JPWO2022172736A1 - - Google Patents

Info

Publication number
JPWO2022172736A1
JPWO2022172736A1 JP2022581299A JP2022581299A JPWO2022172736A1 JP WO2022172736 A1 JPWO2022172736 A1 JP WO2022172736A1 JP 2022581299 A JP2022581299 A JP 2022581299A JP 2022581299 A JP2022581299 A JP 2022581299A JP WO2022172736 A1 JPWO2022172736 A1 JP WO2022172736A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022581299A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2022172736A1 publication Critical patent/JPWO2022172736A1/ja
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F20/00Homopolymers and copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride, ester, amide, imide or nitrile thereof
    • C08F20/02Monocarboxylic acids having less than ten carbon atoms, Derivatives thereof
    • C08F20/10Esters
    • C08F20/12Esters of monohydric alcohols or phenols
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/039Macromolecular compounds which are photodegradable, e.g. positive electron resists
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Materials For Photolithography (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
JP2022581299A 2021-02-10 2022-01-24 Pending JPWO2022172736A1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021019786 2021-02-10
PCT/JP2022/002365 WO2022172736A1 (ja) 2021-02-10 2022-01-24 感放射線性樹脂組成物及びパターン形成方法

Publications (1)

Publication Number Publication Date
JPWO2022172736A1 true JPWO2022172736A1 (ja) 2022-08-18

Family

ID=82838712

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022581299A Pending JPWO2022172736A1 (ja) 2021-02-10 2022-01-24

Country Status (3)

Country Link
JP (1) JPWO2022172736A1 (ja)
TW (1) TW202233570A (ja)
WO (1) WO2022172736A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023048128A1 (ja) * 2021-09-24 2023-03-30 東京応化工業株式会社 レジスト組成物、レジストパターン形成方法、化合物及び酸発生剤

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5673670B2 (ja) * 2010-03-17 2015-02-18 Jsr株式会社 感放射線性樹脂組成物及びレジストパターン形成方法
WO2015174215A1 (ja) * 2014-05-12 2015-11-19 富士フイルム株式会社 感活性光線性又は感放射線性樹脂組成物、感活性光線性又は感放射線性膜、パターン形成方法、電子デバイスの製造方法及び電子デバイス
JP7042613B2 (ja) * 2017-12-28 2022-03-28 東京応化工業株式会社 レジスト組成物、及びレジストパターン形成方法
JP7172975B2 (ja) * 2019-01-16 2022-11-16 信越化学工業株式会社 新規オニウム塩、化学増幅レジスト組成物、及びパターン形成方法

Also Published As

Publication number Publication date
WO2022172736A1 (ja) 2022-08-18
TW202233570A (zh) 2022-09-01

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Legal Events

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A621 Written request for application examination

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Effective date: 20240430