JPWO2022249321A1 - - Google Patents

Info

Publication number
JPWO2022249321A1
JPWO2022249321A1 JP2023523794A JP2023523794A JPWO2022249321A1 JP WO2022249321 A1 JPWO2022249321 A1 JP WO2022249321A1 JP 2023523794 A JP2023523794 A JP 2023523794A JP 2023523794 A JP2023523794 A JP 2023523794A JP WO2022249321 A1 JPWO2022249321 A1 JP WO2022249321A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023523794A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2022249321A1 publication Critical patent/JPWO2022249321A1/ja
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/56—Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30181—Earth observation
    • G06T2207/30184—Infrastructure
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30242—Counting objects in image

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Quality & Reliability (AREA)
  • Multimedia (AREA)
  • Geometry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2023523794A 2021-05-26 2021-05-26 Pending JPWO2022249321A1 (https=)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2021/019974 WO2022249321A1 (ja) 2021-05-26 2021-05-26 ひび割れ画像点検システムおよび方法

Publications (1)

Publication Number Publication Date
JPWO2022249321A1 true JPWO2022249321A1 (https=) 2022-12-01

Family

ID=84228553

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023523794A Pending JPWO2022249321A1 (https=) 2021-05-26 2021-05-26

Country Status (3)

Country Link
US (1) US20240223878A1 (https=)
JP (1) JPWO2022249321A1 (https=)
WO (1) WO2022249321A1 (https=)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011118065A1 (ja) * 2010-03-23 2011-09-29 富士フイルム株式会社 撮影装置及びその制御方法、並びに三次元情報測定装置
JP2014130744A (ja) * 2012-12-28 2014-07-10 Toki Corporation Kk 発光装置および光照射装置
JP2015184056A (ja) * 2014-03-20 2015-10-22 株式会社東芝 計測装置、方法及びプログラム
CN106018411A (zh) * 2016-05-09 2016-10-12 广州市九州旗建筑科技有限公司 一种裂缝宽度的测量计算方法及测量装置
JP2019039897A (ja) * 2017-08-27 2019-03-14 圭浩 佐藤 コンクリート表面のひび割れ検出方法及び検出プログラム
JP2019144191A (ja) * 2018-02-23 2019-08-29 株式会社市川工務店 橋梁などの構造物を検査するための画像処理システム、画像処理方法及びプログラム

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5070401A (en) * 1990-04-09 1991-12-03 Welch Allyn, Inc. Video measurement system with automatic calibration and distortion correction
JP5385593B2 (ja) * 2008-11-18 2014-01-08 大成建設株式会社 ひび割れ検出方法
WO2012159214A1 (en) * 2011-05-25 2012-11-29 Obzerv Technologies Inc. Active imaging device having field of view and field of illumination with corresponding rectangular aspect ratios
US10268885B2 (en) * 2013-04-15 2019-04-23 Microsoft Technology Licensing, Llc Extracting true color from a color and infrared sensor
US10267729B2 (en) * 2014-05-09 2019-04-23 Kairos Aerospace Inc. Systems and methods for detecting gas leaks
JP7031262B2 (ja) * 2017-12-04 2022-03-08 富士通株式会社 撮像処理プログラム、撮像処理方法、及び撮像処理装置
US10942362B2 (en) * 2018-10-02 2021-03-09 Himax Technologies Limited Projector, electronic device having projector, and method for obtaining depth information of image data
WO2021213705A1 (en) * 2020-04-23 2021-10-28 Technische Universiteit Eindhoven Method and system for determining one or more dimensions of one or more structures on a sample surface

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011118065A1 (ja) * 2010-03-23 2011-09-29 富士フイルム株式会社 撮影装置及びその制御方法、並びに三次元情報測定装置
JP2014130744A (ja) * 2012-12-28 2014-07-10 Toki Corporation Kk 発光装置および光照射装置
JP2015184056A (ja) * 2014-03-20 2015-10-22 株式会社東芝 計測装置、方法及びプログラム
CN106018411A (zh) * 2016-05-09 2016-10-12 广州市九州旗建筑科技有限公司 一种裂缝宽度的测量计算方法及测量装置
JP2019039897A (ja) * 2017-08-27 2019-03-14 圭浩 佐藤 コンクリート表面のひび割れ検出方法及び検出プログラム
JP2019144191A (ja) * 2018-02-23 2019-08-29 株式会社市川工務店 橋梁などの構造物を検査するための画像処理システム、画像処理方法及びプログラム

Also Published As

Publication number Publication date
WO2022249321A1 (ja) 2022-12-01
US20240223878A1 (en) 2024-07-04

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