JPWO2021079945A1 - - Google Patents

Info

Publication number
JPWO2021079945A1
JPWO2021079945A1 JP2021553529A JP2021553529A JPWO2021079945A1 JP WO2021079945 A1 JPWO2021079945 A1 JP WO2021079945A1 JP 2021553529 A JP2021553529 A JP 2021553529A JP 2021553529 A JP2021553529 A JP 2021553529A JP WO2021079945 A1 JPWO2021079945 A1 JP WO2021079945A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2021553529A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021079945A1 publication Critical patent/JPWO2021079945A1/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/54—Testing for continuity
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP2021553529A 2019-10-25 2020-10-22 Pending JPWO2021079945A1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2019194401 2019-10-25
PCT/JP2020/039741 WO2021079945A1 (ja) 2019-10-25 2020-10-22 基板検査方法、基板検査プログラム、及び基板検査装置

Publications (1)

Publication Number Publication Date
JPWO2021079945A1 true JPWO2021079945A1 (ja) 2021-04-29

Family

ID=75620060

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021553529A Pending JPWO2021079945A1 (ja) 2019-10-25 2020-10-22

Country Status (2)

Country Link
JP (1) JPWO2021079945A1 (ja)
WO (1) WO2021079945A1 (ja)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3359732B2 (ja) * 1994-03-29 2002-12-24 大日本印刷株式会社 線状電極の欠陥検出方法および欠陥検出装置
JP2001201753A (ja) * 2000-01-18 2001-07-27 Oht Kk 単純マトリックス型液晶パネルの検査方法及び検査装置、プラズマディスプレイパネルの検査方法及び検査装置
KR100799161B1 (ko) * 2006-07-20 2008-01-29 마이크로 인스펙션 주식회사 비접촉 싱글사이드 프로브와 이를 이용한 패턴전극의 단선및 단락 검사장치 및 그 방법
JP2009121894A (ja) * 2007-11-14 2009-06-04 Fujitsu Ltd 導電体パターンの欠陥検査方法及び欠陥検査装置
WO2011121862A1 (ja) * 2010-03-29 2011-10-06 株式会社アイテス 静電容量式タッチパネルの検査装置、及び検査方法

Also Published As

Publication number Publication date
WO2021079945A1 (ja) 2021-04-29

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Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20231018