JPWO2022259444A1 - - Google Patents

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Publication number
JPWO2022259444A1
JPWO2022259444A1 JP2021568822A JP2021568822A JPWO2022259444A1 JP WO2022259444 A1 JPWO2022259444 A1 JP WO2022259444A1 JP 2021568822 A JP2021568822 A JP 2021568822A JP 2021568822 A JP2021568822 A JP 2021568822A JP WO2022259444 A1 JPWO2022259444 A1 JP WO2022259444A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2021568822A
Other languages
Japanese (ja)
Other versions
JPWO2022259444A5 (en
JP7123519B1 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
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Publication of JP7123519B1 publication Critical patent/JP7123519B1/en
Publication of JPWO2022259444A1 publication Critical patent/JPWO2022259444A1/ja
Publication of JPWO2022259444A5 publication Critical patent/JPWO2022259444A5/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
JP2021568822A 2021-06-10 2021-06-10 Eddy current inspection method Active JP7123519B1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2021/022046 WO2022259444A1 (en) 2021-06-10 2021-06-10 Eddy current inspection method

Publications (3)

Publication Number Publication Date
JP7123519B1 JP7123519B1 (en) 2022-08-23
JPWO2022259444A1 true JPWO2022259444A1 (en) 2022-12-15
JPWO2022259444A5 JPWO2022259444A5 (en) 2023-05-23

Family

ID=82942152

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021568822A Active JP7123519B1 (en) 2021-06-10 2021-06-10 Eddy current inspection method

Country Status (3)

Country Link
JP (1) JP7123519B1 (en)
CN (1) CN115943304A (en)
WO (1) WO2022259444A1 (en)

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU563615A1 (en) * 1975-01-15 1977-06-30 Московский Ордена Ленина Энергетический Институт Eddy current convertor
JP3753499B2 (en) * 1997-04-14 2006-03-08 株式会社竹中工務店 Magnetic flaw detection apparatus and method
JP2003035738A (en) * 2001-07-19 2003-02-07 Omron Corp Method and apparatus for checking component mounting substrate
US6975108B2 (en) * 2003-11-13 2005-12-13 Yuli Bilik Methods and devices for eddy current PCB inspection
US7312608B2 (en) * 2005-11-03 2007-12-25 The Boeing Company Systems and methods for inspecting electrical conductivity in composite materials
JP2009229337A (en) * 2008-03-25 2009-10-08 Hioki Ee Corp Electrode inspection apparatus
JP5287662B2 (en) 2009-10-30 2013-09-11 パナソニック株式会社 Dehumidifier
JP2015052467A (en) * 2013-09-05 2015-03-19 国立大学法人東京工業大学 Compound material inspection device and method

Also Published As

Publication number Publication date
CN115943304A (en) 2023-04-07
WO2022259444A1 (en) 2022-12-15
JP7123519B1 (en) 2022-08-23

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