JPWO2022114006A1 - - Google Patents

Info

Publication number
JPWO2022114006A1
JPWO2022114006A1 JP2022565375A JP2022565375A JPWO2022114006A1 JP WO2022114006 A1 JPWO2022114006 A1 JP WO2022114006A1 JP 2022565375 A JP2022565375 A JP 2022565375A JP 2022565375 A JP2022565375 A JP 2022565375A JP WO2022114006 A1 JPWO2022114006 A1 JP WO2022114006A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022565375A
Other versions
JPWO2022114006A5 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2022114006A1 publication Critical patent/JPWO2022114006A1/ja
Publication of JPWO2022114006A5 publication Critical patent/JPWO2022114006A5/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00Image enhancement or restoration
    • G06T5/50Image enhancement or restoration using two or more images, e.g. averaging or subtraction
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00Image enhancement or restoration
    • G06T5/80Geometric correction
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/30Determination of transform parameters for the alignment of images, i.e. image registration
    • G06T7/33Determination of transform parameters for the alignment of images, i.e. image registration using feature-based methods
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/60Analysis of geometric attributes
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00Arrangements for image or video recognition or understanding
    • G06V10/40Extraction of image or video features
    • G06V10/44Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00Arrangements for image or video recognition or understanding
    • G06V10/70Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/74Image or video pattern matching; Proximity measures in feature spaces
    • G06V10/761Proximity, similarity or dissimilarity measures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/8867Grading and classifying of flaws using sequentially two or more inspection runs, e.g. coarse and fine, or detecting then analysing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515Objects of complex shape, e.g. examined with use of a surface follower device
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10016Video; Image sequence
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20016Hierarchical, coarse-to-fine, multiscale or multiresolution image processing; Pyramid transform
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20081Training; Learning
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20212Image combination
    • G06T2207/20221Image fusion; Image merging
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30181Earth observation
    • G06T2207/30184Infrastructure

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Multimedia (AREA)
  • Geometry (AREA)
  • Pathology (AREA)
  • Databases & Information Systems (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Artificial Intelligence (AREA)
  • Computing Systems (AREA)
  • Biochemistry (AREA)
  • Evolutionary Computation (AREA)
  • Medical Informatics (AREA)
  • Software Systems (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Signal Processing (AREA)
  • Quality & Reliability (AREA)
  • Image Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2022565375A 2020-11-27 2021-11-24 Pending JPWO2022114006A1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020196732 2020-11-27
PCT/JP2021/043004 WO2022114006A1 (ja) 2020-11-27 2021-11-24 情報処理装置、情報処理方法及び情報処理プログラム

Publications (2)

Publication Number Publication Date
JPWO2022114006A1 true JPWO2022114006A1 (ja) 2022-06-02
JPWO2022114006A5 JPWO2022114006A5 (ja) 2023-08-14

Family

ID=81755575

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022565375A Pending JPWO2022114006A1 (ja) 2020-11-27 2021-11-24

Country Status (5)

Country Link
US (1) US20230296531A1 (ja)
EP (1) EP4254324A4 (ja)
JP (1) JPWO2022114006A1 (ja)
CN (1) CN116583871A (ja)
WO (1) WO2022114006A1 (ja)

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004309492A (ja) * 2003-02-21 2004-11-04 Fast:Kk 建築および土木構造物計測・解析システム
JP6363575B2 (ja) * 2015-09-29 2018-07-25 富士フイルム株式会社 画像位置合わせ装置および方法並びにプログラム
EP3396359B1 (en) 2015-12-25 2021-04-28 FUJIFILM Corporation Damage information processing device and damage information processing method
CN108431585B (zh) * 2015-12-25 2021-09-14 富士胶片株式会社 信息处理装置及信息处理方法
JP6821036B2 (ja) * 2017-08-28 2021-01-27 富士フイルム株式会社 医用画像処理装置、方法およびプログラム
JP6918672B2 (ja) * 2017-10-11 2021-08-11 株式会社日立システムズ 劣化診断システム
JP6905956B2 (ja) * 2018-06-01 2021-07-21 富士フイルム株式会社 ひび割れ変化判定装置および方法
JP7166862B2 (ja) 2018-09-27 2022-11-08 キヤノン株式会社 情報処理装置、情報処理方法及びプログラム、記憶媒体
JP7311963B2 (ja) 2018-12-14 2023-07-20 キヤノン株式会社 情報処理装置、情報処理装置の制御方法及びプログラム
JP7152515B2 (ja) * 2018-12-27 2022-10-12 富士フイルム株式会社 画像処理装置、画像処理方法、及びプログラム
KR102040435B1 (ko) * 2019-03-27 2019-11-04 주식회사 엠텍 원거리 구조물 점검 시스템 및 그 시스템을 이용한 구조물 점검방법

Also Published As

Publication number Publication date
EP4254324A1 (en) 2023-10-04
WO2022114006A1 (ja) 2022-06-02
CN116583871A (zh) 2023-08-11
US20230296531A1 (en) 2023-09-21
EP4254324A4 (en) 2024-05-15

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Legal Events

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Effective date: 20230613