JPWO2022130814A1 - - Google Patents

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Publication number
JPWO2022130814A1
JPWO2022130814A1 JP2022569759A JP2022569759A JPWO2022130814A1 JP WO2022130814 A1 JPWO2022130814 A1 JP WO2022130814A1 JP 2022569759 A JP2022569759 A JP 2022569759A JP 2022569759 A JP2022569759 A JP 2022569759A JP WO2022130814 A1 JPWO2022130814 A1 JP WO2022130814A1
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2022569759A
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Japanese (ja)
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JP7718429B2 (ja
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Publication of JPWO2022130814A1 publication Critical patent/JPWO2022130814A1/ja
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Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10024—Color image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20081—Training; Learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20084—Artificial neural networks [ANN]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Image Analysis (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2022569759A 2020-12-16 2021-11-04 指標選択装置、情報処理装置、情報処理システム、検査装置、検査システム、指標選択方法、および指標選択プログラム Active JP7718429B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020208476 2020-12-16
JP2020208476 2020-12-16
PCT/JP2021/040525 WO2022130814A1 (ja) 2020-12-16 2021-11-04 指標選択装置、情報処理装置、情報処理システム、検査装置、検査システム、指標選択方法、および指標選択プログラム

Publications (2)

Publication Number Publication Date
JPWO2022130814A1 true JPWO2022130814A1 (https=) 2022-06-23
JP7718429B2 JP7718429B2 (ja) 2025-08-05

Family

ID=82057553

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022569759A Active JP7718429B2 (ja) 2020-12-16 2021-11-04 指標選択装置、情報処理装置、情報処理システム、検査装置、検査システム、指標選択方法、および指標選択プログラム

Country Status (3)

Country Link
US (1) US20240005477A1 (https=)
JP (1) JP7718429B2 (https=)
WO (1) WO2022130814A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7699978B2 (ja) * 2021-07-01 2025-06-30 株式会社日立製作所 計算機及び外観検査方法
ES3061396T3 (en) * 2021-12-03 2026-04-01 Contemporary Amperex Technology Hong Kong Ltd Fast anomaly detection method and system based on contrastive representation distillation

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017049974A (ja) * 2015-09-04 2017-03-09 キヤノン株式会社 識別器生成装置、良否判定方法、およびプログラム
JP2020173496A (ja) * 2019-04-08 2020-10-22 国立大学法人岐阜大学 異常品判定方法
CN111833300A (zh) * 2020-06-04 2020-10-27 西安电子科技大学 一种基于生成对抗学习的复合材料构件缺陷检测方法和装置
JP2020187655A (ja) * 2019-05-16 2020-11-19 株式会社キーエンス 画像検査装置
JP2020187657A (ja) * 2019-05-16 2020-11-19 株式会社キーエンス 画像検査装置
JP2020197797A (ja) * 2019-05-31 2020-12-10 株式会社東芝 画像処理装置及び画像処理方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20170069075A1 (en) * 2015-09-04 2017-03-09 Canon Kabushiki Kaisha Classifier generation apparatus, defective/non-defective determination method, and program
US10733722B2 (en) * 2017-06-27 2020-08-04 Nec Corporation Reconstructor and contrastor for anomaly detection
US11024031B1 (en) * 2020-02-13 2021-06-01 Olympus Corporation System and method for diagnosing severity of gastric cancer
US11301977B2 (en) * 2020-04-10 2022-04-12 General Electric Company Systems and methods for automatic defect recognition

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017049974A (ja) * 2015-09-04 2017-03-09 キヤノン株式会社 識別器生成装置、良否判定方法、およびプログラム
JP2020173496A (ja) * 2019-04-08 2020-10-22 国立大学法人岐阜大学 異常品判定方法
JP2020187655A (ja) * 2019-05-16 2020-11-19 株式会社キーエンス 画像検査装置
JP2020187657A (ja) * 2019-05-16 2020-11-19 株式会社キーエンス 画像検査装置
JP2020197797A (ja) * 2019-05-31 2020-12-10 株式会社東芝 画像処理装置及び画像処理方法
CN111833300A (zh) * 2020-06-04 2020-10-27 西安电子科技大学 一种基于生成对抗学习的复合材料构件缺陷检测方法和装置

Also Published As

Publication number Publication date
US20240005477A1 (en) 2024-01-04
WO2022130814A1 (ja) 2022-06-23
JP7718429B2 (ja) 2025-08-05

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