JPWO2023095769A1 - - Google Patents
Info
- Publication number
- JPWO2023095769A1 JPWO2023095769A1 JP2023563685A JP2023563685A JPWO2023095769A1 JP WO2023095769 A1 JPWO2023095769 A1 JP WO2023095769A1 JP 2023563685 A JP2023563685 A JP 2023563685A JP 2023563685 A JP2023563685 A JP 2023563685A JP WO2023095769 A1 JPWO2023095769 A1 JP WO2023095769A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/22—Masks or mask blanks for imaging by radiation of 100nm or shorter wavelength, e.g. X-ray masks, extreme ultraviolet [EUV] masks; Preparation thereof
- G03F1/24—Reflection masks; Preparation thereof
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/54—Absorbers, e.g. of opaque materials
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2021190273 | 2021-11-24 | ||
PCT/JP2022/043116 WO2023095769A1 (ja) | 2021-11-24 | 2022-11-22 | 反射型フォトマスクブランク及び反射型フォトマスク |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2023095769A1 true JPWO2023095769A1 (ja) | 2023-06-01 |
JPWO2023095769A5 JPWO2023095769A5 (ja) | 2024-06-13 |
Family
ID=86539435
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2023563685A Pending JPWO2023095769A1 (ja) | 2021-11-24 | 2022-11-22 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPWO2023095769A1 (ja) |
WO (1) | WO2023095769A1 (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20240006594A (ko) | 2022-07-05 | 2024-01-15 | 에이지씨 가부시키가이샤 | 반사형 마스크 블랭크, 반사형 마스크, 반사형 마스크 블랭크의 제조 방법 및 반사형 마스크의 제조 방법 |
WO2024029409A1 (ja) * | 2022-08-03 | 2024-02-08 | Agc株式会社 | 反射型マスクブランク及び反射型マスク |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPWO2019225737A1 (ja) * | 2018-05-25 | 2021-06-10 | Hoya株式会社 | 反射型マスクブランク、反射型マスク、並びに反射型マスク及び半導体装置の製造方法 |
JP7250511B2 (ja) * | 2018-12-27 | 2023-04-03 | Hoya株式会社 | 反射型マスクブランク、反射型マスク、及び半導体装置の製造方法 |
KR20240033148A (ko) * | 2019-10-29 | 2024-03-12 | 에이지씨 가부시키가이샤 | 반사형 마스크 블랭크 및 반사형 마스크 |
JPWO2021132111A1 (ja) * | 2019-12-27 | 2021-07-01 |
-
2022
- 2022-11-22 WO PCT/JP2022/043116 patent/WO2023095769A1/ja active Application Filing
- 2022-11-22 JP JP2023563685A patent/JPWO2023095769A1/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
WO2023095769A1 (ja) | 2023-06-01 |
TW202336519A (zh) | 2023-09-16 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20240325 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20240325 |