JPWO2022102113A1 - - Google Patents
Info
- Publication number
- JPWO2022102113A1 JPWO2022102113A1 JP2022561236A JP2022561236A JPWO2022102113A1 JP WO2022102113 A1 JPWO2022102113 A1 JP WO2022102113A1 JP 2022561236 A JP2022561236 A JP 2022561236A JP 2022561236 A JP2022561236 A JP 2022561236A JP WO2022102113 A1 JPWO2022102113 A1 JP WO2022102113A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M15/00—Testing of engines
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/34—Testing dynamo-electric machines
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
- G01R19/0053—Noise discrimination; Analog sampling; Measuring transients
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/34—Testing dynamo-electric machines
- G01R31/343—Testing dynamo-electric machines in operation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
- G01R35/007—Standards or reference devices, e.g. voltage or resistance standards, "golden references"
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Tests Of Circuit Breakers, Generators, And Electric Motors (AREA)
- Control Of Electric Motors In General (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2020/042570 WO2022102113A1 (ja) | 2020-11-16 | 2020-11-16 | 電動機の診断装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2022102113A1 true JPWO2022102113A1 (ja) | 2022-05-19 |
JP7422896B2 JP7422896B2 (ja) | 2024-01-26 |
Family
ID=81602166
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2022561236A Active JP7422896B2 (ja) | 2020-11-16 | 2020-11-16 | 電動機の診断装置 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP7422896B2 (ja) |
KR (1) | KR20230075513A (ja) |
CN (1) | CN116490760A (ja) |
DE (1) | DE112020007771T5 (ja) |
WO (1) | WO2022102113A1 (ja) |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58100734A (ja) | 1981-12-11 | 1983-06-15 | Nippon Atom Ind Group Co Ltd | 回転機器の異常検出法および装置 |
JP4062939B2 (ja) * | 2002-03-14 | 2008-03-19 | Jfeスチール株式会社 | 交流電動機の回転子異常検出方法及び回転子異常検出装置 |
JP5565120B2 (ja) | 2010-06-09 | 2014-08-06 | 富士電機株式会社 | 転がり軸受部振動データの高周波電磁振動成分除去方法および高周波電磁振動成分除去装置、回転機械の転がりの軸受診断方法および軸受診断装置 |
JP6420885B1 (ja) | 2017-11-29 | 2018-11-07 | Jfeアドバンテック株式会社 | 電磁振動成分の除去方法、回転機械診断方法、及び回転機械診断装置 |
EP3940366A4 (en) | 2019-03-15 | 2023-01-11 | Omron Corporation | FAULT DIAGNOSTIC DEVICE AND FAULT DIAGNOSTIC METHOD |
-
2020
- 2020-11-16 DE DE112020007771.3T patent/DE112020007771T5/de active Pending
- 2020-11-16 WO PCT/JP2020/042570 patent/WO2022102113A1/ja active Application Filing
- 2020-11-16 JP JP2022561236A patent/JP7422896B2/ja active Active
- 2020-11-16 CN CN202080107078.7A patent/CN116490760A/zh active Pending
- 2020-11-16 KR KR1020237014758A patent/KR20230075513A/ko unknown
Also Published As
Publication number | Publication date |
---|---|
CN116490760A (zh) | 2023-07-25 |
KR20230075513A (ko) | 2023-05-31 |
WO2022102113A1 (ja) | 2022-05-19 |
JP7422896B2 (ja) | 2024-01-26 |
DE112020007771T5 (de) | 2023-08-31 |
Similar Documents
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