JPWO2022049979A1 - - Google Patents

Info

Publication number
JPWO2022049979A1
JPWO2022049979A1 JP2022546180A JP2022546180A JPWO2022049979A1 JP WO2022049979 A1 JPWO2022049979 A1 JP WO2022049979A1 JP 2022546180 A JP2022546180 A JP 2022546180A JP 2022546180 A JP2022546180 A JP 2022546180A JP WO2022049979 A1 JPWO2022049979 A1 JP WO2022049979A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022546180A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2022049979A1 publication Critical patent/JPWO2022049979A1/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2022546180A 2020-09-03 2021-08-04 Pending JPWO2022049979A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020148206 2020-09-03
PCT/JP2021/028987 WO2022049979A1 (en) 2020-09-03 2021-08-04 Inspection device and inspection method

Publications (1)

Publication Number Publication Date
JPWO2022049979A1 true JPWO2022049979A1 (en) 2022-03-10

Family

ID=80492042

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022546180A Pending JPWO2022049979A1 (en) 2020-09-03 2021-08-04

Country Status (2)

Country Link
JP (1) JPWO2022049979A1 (en)
WO (1) WO2022049979A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023199549A1 (en) * 2022-04-13 2023-10-19 日本製鉄株式会社 Surface inspection device and surface inspection method

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016121628A1 (en) * 2015-01-28 2016-08-04 東レエンジニアリング株式会社 Defect inspection method and defect inspection device for wide-gap semiconductor substrates
JP6688184B2 (en) * 2016-07-20 2020-04-28 東レエンジニアリング株式会社 Wide gap semiconductor substrate defect inspection system

Also Published As

Publication number Publication date
WO2022049979A1 (en) 2022-03-10

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