JPWO2021181971A1 - - Google Patents

Info

Publication number
JPWO2021181971A1
JPWO2021181971A1 JP2022505840A JP2022505840A JPWO2021181971A1 JP WO2021181971 A1 JPWO2021181971 A1 JP WO2021181971A1 JP 2022505840 A JP2022505840 A JP 2022505840A JP 2022505840 A JP2022505840 A JP 2022505840A JP WO2021181971 A1 JPWO2021181971 A1 JP WO2021181971A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2022505840A
Other versions
JPWO2021181971A5 (ja
JP7341313B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021181971A1 publication Critical patent/JPWO2021181971A1/ja
Publication of JPWO2021181971A5 publication Critical patent/JPWO2021181971A5/ja
Application granted granted Critical
Publication of JP7341313B2 publication Critical patent/JP7341313B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/025—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having a carousel or turntable for reaction cells or cuvettes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/0092—Scheduling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00663—Quality control of consumables
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1002—Reagent dispensers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1009—Characterised by arrangements for controlling the aspiration or dispense of liquids
    • G01N35/1016—Control of the volume dispensed or introduced
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00663—Quality control of consumables
    • G01N2035/00673—Quality control of consumables of reagents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N2035/00891—Displaying information to the operator

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP2022505840A 2020-03-13 2021-02-08 自動分析装置 Active JP7341313B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020044117 2020-03-13
JP2020044117 2020-03-13
PCT/JP2021/004494 WO2021181971A1 (ja) 2020-03-13 2021-02-08 自動分析装置

Publications (3)

Publication Number Publication Date
JPWO2021181971A1 true JPWO2021181971A1 (ja) 2021-09-16
JPWO2021181971A5 JPWO2021181971A5 (ja) 2022-10-12
JP7341313B2 JP7341313B2 (ja) 2023-09-08

Family

ID=77671396

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022505840A Active JP7341313B2 (ja) 2020-03-13 2021-02-08 自動分析装置

Country Status (5)

Country Link
US (1) US20230135106A1 (ja)
EP (1) EP4119950A4 (ja)
JP (1) JP7341313B2 (ja)
CN (1) CN115210576A (ja)
WO (1) WO2021181971A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7008744B2 (ja) 2020-04-14 2022-01-25 日本電子株式会社 自動分析装置および自動分析装置の制御方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002214240A (ja) * 2001-01-15 2002-07-31 Fuji Photo Film Co Ltd 測定チップを用いる分析装置および測定チップ管理装置
JP2010151672A (ja) * 2008-12-25 2010-07-08 Beckman Coulter Inc 自動分析装置
WO2010107042A1 (ja) * 2009-03-18 2010-09-23 シスメックス株式会社 検体分析装置
JP2011033425A (ja) * 2009-07-31 2011-02-17 Hitachi High-Technologies Corp 自動分析装置
JP2013190446A (ja) * 2013-07-02 2013-09-26 Sysmex Corp 試料分析装置及び試料分析装置用プログラム
WO2018155049A1 (ja) * 2017-02-22 2018-08-30 株式会社 日立ハイテクノロジーズ 自動分析装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3597958B2 (ja) * 1996-11-15 2004-12-08 株式会社日立製作所 自動分析装置
JP5340975B2 (ja) * 2010-01-29 2013-11-13 株式会社日立ハイテクノロジーズ 自動分析装置
JP5495884B2 (ja) 2010-03-25 2014-05-21 シスメックス株式会社 試料分析装置
JP2020044117A (ja) 2018-09-19 2020-03-26 博康 久保田 綿棒

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002214240A (ja) * 2001-01-15 2002-07-31 Fuji Photo Film Co Ltd 測定チップを用いる分析装置および測定チップ管理装置
JP2010151672A (ja) * 2008-12-25 2010-07-08 Beckman Coulter Inc 自動分析装置
WO2010107042A1 (ja) * 2009-03-18 2010-09-23 シスメックス株式会社 検体分析装置
JP2011033425A (ja) * 2009-07-31 2011-02-17 Hitachi High-Technologies Corp 自動分析装置
JP2013190446A (ja) * 2013-07-02 2013-09-26 Sysmex Corp 試料分析装置及び試料分析装置用プログラム
WO2018155049A1 (ja) * 2017-02-22 2018-08-30 株式会社 日立ハイテクノロジーズ 自動分析装置

Also Published As

Publication number Publication date
US20230135106A1 (en) 2023-05-04
WO2021181971A1 (ja) 2021-09-16
EP4119950A4 (en) 2024-02-28
JP7341313B2 (ja) 2023-09-08
CN115210576A (zh) 2022-10-18
EP4119950A1 (en) 2023-01-18

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