JPWO2022074732A1 - - Google Patents

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Publication number
JPWO2022074732A1
JPWO2022074732A1 JP2022519010A JP2022519010A JPWO2022074732A1 JP WO2022074732 A1 JPWO2022074732 A1 JP WO2022074732A1 JP 2022519010 A JP2022519010 A JP 2022519010A JP 2022519010 A JP2022519010 A JP 2022519010A JP WO2022074732 A1 JPWO2022074732 A1 JP WO2022074732A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2022519010A
Other versions
JP7239125B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication of JPWO2022074732A1 publication Critical patent/JPWO2022074732A1/ja
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Publication of JP7239125B2 publication Critical patent/JP7239125B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Solid State Image Pick-Up Elements (AREA)
JP2022519010A 2020-10-06 2020-10-06 放射線撮像装置 Active JP7239125B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/037866 WO2022074732A1 (ja) 2020-10-06 2020-10-06 放射線撮像装置

Publications (2)

Publication Number Publication Date
JPWO2022074732A1 true JPWO2022074732A1 (ja) 2022-04-14
JP7239125B2 JP7239125B2 (ja) 2023-03-14

Family

ID=81126710

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022519010A Active JP7239125B2 (ja) 2020-10-06 2020-10-06 放射線撮像装置

Country Status (4)

Country Link
US (1) US20230008884A1 (ja)
JP (1) JP7239125B2 (ja)
KR (1) KR20220084405A (ja)
WO (1) WO2022074732A1 (ja)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001527295A (ja) * 1997-12-18 2001-12-25 シメージ オーワイ モジュール構造のイメージング装置
JP2003527610A (ja) * 2000-03-14 2003-09-16 プランメド オイ デジタルｘ線撮像の方法及びセンサ装置
US20090290680A1 (en) * 2004-03-26 2009-11-26 Nova R & D, Inc. High resolution imaging system
JP2013165471A (ja) * 2012-02-13 2013-08-22 Highspec Co Ltd 多相駆動画像信号積算素子
WO2017033675A1 (ja) * 2015-08-24 2017-03-02 株式会社日立製作所 放射線検出装置および医用画像撮像装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2318411B (en) * 1996-10-15 1999-03-10 Simage Oy Imaging device for imaging radiation
JP4594624B2 (ja) * 2004-01-13 2010-12-08 株式会社日立製作所 放射線検出装置および核医学診断装置
US9111379B2 (en) * 2012-06-28 2015-08-18 Mobius Imaging, Llc Method and system for X-ray CT imaging
JP2018207291A (ja) 2017-06-05 2018-12-27 ソニーセミコンダクタソリューションズ株式会社 固体撮像素子および撮像装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001527295A (ja) * 1997-12-18 2001-12-25 シメージ オーワイ モジュール構造のイメージング装置
JP2003527610A (ja) * 2000-03-14 2003-09-16 プランメド オイ デジタルｘ線撮像の方法及びセンサ装置
US20090290680A1 (en) * 2004-03-26 2009-11-26 Nova R & D, Inc. High resolution imaging system
JP2013165471A (ja) * 2012-02-13 2013-08-22 Highspec Co Ltd 多相駆動画像信号積算素子
WO2017033675A1 (ja) * 2015-08-24 2017-03-02 株式会社日立製作所 放射線検出装置および医用画像撮像装置

Also Published As

Publication number Publication date
KR20220084405A (ko) 2022-06-21
JP7239125B2 (ja) 2023-03-14
WO2022074732A1 (ja) 2022-04-14
US20230008884A1 (en) 2023-01-12

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