JPWO2021034445A5 - - Google Patents

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JPWO2021034445A5
JPWO2021034445A5 JP2021537730A JP2021537730A JPWO2021034445A5 JP WO2021034445 A5 JPWO2021034445 A5 JP WO2021034445A5 JP 2021537730 A JP2021537730 A JP 2021537730A JP 2021537730 A JP2021537730 A JP 2021537730A JP WO2021034445 A5 JPWO2021034445 A5 JP WO2021034445A5
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thermal resistance
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resistance value
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Claims (20)

既知の消耗品を試験対象の器具の熱構成要素に接触させることであって、前記消耗品と熱構成要素とが熱境界面を形成し、
所定の質問周波数に基づいて、周期的正弦波入力を使用して前記熱構成要素を駆動することと、
前記周期的正弦波入力を使用して前記熱構成要素を駆動することに応答する、熱センサからの複数の温度出力を測定することであって、前記熱センサは、前記熱構成要素の温度を検出するように配置および構成され、
前記複数の温度出力に、前記周期的正弦波入力と同相の基準信号を乗算して、結果として得られる直流（ＤＣ）信号成分を計算し、同相成分Ｘを判定することと、
前記複数の温度出力に、９０°位相シフト基準信号を乗算して、結果として得られるＤＣ信号成分を計算し、直交位相ずれ成分Ｙを判定することと、
ｔａｎ－１（Ｙ／Ｘ）又はａｔａｎ２（Ｘ，Ｙ）に基づいて、前記周期的正弦波入力に応答する位相オフセットを計算することと、
較正された抵抗位相オフセット式、及び計算された前記位相オフセットを使用して、熱境界面の抵抗値を判定することと、
判定された前記抵抗値を所定の抵抗閾値と比較することと、を含む、方法。 contacting a known consumable with a thermal component of an instrument under test , the consumable and the thermal component forming a thermal interface;
driving the thermal component using a periodic sinusoidal input based on a predetermined interrogation frequency;
measuring a plurality of temperature outputs from a thermal sensor responsive to driving the thermal component using the periodic sinusoidal input, the thermal sensor measuring the temperature of the thermal component; arranged and configured to detect
multiplying the plurality of temperature outputs by a reference signal in phase with the periodic sinusoidal input and calculating a resulting direct current (DC) signal component to determine an in-phase component X;
multiplying the plurality of temperature outputs by a 90° phase-shifted reference signal and calculating a resulting DC signal component to determine a quadrature phase shift component Y;
calculating a phase offset in response to the periodic sinusoidal input based on tan −1 (Y/X) or atan2(X,Y);
determining a resistance value of a thermal interface using a calibrated resistance phase offset equation and the calculated phase offset;
and comparing the determined resistance value to a predetermined resistance threshold. 判定された前記熱抵抗値が、前記所定の熱抵抗閾値を上回り、前記方法は、判定された前記熱抵抗値が前記所定の熱抵抗閾値を上回っていることに基づいて、前記熱構成要素が前記熱境界面の表面に欠陥を有すると判定することを更に含む、請求項１に記載の方法。 The determined thermal resistance value is greater than the predetermined thermal resistance threshold, and the method comprises: based on the determined thermal resistance value being greater than the predetermined thermal resistance threshold, the thermal component 2. The method of claim 1, further comprising determining that the surface of the thermal interface has defects. 判定された前記熱抵抗値が、前記所定の熱抵抗閾値を下回り、前記方法は、判定された前記熱抵抗値が前記所定の熱抵抗閾値を下回っていることに基づいて、前記熱構成要素が許容可能であると判定することを更に含む、請求項１に記載の方法。 The determined thermal resistance value is below the predetermined thermal resistance threshold, and the method comprises: based on the determined thermal resistance value being below the predetermined thermal resistance threshold, the thermal component 2. The method of claim 1, further comprising determining acceptable. 前記熱構成要素が、熱電冷却機を含む、請求項１に記載の方法。 2. The method of claim 1 , wherein the thermal component comprises a thermoelectric cooler. 前記消耗品が、フローセルを含む、請求項１に記載の方法。 3. The method of claim 1 , wherein said consumable comprises a flow cell. 前記所定の質問周波数が、前記既知の消耗品、及び前記器具の前記熱構成要素について推定されたＲＣコーナー値に基づいて判定される、請求項１に記載の方法。 2. The method of claim 1, wherein the predetermined interrogation frequency is determined based on the known consumable and RC corner values estimated for the thermal component of the instrument. 試験対象の消耗品を器具の既知の熱構成要素に接触させることであって、前記消耗品と熱構成要素とが熱境界面を形成し、
所定の質問周波数に基づいて、周期的正弦波入力を使用して前記熱構成要素を駆動することと、
前記周期的正弦波入力を使用して前記熱構成要素を駆動することに応答する、熱センサからの複数の温度出力を測定することであって、前記熱センサは、前記熱構成要素の温度を検出するように配置および構成され、
前記複数の温度出力に、前記周期的正弦波入力と同相の基準信号を乗算して、結果として得られる直流（ＤＣ）信号成分を計算し、同相成分Ｘを判定することと、
前記複数の温度出力に、９０°位相シフト基準信号を乗算して、結果として得られるＤＣ信号成分を計算し、直交位相ずれ成分Ｙを判定することと、
ｔａｎ－１（Ｙ／Ｘ）又はａｔａｎ２（Ｘ，Ｙ）に基づいて、前記周期的正弦波入力に応答する位相オフセットを計算することと、
較正された抵抗位相オフセット式、及び計算された前記位相オフセットを使用して、熱境界面の熱抵抗値を判定することと、
判定された前記熱抵抗値を所定の熱抵抗閾値と比較することと、を含む、方法。 contacting the consumable to be tested with a known thermal component of the instrument , the consumable and the thermal component forming a thermal interface;
driving the thermal component using a periodic sinusoidal input based on a predetermined interrogation frequency;
