JPWO2021070415A1 - - Google Patents

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Publication number
JPWO2021070415A1
JPWO2021070415A1 JP2021551140A JP2021551140A JPWO2021070415A1 JP WO2021070415 A1 JPWO2021070415 A1 JP WO2021070415A1 JP 2021551140 A JP2021551140 A JP 2021551140A JP 2021551140 A JP2021551140 A JP 2021551140A JP WO2021070415 A1 JPWO2021070415 A1 JP WO2021070415A1
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2021551140A
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Japanese (ja)
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JP7489670B2 (ja
JPWO2021070415A5 (https=
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Publication of JPWO2021070415A1 publication Critical patent/JPWO2021070415A1/ja
Publication of JPWO2021070415A5 publication Critical patent/JPWO2021070415A5/ja
Application granted granted Critical
Publication of JP7489670B2 publication Critical patent/JP7489670B2/ja
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Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/20—Analysis of motion
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • G06T7/74—Determining position or orientation of objects or cameras using feature-based methods involving reference images or patches
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/80—Geometric correction
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/20—Image preprocessing
    • G06V10/24—Aligning, centring, orientation detection or correction of the image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/20—Image preprocessing
    • G06V10/24—Aligning, centring, orientation detection or correction of the image
    • G06V10/245—Aligning, centring, orientation detection or correction of the image by locating a pattern; Special marks for positioning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/98—Detection or correction of errors, e.g. by rescanning the pattern or by human intervention; Evaluation of the quality of the acquired patterns
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10004—Still image; Photographic image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10028—Range image; Depth image; 3D point clouds
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30132—Masonry; Concrete

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Analysis (AREA)
JP2021551140A 2019-10-10 2020-06-16 補正パラメータ算出方法、変位量算出方法、補正パラメータ算出装置、及び、変位量算出装置 Active JP7489670B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019186791 2019-10-10
JP2019186791 2019-10-10
PCT/JP2020/023535 WO2021070415A1 (ja) 2019-10-10 2020-06-16 補正パラメータ算出方法、変位量算出方法、補正パラメータ算出装置、及び、変位量算出装置

Publications (3)

Publication Number Publication Date
JPWO2021070415A1 true JPWO2021070415A1 (https=) 2021-04-15
JPWO2021070415A5 JPWO2021070415A5 (https=) 2022-07-28
JP7489670B2 JP7489670B2 (ja) 2024-05-24

Family

ID=75437097

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021551140A Active JP7489670B2 (ja) 2019-10-10 2020-06-16 補正パラメータ算出方法、変位量算出方法、補正パラメータ算出装置、及び、変位量算出装置

Country Status (4)

Country Link
US (1) US12283069B2 (https=)
JP (1) JP7489670B2 (https=)
CN (1) CN114450552B (https=)
WO (1) WO2021070415A1 (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7371053B2 (ja) * 2021-03-29 2023-10-30 キヤノン株式会社 電子機器、移動体、撮像装置、および電子機器の制御方法、プログラム、記憶媒体
CN113255643A (zh) * 2021-05-08 2021-08-13 上海砼测检测技术有限公司 一种应用于位移监测的机器视觉识别算法
CN114509224B (zh) * 2021-12-29 2023-11-17 江西飞尚科技有限公司 一种桥梁挠度测试方法、系统、可读存储介质及设备
JP7717011B2 (ja) * 2022-03-09 2025-08-01 三菱重工業株式会社 処理装置および処理方法
EP4372700B1 (en) * 2022-11-18 2025-12-24 Aptiv Technologies AG A system and method for interior sensing in a vehicle

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007171092A (ja) * 2005-12-26 2007-07-05 Ishikawajima Harima Heavy Ind Co Ltd 三次元計測用マーカとこれを用いた三次元計測方法
WO2016158855A1 (ja) * 2015-03-31 2016-10-06 株式会社ニコン 撮像システム、撮像装置、撮像方法、及び撮像プログラム
JP2017215306A (ja) * 2016-02-24 2017-12-07 パナソニックＩｐマネジメント株式会社 変位検出装置および変位検出方法
JP2018067300A (ja) * 2016-10-14 2018-04-26 キヤノン株式会社 情報処理装置及びその制御方法

