JPWO2021074943A1 - - Google Patents

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Publication number
JPWO2021074943A1
JPWO2021074943A1 JP2021551997A JP2021551997A JPWO2021074943A1 JP WO2021074943 A1 JPWO2021074943 A1 JP WO2021074943A1 JP 2021551997 A JP2021551997 A JP 2021551997A JP 2021551997 A JP2021551997 A JP 2021551997A JP WO2021074943 A1 JPWO2021074943 A1 JP WO2021074943A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2021551997A
Other versions
JP7389130B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Publication of JPWO2021074943A1 publication Critical patent/JPWO2021074943A1/ja
Application granted granted Critical
Publication of JP7389130B2 publication Critical patent/JP7389130B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/04—Mounting of components, e.g. of leadless components

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
JP2021551997A 2019-10-14 2019-10-14 測定装置、実装機、クランプ状態取得装置 Active JP7389130B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2019/040352 WO2021074943A1 (ja) 2019-10-14 2019-10-14 測定装置、実装機、クランプ状態取得装置

Publications (2)

Publication Number Publication Date
JPWO2021074943A1 true JPWO2021074943A1 (ja) 2021-04-22
JP7389130B2 JP7389130B2 (ja) 2023-11-29

Family

ID=75538700

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021551997A Active JP7389130B2 (ja) 2019-10-14 2019-10-14 測定装置、実装機、クランプ状態取得装置

Country Status (2)

Country Link
JP (1) JP7389130B2 (ja)
WO (1) WO2021074943A1 (ja)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000258131A (ja) * 1999-03-09 2000-09-22 Jt Tohsi Inc 非接触伸び計
JP2004360131A (ja) * 2003-06-06 2004-12-24 Sunlit Sangyo Co Ltd 被服用体格寸法測定方法及び測定システム
JP2011064626A (ja) * 2009-09-18 2011-03-31 Nidec-Read Corp 検査用治具及び検査装置
JP2012021960A (ja) * 2010-07-13 2012-02-02 Eager Co Ltd フェイスモーショントラッキング方法
WO2018150446A1 (ja) * 2017-02-14 2018-08-23 株式会社Ｆｕｊｉ 測定装置、測定方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000258131A (ja) * 1999-03-09 2000-09-22 Jt Tohsi Inc 非接触伸び計
JP2004360131A (ja) * 2003-06-06 2004-12-24 Sunlit Sangyo Co Ltd 被服用体格寸法測定方法及び測定システム
JP2011064626A (ja) * 2009-09-18 2011-03-31 Nidec-Read Corp 検査用治具及び検査装置
JP2012021960A (ja) * 2010-07-13 2012-02-02 Eager Co Ltd フェイスモーショントラッキング方法
WO2018150446A1 (ja) * 2017-02-14 2018-08-23 株式会社Ｆｕｊｉ 測定装置、測定方法

Also Published As

Publication number Publication date
JP7389130B2 (ja) 2023-11-29
WO2021074943A1 (ja) 2021-04-22

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