JPWO2022044828A1 - - Google Patents
Info
- Publication number
- JPWO2022044828A1 JPWO2022044828A1 JP2022544445A JP2022544445A JPWO2022044828A1 JP WO2022044828 A1 JPWO2022044828 A1 JP WO2022044828A1 JP 2022544445 A JP2022544445 A JP 2022544445A JP 2022544445 A JP2022544445 A JP 2022544445A JP WO2022044828 A1 JPWO2022044828 A1 JP WO2022044828A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/10—Radiation diagrams of antennas
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Waveguide Aerials (AREA)
- Variable-Direction Aerials And Aerial Arrays (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020143160 | 2020-08-27 | ||
| PCT/JP2021/029737 WO2022044828A1 (en) | 2020-08-27 | 2021-08-12 | Inspection device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPWO2022044828A1 true JPWO2022044828A1 (en) | 2022-03-03 |
Family
ID=80353162
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022544445A Pending JPWO2022044828A1 (en) | 2020-08-27 | 2021-08-12 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JPWO2022044828A1 (en) |
| TW (1) | TW202208869A (en) |
| WO (1) | WO2022044828A1 (en) |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4983110B2 (en) * | 2006-06-23 | 2012-07-25 | オムロン株式会社 | Radio wave sensor |
| JP2010027777A (en) * | 2008-07-17 | 2010-02-04 | Fujikura Ltd | Inspecting device for semiconductor device |
| US9678127B2 (en) * | 2014-06-18 | 2017-06-13 | Ixia | Flexible shielded antenna array for radiated wireless test |
| US10312600B2 (en) * | 2016-05-20 | 2019-06-04 | Kymeta Corporation | Free space segment tester (FSST) |
-
2021
- 2021-08-12 TW TW110129791A patent/TW202208869A/en unknown
- 2021-08-12 JP JP2022544445A patent/JPWO2022044828A1/ja active Pending
- 2021-08-12 WO PCT/JP2021/029737 patent/WO2022044828A1/en active Application Filing
Also Published As
| Publication number | Publication date |
|---|---|
| TW202208869A (en) | 2022-03-01 |
| WO2022044828A1 (en) | 2022-03-03 |