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JPS5281610U (https=) 1975-12-15 1977-06-17
US6675121B1 (en) * 1999-07-06 2004-01-06 Larry C. Hardin Velocity measuring system
JP4323991B2 (ja) * 2004-03-19 2009-09-02 大日本スクリーン製造株式会社 分光反射率測定装置、膜厚測定装置および分光反射率測定方法
WO2011132364A1 (ja) * 2010-04-19 2011-10-27 パナソニック株式会社 立体画像撮影装置および立体画像撮影方法
JP5281610B2 (ja) 2010-05-14 2013-09-04 西日本旅客鉄道株式会社 レーザー距離計付き撮影装置
JP2012032173A (ja) * 2010-07-28 2012-02-16 Hitachi Zosen Corp 画像計測方法及び画像計測装置
US8867790B2 (en) * 2010-08-03 2014-10-21 Panasonic Corporation Object detection device, object detection method, and program
CN103168271B (zh) * 2011-10-12 2017-03-08 松下知识产权经营株式会社 摄像装置、半导体集成电路以及摄像方法
JP5715735B2 (ja) * 2012-06-29 2015-05-13 富士フイルム株式会社 ３次元測定方法、装置、及びシステム、並びに画像処理装置
JP5222430B1 (ja) * 2012-10-19 2013-06-26 株式会社イノテック 寸法計測装置、寸法計測方法及び寸法計測装置用のプログラム
WO2014080613A1 (ja) * 2012-11-22 2014-05-30 日本電気株式会社 色補正装置、色補正方法および色補正用プログラム
JP6657880B2 (ja) * 2015-01-20 2020-03-04 株式会社リコー 画像処理装置、画像処理方法およびプログラム
US10578713B2 (en) * 2015-06-24 2020-03-03 Panasonic Corporation Radar axis displacement amount calculation device and radar axis displacement calculation method
CN105427331B (zh) * 2015-12-21 2018-06-26 玖壹叁陆零医学科技南京有限公司 一种数字病理切片的测量方法及测量装置
US10062176B2 (en) 2016-02-24 2018-08-28 Panasonic Intellectual Property Management Co., Ltd. Displacement detecting apparatus and displacement detecting method
US11099030B2 (en) * 2016-06-02 2021-08-24 Mitsubishi Electric Corporation Attitude estimation apparatus, attitude estimation method, and observation system
JP6785092B2 (ja) * 2016-08-19 2020-11-18 株式会社Ｓｃｒｅｅｎホールディングス 変位検出装置、変位検出方法および基板処理装置
US10559087B2 (en) * 2016-10-14 2020-02-11 Canon Kabushiki Kaisha Information processing apparatus and method of controlling the same
WO2018158994A1 (ja) * 2017-02-28 2018-09-07 パナソニックＩｐマネジメント株式会社 変位計測装置および変位計測方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007171092A (ja) * 2005-12-26 2007-07-05 Ishikawajima Harima Heavy Ind Co Ltd 三次元計測用マーカとこれを用いた三次元計測方法
WO2016158855A1 (ja) * 2015-03-31 2016-10-06 株式会社ニコン 撮像システム、撮像装置、撮像方法、及び撮像プログラム
JP2017215306A (ja) * 2016-02-24 2017-12-07 パナソニックＩｐマネジメント株式会社 変位検出装置および変位検出方法
JP2018067300A (ja) * 2016-10-14 2018-04-26 キヤノン株式会社 情報処理装置及びその制御方法

Also Published As

Publication number Publication date
JP7489670B2 (ja) 2024-05-24
US20220215582A1 (en) 2022-07-07
CN114450552B (zh) 2025-10-10
US12283069B2 (en) 2025-04-22
CN114450552A (zh) 2022-05-06
WO2021070415A1 (ja) 2021-04-15

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