JPWO2022191201A1 - - Google Patents
Info
- Publication number
- JPWO2022191201A1 JPWO2022191201A1 JP2023505583A JP2023505583A JPWO2022191201A1 JP WO2022191201 A1 JPWO2022191201 A1 JP WO2022191201A1 JP 2023505583 A JP2023505583 A JP 2023505583A JP 2023505583 A JP2023505583 A JP 2023505583A JP WO2022191201 A1 JPWO2022191201 A1 JP WO2022191201A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02056—Passive reduction of errors
- G01B9/02059—Reducing effect of parasitic reflections, e.g. cyclic errors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/0207—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02097—Self-interferometers
- G01B9/02098—Shearing interferometers
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optical Transform (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2021038743 | 2021-03-10 | ||
PCT/JP2022/010067 WO2022191201A1 (ja) | 2021-03-10 | 2022-03-08 | 物理量測定装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPWO2022191201A1 true JPWO2022191201A1 (ja) | 2022-09-15 |
Family
ID=83226779
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2023505583A Pending JPWO2022191201A1 (ja) | 2021-03-10 | 2022-03-08 |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP4306902A1 (ja) |
JP (1) | JPWO2022191201A1 (ja) |
CA (1) | CA3222615A1 (ja) |
WO (1) | WO2022191201A1 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPWO2023182359A1 (ja) * | 2022-03-24 | 2023-09-28 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2641861B1 (fr) * | 1989-01-18 | 1993-04-30 | Photonetics | Dispositif de mesure opto-electronique |
JPH0581649U (ja) * | 1992-04-10 | 1993-11-05 | 株式会社小野測器 | 光ファイバセンサ |
JP3150239B2 (ja) * | 1993-08-31 | 2001-03-26 | キヤノン株式会社 | 微小周期振動変位の測定装置 |
JP2000292705A (ja) * | 1999-04-05 | 2000-10-20 | Olympus Optical Co Ltd | 走査型顕微鏡 |
US7259862B2 (en) | 2004-09-20 | 2007-08-21 | Opsens Inc. | Low-coherence interferometry optical sensor using a single wedge polarization readout interferometer |
-
2022
- 2022-03-08 CA CA3222615A patent/CA3222615A1/en active Pending
- 2022-03-08 JP JP2023505583A patent/JPWO2022191201A1/ja active Pending
- 2022-03-08 EP EP22767155.9A patent/EP4306902A1/en active Pending
- 2022-03-08 WO PCT/JP2022/010067 patent/WO2022191201A1/ja active Application Filing
Also Published As
Publication number | Publication date |
---|---|
EP4306902A1 (en) | 2024-01-17 |
WO2022191201A1 (ja) | 2022-09-15 |
CA3222615A1 (en) | 2022-09-15 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20230905 |