JPWO2022044626A1 - - Google Patents

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Publication number
JPWO2022044626A1
JPWO2022044626A1 JP2022545542A JP2022545542A JPWO2022044626A1 JP WO2022044626 A1 JPWO2022044626 A1 JP WO2022044626A1 JP 2022545542 A JP2022545542 A JP 2022545542A JP 2022545542 A JP2022545542 A JP 2022545542A JP WO2022044626 A1 JPWO2022044626 A1 JP WO2022044626A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2022545542A
Other versions
JP7417963B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2022044626A1 publication Critical patent/JPWO2022044626A1/ja
Application granted granted Critical
Publication of JP7417963B2 publication Critical patent/JP7417963B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G01R31/081—Locating faults in cables, transmission lines, or networks according to type of conductors
    • G01R31/086—Locating faults in cables, transmission lines, or networks according to type of conductors in power transmission or distribution networks, i.e. with interconnected conductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
    • G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
    • G01R31/1272—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of cable, line or wire insulation, e.g. using partial discharge measurements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP2022545542A 2020-08-26 2021-07-20 アーク検出装置、アーク検出システム、アーク検出方法、及びプログラム Active JP7417963B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020142668 2020-08-26
JP2020142668 2020-08-26
PCT/JP2021/027127 WO2022044626A1 (ja) 2020-08-26 2021-07-20 アーク検出装置、アーク検出システム、アーク検出方法、及びプログラム

Publications (2)

Publication Number Publication Date
JPWO2022044626A1 true JPWO2022044626A1 (ja) 2022-03-03
JP7417963B2 JP7417963B2 (ja) 2024-01-19

Family

ID=80355088

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022545542A Active JP7417963B2 (ja) 2020-08-26 2021-07-20 アーク検出装置、アーク検出システム、アーク検出方法、及びプログラム

Country Status (5)

Country Link
US (1) US20230305047A1 (ja)
EP (1) EP4206714A4 (ja)
JP (1) JP7417963B2 (ja)
CN (1) CN115777071A (ja)
WO (1) WO2022044626A1 (ja)

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06508974A (ja) * 1991-08-01 1994-10-06 シーメンス アクチエンゲゼルシヤフト 変換装置内の障害検出方法および装置
US20060114627A1 (en) * 2001-10-17 2006-06-01 Wong Kon B Load recognition and series arc detection using load current/line voltage normalization algorithms
JP2009278744A (ja) * 2008-05-13 2009-11-26 Sinfonia Technology Co Ltd アーク検出装置及びこれを備えた航空機
JP2011524601A (ja) * 2008-02-14 2011-09-01 エム ケー エス インストルメンツ インコーポレーテッド アーク事象を定量的に測定するための確率的モデルを用いてアークを検出するための広帯域サンプリングの適用
JP2014134445A (ja) * 2013-01-10 2014-07-24 Mitsubishi Electric Corp アーク検出装置
JP2016063581A (ja) * 2014-09-16 2016-04-25 株式会社東芝 電力変換装置
US20170328944A1 (en) * 2016-05-13 2017-11-16 Bender Gmbh & Co. Kg Method and device for identifying arc faults in an ungrounded power supply system
JP2018028498A (ja) * 2016-08-19 2018-02-22 富士電機機器制御株式会社 アーク故障検出システム
WO2018150876A1 (ja) * 2017-02-14 2018-08-23 パナソニックＩｐマネジメント株式会社 アーク検出回路、開閉器システム、パワーコンディショナシステム及びアーク検出方法
JP6567230B1 (ja) * 2019-01-08 2019-08-28 三菱電機株式会社 アーク地絡の検出方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5419579B2 (ja) 2009-05-28 2014-02-19 京セラ株式会社 アーク検出手段とそれを用いた制御手段及び連絡手段
WO2013053912A1 (en) * 2011-10-14 2013-04-18 Sma Solar Technology Ag Method and apparatus for detecting an arc in a dc circuit
EP3214453A1 (en) * 2016-03-03 2017-09-06 ABB Schweiz AG Method and apparatus for arc fault detection in electrical systems
JP7130542B2 (ja) * 2018-12-12 2022-09-05 株式会社日立製作所 部分放電検出装置及び部分放電検出方法
JP2024104294A (ja) * 2023-01-23 2024-08-02 エレクトリカル グリッド モニタリング リミテッド 動的短絡計算のための方法およびシステム

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06508974A (ja) * 1991-08-01 1994-10-06 シーメンス アクチエンゲゼルシヤフト 変換装置内の障害検出方法および装置
US20060114627A1 (en) * 2001-10-17 2006-06-01 Wong Kon B Load recognition and series arc detection using load current/line voltage normalization algorithms
JP2011524601A (ja) * 2008-02-14 2011-09-01 エム ケー エス インストルメンツ インコーポレーテッド アーク事象を定量的に測定するための確率的モデルを用いてアークを検出するための広帯域サンプリングの適用
JP2009278744A (ja) * 2008-05-13 2009-11-26 Sinfonia Technology Co Ltd アーク検出装置及びこれを備えた航空機
JP2014134445A (ja) * 2013-01-10 2014-07-24 Mitsubishi Electric Corp アーク検出装置
JP2016063581A (ja) * 2014-09-16 2016-04-25 株式会社東芝 電力変換装置
US20170328944A1 (en) * 2016-05-13 2017-11-16 Bender Gmbh & Co. Kg Method and device for identifying arc faults in an ungrounded power supply system
JP2018028498A (ja) * 2016-08-19 2018-02-22 富士電機機器制御株式会社 アーク故障検出システム
WO2018150876A1 (ja) * 2017-02-14 2018-08-23 パナソニックＩｐマネジメント株式会社 アーク検出回路、開閉器システム、パワーコンディショナシステム及びアーク検出方法
JP6567230B1 (ja) * 2019-01-08 2019-08-28 三菱電機株式会社 アーク地絡の検出方法

Also Published As

Publication number Publication date
WO2022044626A1 (ja) 2022-03-03
CN115777071A (zh) 2023-03-10
EP4206714A4 (en) 2024-03-13
US20230305047A1 (en) 2023-09-28
EP4206714A1 (en) 2023-07-05
JP7417963B2 (ja) 2024-01-19

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