JPWO2022163007A1 - - Google Patents
Info
- Publication number
- JPWO2022163007A1 JPWO2022163007A1 JP2022578036A JP2022578036A JPWO2022163007A1 JP WO2022163007 A1 JPWO2022163007 A1 JP WO2022163007A1 JP 2022578036 A JP2022578036 A JP 2022578036A JP 2022578036 A JP2022578036 A JP 2022578036A JP WO2022163007 A1 JPWO2022163007 A1 JP WO2022163007A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Surgical Instruments (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021012840 | 2021-01-29 | ||
| PCT/JP2021/034421 WO2022163007A1 (ja) | 2021-01-29 | 2021-09-17 | プローブ装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2022163007A1 true JPWO2022163007A1 (ja) | 2022-08-04 |
| JPWO2022163007A5 JPWO2022163007A5 (ja) | 2023-09-05 |
Family
ID=82654404
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022578036A Pending JPWO2022163007A1 (ja) | 2021-01-29 | 2021-09-17 |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JPWO2022163007A1 (ja) |
| CN (1) | CN220543002U (ja) |
| TW (1) | TWI802047B (ja) |
| WO (1) | WO2022163007A1 (ja) |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8641446B1 (en) * | 2012-07-27 | 2014-02-04 | Chin Nan Precision Electronics Co., Ltd. | Coaxial probe |
| JP6597915B2 (ja) * | 2016-12-22 | 2019-10-30 | 株式会社村田製作所 | プローブ構造 |
| JP6711469B2 (ja) * | 2017-10-06 | 2020-06-17 | 株式会社村田製作所 | プローブ |
| KR102538245B1 (ko) * | 2018-11-19 | 2023-05-31 | 가부시키가이샤 무라타 세이사쿠쇼 | 프로브 |
| CN113167813A (zh) * | 2018-11-29 | 2021-07-23 | 株式会社村田制作所 | 探针嵌合构造以及探针 |
| JP3226821U (ja) * | 2020-02-07 | 2020-07-27 | 株式会社村田製作所 | 多極コネクタを測定するためのプローブ |
-
2021
- 2021-09-17 JP JP2022578036A patent/JPWO2022163007A1/ja active Pending
- 2021-09-17 CN CN202190000982.8U patent/CN220543002U/zh active Active
- 2021-09-17 WO PCT/JP2021/034421 patent/WO2022163007A1/ja active Application Filing
- 2021-10-18 TW TW110138549A patent/TWI802047B/zh active
Also Published As
| Publication number | Publication date |
|---|---|
| TWI802047B (zh) | 2023-05-11 |
| CN220543002U (zh) | 2024-02-27 |
| WO2022163007A1 (ja) | 2022-08-04 |
| TW202238140A (zh) | 2022-10-01 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20230616 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20230616 |