JPWO2022269301A1 - - Google Patents
Info
- Publication number
- JPWO2022269301A1 JPWO2022269301A1 JP2023529138A JP2023529138A JPWO2022269301A1 JP WO2022269301 A1 JPWO2022269301 A1 JP WO2022269301A1 JP 2023529138 A JP2023529138 A JP 2023529138A JP 2023529138 A JP2023529138 A JP 2023529138A JP WO2022269301 A1 JPWO2022269301 A1 JP WO2022269301A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/57—Measuring gloss
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/IB2021/000415 WO2022269301A1 (en) | 2021-06-21 | 2021-06-21 | Coating evaluation device and coating evaluation method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2022269301A1 true JPWO2022269301A1 (en) | 2022-12-29 |
| JPWO2022269301A5 JPWO2022269301A5 (en) | 2024-04-17 |
Family
ID=84545453
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2023529138A Pending JPWO2022269301A1 (en) | 2021-06-21 | 2021-06-21 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPWO2022269301A1 (en) |
| WO (1) | WO2022269301A1 (en) |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3106849B2 (en) * | 1994-05-19 | 2000-11-06 | 日産自動車株式会社 | Painted surface property measuring device |
| JP3185599B2 (en) * | 1995-04-17 | 2001-07-11 | 日産自動車株式会社 | Surface defect inspection equipment |
| JP3514122B2 (en) * | 1998-06-25 | 2004-03-31 | 日産自動車株式会社 | Surface defect inspection equipment |
| JP2001099632A (en) * | 1999-10-01 | 2001-04-13 | Arc Harima Kk | Normal reflection type surface shape measuring method and device with ccd camera |
| JP4633245B2 (en) * | 2000-11-06 | 2011-02-16 | 住友化学株式会社 | Surface inspection apparatus and surface inspection method |
| BR102016028266A2 (en) * | 2016-12-01 | 2018-06-19 | Autaza Tecnologia Ltda - Epp | METHOD AND SYSTEM FOR AUTOMATIC QUALITY INSPECTION OF MATERIALS |
| US10875592B2 (en) * | 2018-08-16 | 2020-12-29 | Carl Zeiss Industrielle Messtechnik Gmbh | Automobile manufacturing plant and method |
| JP2021056117A (en) * | 2019-09-30 | 2021-04-08 | 日立造船株式会社 | Evaluation device, evaluation system, control program, and method for evaluation |
-
2021
- 2021-06-21 JP JP2023529138A patent/JPWO2022269301A1/ja active Pending
- 2021-06-21 WO PCT/IB2021/000415 patent/WO2022269301A1/en active Application Filing
Also Published As
| Publication number | Publication date |
|---|---|
| WO2022269301A1 (en) | 2022-12-29 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A529 | Written submission of copy of amendment under article 34 pct |
Free format text: JAPANESE INTERMEDIATE CODE: A5211 Effective date: 20231122 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20231122 |