JPWO2022137841A1 - - Google Patents
Info
- Publication number
- JPWO2022137841A1 JPWO2022137841A1 JP2022571941A JP2022571941A JPWO2022137841A1 JP WO2022137841 A1 JPWO2022137841 A1 JP WO2022137841A1 JP 2022571941 A JP2022571941 A JP 2022571941A JP 2022571941 A JP2022571941 A JP 2022571941A JP WO2022137841 A1 JPWO2022137841 A1 JP WO2022137841A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
- G06V10/82—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using neural networks
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/001—Industrial image inspection using an image reference approach
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/40—Extraction of image or video features
- G06V10/48—Extraction of image or video features by mapping characteristic values of the pattern into a parameter space, e.g. Hough transformation
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
- G06V10/74—Image or video pattern matching; Proximity measures in feature spaces
- G06V10/761—Proximity, similarity or dissimilarity measures
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Multimedia (AREA)
- Health & Medical Sciences (AREA)
- Evolutionary Computation (AREA)
- General Health & Medical Sciences (AREA)
- Computing Systems (AREA)
- Software Systems (AREA)
- Medical Informatics (AREA)
- Databases & Information Systems (AREA)
- Artificial Intelligence (AREA)
- Quality & Reliability (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Immunology (AREA)
- Chemical & Material Sciences (AREA)
- Pathology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020216488 | 2020-12-25 | ||
| PCT/JP2021/040920 WO2022137841A1 (ja) | 2020-12-25 | 2021-11-08 | 異常検出システム、学習装置、異常検出プログラム、および学習プログラム |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPWO2022137841A1 true JPWO2022137841A1 (https=) | 2022-06-30 |
Family
ID=82157533
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022571941A Pending JPWO2022137841A1 (https=) | 2020-12-25 | 2021-11-08 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US20230410285A1 (https=) |
| JP (1) | JPWO2022137841A1 (https=) |
| WO (1) | WO2022137841A1 (https=) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7608857B2 (ja) * | 2021-02-17 | 2025-01-07 | トヨタ自動車株式会社 | 異常検出方法および異常検出装置 |
| KR20230026247A (ko) * | 2021-08-17 | 2023-02-24 | 삼성전자주식회사 | 반도체 웨이퍼의 결함을 식별하는 방법 및 전자 장치 |
| US12400119B2 (en) * | 2021-11-16 | 2025-08-26 | Samsung Electronics Co., Ltd. | Learning method and system for object tracking based on hybrid neural network |
| CN117274132B (zh) * | 2022-06-09 | 2026-04-03 | 鸿海精密工业股份有限公司 | 多尺度自编码器生成方法、电子设备及存储介质 |
| CN117197110A (zh) * | 2023-09-22 | 2023-12-08 | 重庆腾讯信息技术有限公司 | 图像识别方法和装置、存储介质及电子设备 |
| CN118840605B (zh) * | 2024-07-10 | 2025-03-14 | 江苏银家不锈钢管业有限公司 | 不锈钢钢管的表面缺陷识别方法及系统 |
| TWI882904B (zh) * | 2024-09-18 | 2025-05-01 | 英業達股份有限公司 | 基於分布外的異常檢測方法及非暫態電腦可讀取媒體 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017097718A (ja) * | 2015-11-26 | 2017-06-01 | 株式会社リコー | 識別処理装置、識別システム、識別処理方法、およびプログラム |
| CN109615604A (zh) * | 2018-10-30 | 2019-04-12 | 中国科学院自动化研究所 | 基于图像重构卷积神经网络的零件外观瑕疵检测方法 |
| JP2019069145A (ja) * | 2017-10-06 | 2019-05-09 | キヤノンメディカルシステムズ株式会社 | 医用画像処理装置及び医用画像処理システム |
| JP2019522897A (ja) * | 2016-05-25 | 2019-08-15 | ケーエルエー−テンカー コーポレイション | 半導体用途のための、入力画像からのシミュレーション画像の生成 |
| JP2020181532A (ja) * | 2019-04-26 | 2020-11-05 | 富士通株式会社 | 画像判定装置及び画像判定方法 |
-
2021
- 2021-11-08 JP JP2022571941A patent/JPWO2022137841A1/ja active Pending
- 2021-11-08 US US18/037,817 patent/US20230410285A1/en active Pending
- 2021-11-08 WO PCT/JP2021/040920 patent/WO2022137841A1/ja not_active Ceased
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017097718A (ja) * | 2015-11-26 | 2017-06-01 | 株式会社リコー | 識別処理装置、識別システム、識別処理方法、およびプログラム |
| JP2019522897A (ja) * | 2016-05-25 | 2019-08-15 | ケーエルエー−テンカー コーポレイション | 半導体用途のための、入力画像からのシミュレーション画像の生成 |
| JP2019069145A (ja) * | 2017-10-06 | 2019-05-09 | キヤノンメディカルシステムズ株式会社 | 医用画像処理装置及び医用画像処理システム |
| CN109615604A (zh) * | 2018-10-30 | 2019-04-12 | 中国科学院自动化研究所 | 基于图像重构卷积神经网络的零件外观瑕疵检测方法 |
| JP2020181532A (ja) * | 2019-04-26 | 2020-11-05 | 富士通株式会社 | 画像判定装置及び画像判定方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20230410285A1 (en) | 2023-12-21 |
| WO2022137841A1 (ja) | 2022-06-30 |
Similar Documents
Legal Events
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