JPWO2022137841A1 - - Google Patents

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Publication number
JPWO2022137841A1
JPWO2022137841A1 JP2022571941A JP2022571941A JPWO2022137841A1 JP WO2022137841 A1 JPWO2022137841 A1 JP WO2022137841A1 JP 2022571941 A JP2022571941 A JP 2022571941A JP 2022571941 A JP2022571941 A JP 2022571941A JP WO2022137841 A1 JPWO2022137841 A1 JP WO2022137841A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022571941A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2022137841A1 publication Critical patent/JPWO2022137841A1/ja
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00Arrangements for image or video recognition or understanding
    • G06V10/70Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/82Arrangements for image or video recognition or understanding using pattern recognition or machine learning using neural networks
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • G06T7/001Industrial image inspection using an image reference approach
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00Arrangements for image or video recognition or understanding
    • G06V10/40Extraction of image or video features
    • G06V10/48Extraction of image or video features by mapping characteristic values of the pattern into a parameter space, e.g. Hough transformation
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00Arrangements for image or video recognition or understanding
    • G06V10/70Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/74Image or video pattern matching; Proximity measures in feature spaces
    • G06V10/761Proximity, similarity or dissimilarity measures

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • Health & Medical Sciences (AREA)
  • Evolutionary Computation (AREA)
  • General Health & Medical Sciences (AREA)
  • Computing Systems (AREA)
  • Software Systems (AREA)
  • Medical Informatics (AREA)
  • Databases & Information Systems (AREA)
  • Artificial Intelligence (AREA)
  • Quality & Reliability (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
JP2022571941A 2020-12-25 2021-11-08 Pending JPWO2022137841A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020216488 2020-12-25
PCT/JP2021/040920 WO2022137841A1 (ja) 2020-12-25 2021-11-08 異常検出システム、学習装置、異常検出プログラム、および学習プログラム

Publications (1)

Publication Number Publication Date
JPWO2022137841A1 true JPWO2022137841A1 (https=) 2022-06-30

Family

ID=82157533

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022571941A Pending JPWO2022137841A1 (https=) 2020-12-25 2021-11-08

Country Status (3)

Country Link
US (1) US20230410285A1 (https=)
JP (1) JPWO2022137841A1 (https=)
WO (1) WO2022137841A1 (https=)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7608857B2 (ja) * 2021-02-17 2025-01-07 トヨタ自動車株式会社 異常検出方法および異常検出装置
KR20230026247A (ko) * 2021-08-17 2023-02-24 삼성전자주식회사 반도체 웨이퍼의 결함을 식별하는 방법 및 전자 장치
US12400119B2 (en) * 2021-11-16 2025-08-26 Samsung Electronics Co., Ltd. Learning method and system for object tracking based on hybrid neural network
CN117274132B (zh) * 2022-06-09 2026-04-03 鸿海精密工业股份有限公司 多尺度自编码器生成方法、电子设备及存储介质
CN117197110A (zh) * 2023-09-22 2023-12-08 重庆腾讯信息技术有限公司 图像识别方法和装置、存储介质及电子设备
CN118840605B (zh) * 2024-07-10 2025-03-14 江苏银家不锈钢管业有限公司 不锈钢钢管的表面缺陷识别方法及系统
TWI882904B (zh) * 2024-09-18 2025-05-01 英業達股份有限公司 基於分布外的異常檢測方法及非暫態電腦可讀取媒體

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017097718A (ja) * 2015-11-26 2017-06-01 株式会社リコー 識別処理装置、識別システム、識別処理方法、およびプログラム
CN109615604A (zh) * 2018-10-30 2019-04-12 中国科学院自动化研究所 基于图像重构卷积神经网络的零件外观瑕疵检测方法
JP2019069145A (ja) * 2017-10-06 2019-05-09 キヤノンメディカルシステムズ株式会社 医用画像処理装置及び医用画像処理システム
JP2019522897A (ja) * 2016-05-25 2019-08-15 ケーエルエー−テンカー コーポレイション 半導体用途のための、入力画像からのシミュレーション画像の生成
JP2020181532A (ja) * 2019-04-26 2020-11-05 富士通株式会社 画像判定装置及び画像判定方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017097718A (ja) * 2015-11-26 2017-06-01 株式会社リコー 識別処理装置、識別システム、識別処理方法、およびプログラム
JP2019522897A (ja) * 2016-05-25 2019-08-15 ケーエルエー−テンカー コーポレイション 半導体用途のための、入力画像からのシミュレーション画像の生成
JP2019069145A (ja) * 2017-10-06 2019-05-09 キヤノンメディカルシステムズ株式会社 医用画像処理装置及び医用画像処理システム
CN109615604A (zh) * 2018-10-30 2019-04-12 中国科学院自动化研究所 基于图像重构卷积神经网络的零件外观瑕疵检测方法
JP2020181532A (ja) * 2019-04-26 2020-11-05 富士通株式会社 画像判定装置及び画像判定方法

Also Published As

Publication number Publication date
US20230410285A1 (en) 2023-12-21
WO2022137841A1 (ja) 2022-06-30

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