189A5 JP 2023569285 A JP2023569285 A JP 2023569285A JP 2023569285 A JP2023569285 A JP 2023569285A JP WO2023120189 A5 JPWO2023120189 A5 JP WO2023120189A5
Authority
JP
Japan
Prior art keywords
information processing
distribution
unevenness
luminance value
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2023569285A
Other languages
English (en)
Japanese (ja)
Other versions
JP7720924B2 (ja
JPWO2023120189A1 (cg-RX-API-DMAC7.html
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/JP2022/045083 external-priority patent/WO2023120189A1/ja
Publication of JPWO2023120189A1 publication Critical patent/JPWO2023120189A1/ja
Publication of JPWO2023120189A5 publication Critical patent/JPWO2023120189A5/ja
Application granted granted Critical
Publication of JP7720924B2 publication Critical patent/JP7720924B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2023569285A 2021-12-21 2022-12-07 情報処理方法、情報処理装置及び記憶媒体 Active JP7720924B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021206997 2021-12-21
JP2021206997 2021-12-21
PCT/JP2022/045083 WO2023120189A1 (ja) 2021-12-21 2022-12-07 情報処理方法、情報処理装置及び記憶媒体

Publications (3)

Publication Number Publication Date
JPWO2023120189A1 JPWO2023120189A1 (cg-RX-API-DMAC7.html) 2023-06-29
JPWO2023120189A5 true JPWO2023120189A5 (cg-RX-API-DMAC7.html) 2024-08-23
JP7720924B2 JP7720924B2 (ja) 2025-08-08

Family

ID=86902276

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023569285A Active JP7720924B2 (ja) 2021-12-21 2022-12-07 情報処理方法、情報処理装置及び記憶媒体

Country Status (5)

Country Link
US (1) US20250045906A1 (cg-RX-API-DMAC7.html)
JP (1) JP7720924B2 (cg-RX-API-DMAC7.html)
KR (1) KR20240125648A (cg-RX-API-DMAC7.html)
CN (1) CN118382918A (cg-RX-API-DMAC7.html)
WO (1) WO2023120189A1 (cg-RX-API-DMAC7.html)

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI278995B (en) * 2002-01-28 2007-04-11 Nichia Corp Nitride semiconductor element with a supporting substrate and a method for producing a nitride semiconductor element
JP4538845B2 (ja) * 2004-04-21 2010-09-08 富士ゼロックス株式会社 故障診断方法および故障診断装置、画像形成装置、並びにプログラムおよび記憶媒体
WO2010115167A2 (en) * 2009-04-03 2010-10-07 The Regents Of The University Of California Methods and devices for sorting cells and other biological particulates
JP5409677B2 (ja) 2011-03-16 2014-02-05 東京エレクトロン株式会社 画像作成方法、基板検査方法、その画像作成方法又はその基板検査方法を実行させるためのプログラムを記録した記録媒体及び基板検査装置
JP6002112B2 (ja) * 2013-11-07 2016-10-05 東京エレクトロン株式会社 基板の欠陥分析装置、基板処理システム、基板の欠陥分析方法、プログラム及びコンピュータ記憶媒体
US11669955B2 (en) 2018-06-21 2023-06-06 Tokyo Electron Limited Substrate defect inspection method, storage medium, and substrate defect inspection apparatus
TWI845690B (zh) 2019-06-06 2024-06-21 日商東京威力科創股份有限公司 基板檢查裝置、基板檢查系統、基板檢查方法及電腦程式產品
KR20230003953A (ko) * 2021-06-30 2023-01-06 한국전자기술연구원 환경 변화 적응형 특징 생성기를 적용한 차량용 경량 딥러닝 처리 장치 및 방법

Similar Documents

Publication Publication Date Title
CN111474184B (zh) 基于工业机器视觉的aoi字符缺陷检测方法和装置
CN113766209B (zh) 相机偏移量处理方法及装置
KR102915961B1 (ko) 비전 시스템을 갖는 이미지에서 패턴을 찾고 분류하기 위한 시스템 및 방법
SA521430728B1 (ar) التعرف على موقف مركبات والانتقال إليه بناءً على صورة
US8781254B2 (en) Method, an apparatus and a computer program for data processing
JP2018198053A5 (cg-RX-API-DMAC7.html)
US20200357106A1 (en) Method for detecting defects, electronic device, and computer readable medium
CN107194402B (zh) 一种并行细化骨架提取方法
CN110596120A (zh) 玻璃边界缺陷检测方法、装置、终端及存储介质
CN110598687A (zh) 车辆识别码的检测方法、装置及计算机设备
CN110335274B (zh) 一种三维模具缺陷检测方法及装置
RU2008129793A (ru) Способ улучшения последующей обработки изображений с использованием деформируемых сеток
CN107123146A (zh) 一种标定板图像的标志物定位方法和系统
CN111444911B (zh) 车牌识别模型的训练方法及装置、车牌识别方法及装置
CN115170512B (zh) 缺陷分类识别方法及装置、存储介质及电子设备
CN112801013B (zh) 一种基于关键点识别校验的人脸识别方法、系统及装置
JP2021024223A5 (cg-RX-API-DMAC7.html)
JP2005218581A5 (cg-RX-API-DMAC7.html)
JP3886471B2 (ja) 画像処理装置
JP2016123044A5 (ja) 被写体追跡装置、方法およびプログラム
WO2017071406A1 (zh) 金针类元件的引脚检测方法和系统
CN106360941B (zh) 一种指甲定位方法及美甲设备
CN117333441A (zh) 一种基于图像数据的pcb板缺陷检测方法及系统
JPWO2023120189A5 (cg-RX-API-DMAC7.html)
CN119579990B (zh) 一种红外图像小目标识别方法、装置及可读存储介质