JPWO2022145092A1 - - Google Patents

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Publication number
JPWO2022145092A1
JPWO2022145092A1 JP2022572910A JP2022572910A JPWO2022145092A1 JP WO2022145092 A1 JPWO2022145092 A1 JP WO2022145092A1 JP 2022572910 A JP2022572910 A JP 2022572910A JP 2022572910 A JP2022572910 A JP 2022572910A JP WO2022145092 A1 JPWO2022145092 A1 JP WO2022145092A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2022572910A
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JP7503151B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication of JPWO2022145092A1 publication Critical patent/JPWO2022145092A1/ja
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Publication of JP7503151B2 publication Critical patent/JP7503151B2/ja
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Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2022572910A 2020-12-28 2021-09-10 電子制御装置、車載装置の診断方法 Active JP7503151B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020218806 2020-12-28
JP2020218806 2020-12-28
PCT/JP2021/033337 WO2022145092A1 (ja) 2020-12-28 2021-09-10 電子制御装置、車載装置の診断方法

Publications (2)

Publication Number Publication Date
JPWO2022145092A1 true JPWO2022145092A1 (ja) 2022-07-07
JP7503151B2 JP7503151B2 (ja) 2024-06-19

Family

ID=82259183

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022572910A Active JP7503151B2 (ja) 2020-12-28 2021-09-10 電子制御装置、車載装置の診断方法

Country Status (2)

Country Link
JP (1) JP7503151B2 (ja)
WO (1) WO2022145092A1 (ja)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3162321B2 (ja) * 1997-05-13 2001-04-25 三菱電機株式会社 論理シミュレーション方法及び論理シミュレーション方法を実現させるためのプログラムを記録したコンピュータ読み取り可能な記録媒体
JPH1139181A (ja) * 1997-07-18 1999-02-12 Fujitsu Ltd 計算機の試験方法
JP5512860B2 (ja) 2013-05-07 2014-06-04 本田技研工業株式会社 電動車両の充電システム
US11205004B2 (en) 2019-06-17 2021-12-21 Baidu Usa Llc Vulnerability driven hybrid test system for application programs

Also Published As

Publication number Publication date
JP7503151B2 (ja) 2024-06-19
WO2022145092A1 (ja) 2022-07-07

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