JPWO2023112330A1 - - Google Patents
Info
- Publication number
- JPWO2023112330A1 JPWO2023112330A1 JP2023567498A JP2023567498A JPWO2023112330A1 JP WO2023112330 A1 JPWO2023112330 A1 JP WO2023112330A1 JP 2023567498 A JP2023567498 A JP 2023567498A JP 2023567498 A JP2023567498 A JP 2023567498A JP WO2023112330 A1 JPWO2023112330 A1 JP WO2023112330A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/62—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
- G03F1/80—Etching
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2021/046825 WO2023112330A1 (en) | 2021-12-17 | 2021-12-17 | Si membrane structure used to produce pellicle, and method for producing pellicle |
Publications (1)
Publication Number | Publication Date |
---|---|
JPWO2023112330A1 true JPWO2023112330A1 (en) | 2023-06-22 |
Family
ID=86773958
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2023567498A Pending JPWO2023112330A1 (en) | 2021-12-17 | 2021-12-17 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPWO2023112330A1 (en) |
WO (1) | WO2023112330A1 (en) |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7456932B2 (en) * | 2003-07-25 | 2008-11-25 | Asml Netherlands B.V. | Filter window, lithographic projection apparatus, filter window manufacturing method, device manufacturing method and device manufactured thereby |
JP6753703B2 (en) * | 2016-02-19 | 2020-09-09 | エア・ウォーター株式会社 | Method for manufacturing compound semiconductor substrate, pellicle film, and compound semiconductor substrate |
KR101900720B1 (en) * | 2017-11-10 | 2018-09-20 | 주식회사 에스앤에스텍 | Pellicle for Extreme Ultraviolet(EUV) Lithography and Method for fabricating the same |
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2021
- 2021-12-17 JP JP2023567498A patent/JPWO2023112330A1/ja active Pending
- 2021-12-17 WO PCT/JP2021/046825 patent/WO2023112330A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
WO2023112330A1 (en) | 2023-06-22 |
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Legal Events
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Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20240909 |
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