measuring a plurality of temperature outputs from a thermal sensor responsive to driving the thermal component using the periodic sinusoidal input, the thermal sensor measuring the temperature of the thermal component; arranged and configured to detect
multiplying the plurality of temperature outputs by a reference signal in phase with the periodic sinusoidal input and calculating a resulting direct current (DC) signal component to determine an in-phase component X;
multiplying the plurality of temperature outputs by a 90° phase-shifted reference signal and calculating a resulting DC signal component to determine a quadrature phase shift component Y;
calculating a phase offset in response to the periodic sinusoidal input based on tan −1 (Y/X) or atan2(X,Y);
determining a thermal resistance value of a thermal interface using a calibrated resistance phase offset equation and the calculated phase offset;
and comparing the determined thermal resistance value to a predetermined thermal resistance threshold. 判定された前記熱抵抗値が、前記所定の熱抵抗閾値を上回り、前記方法は、判定された前記熱抵抗値が前記所定の熱抵抗閾値を上回っていることに基づいて、前記消耗品が前記熱境界面に欠陥を有すると判定することを更に含む、請求項７に記載の方法。 The determined thermal resistance value is greater than the predetermined thermal resistance threshold, and the method comprises: based on the determined thermal resistance value being greater than the predetermined thermal resistance threshold, the consumable. 8. The method of claim 7, further comprising determining that the thermal interface is defective. 判定された前記熱抵抗値が、前記所定の熱抵抗閾値を下回り、前記方法は、判定された前記熱抵抗値が前記所定の熱抵抗閾値を下回っていることに基づいて、前記消耗品が許容可能であると判定することを更に含む、請求項７に記載の方法。 The determined thermal resistance value is below the predetermined thermal resistance threshold, and the method includes determining that the consumable is acceptable based on the determined thermal resistance value being below the predetermined thermal resistance threshold. 8. The method of claim 7, further comprising determining possible. 前記熱構成要素が、熱電冷却機を含む、請求項７に記載の方法。 8. The method of claim 7 , wherein the thermal component comprises a thermoelectric cooler. 前記消耗品が、フローセルを含む、請求項７に記載の方法。 8. The method of claim 7 , wherein said consumable comprises a flow cell. 前記所定の質問周波数が、前記消耗品、及び前記器具の前記既知の熱構成要素について推定されたＲＣコーナー値に基づいて判定される、請求項７に記載の方法。 8. The method of claim 7, wherein the predetermined interrogation frequency is determined based on RC corner values estimated for the consumable and the known thermal component of the instrument. 消耗品を器具の熱構成要素に接触させることであって、前記消耗品と熱構成要素とが熱境界面を形成し、
所定の質問周波数に基づいて、周期的正弦波入力を使用して前記熱構成要素を駆動することと、
前記周期的正弦波入力を使用して前記熱構成要素を駆動することに応答する、熱センサからの複数の温度出力を測定することであって、前記熱センサは、前記熱構成要素の温度を検出するように配置および構成され、
前記複数の温度出力に、前記周期的正弦波入力と同相の基準信号を乗算して、結果として得られる直流（ＤＣ）信号成分を計算し、同相成分Ｘを判定することと、
前記複数の温度出力に、９０°位相シフト基準信号を乗算して、結果として得られるＤＣ信号成分を計算し、直交位相ずれ成分Ｙを判定することと、
ｔａｎ－１（Ｙ／Ｘ）又はａｔａｎ２（Ｘ，Ｙ）に基づいて、前記周期的正弦波入力に応答する位相オフセットを計算することと、
較正された抵抗位相オフセット式、及び計算された前記位相オフセットを使用して、熱境界面の熱抵抗値を判定することと、
判定された前記熱抵抗値を第１の所定の熱抵抗閾値と比較することと、
判定された前記熱抵抗値を第２の所定の熱抵抗閾値と比較することと、
判定された前記熱抵抗値と、前記第１及び第２の所定の熱抵抗閾値との前記比較に基づいて、前記熱境界面の特性を判定することと、を含む、方法。 contacting the consumable with a thermal component of the instrument , the consumable and the thermal component forming a thermal interface;
driving the thermal component using a periodic sinusoidal input based on a predetermined interrogation frequency;
measuring a plurality of temperature outputs from a thermal sensor responsive to driving the thermal component using the periodic sinusoidal input, the thermal sensor measuring the temperature of the thermal component; arranged and configured to detect
multiplying the plurality of temperature outputs by a reference signal in phase with the periodic sinusoidal input and calculating a resulting direct current (DC) signal component to determine an in-phase component X;
multiplying the plurality of temperature outputs by a 90° phase-shifted reference signal and calculating a resulting DC signal component to determine a quadrature phase shift component Y;
calculating a phase offset in response to the periodic sinusoidal input based on tan −1 (Y/X) or atan2(X,Y);
determining a thermal resistance value of a thermal interface using a calibrated resistance phase offset equation and the calculated phase offset;
comparing the determined thermal resistance value to a first predetermined thermal resistance threshold;
comparing the determined thermal resistance value to a second predetermined thermal resistance threshold;
determining a characteristic of the thermal interface based on the comparison of the determined thermal resistance value and the first and second predetermined thermal resistance thresholds. 判定された前記熱抵抗値が、前記第１の所定の熱抵抗閾値を下回り、前記方法は、判定された前記熱抵抗値が前記第１の所定の熱抵抗閾値を下回っていることに基づいて、前記熱境界面が許容可能であると判定することを更に含む、請求項１３に記載の方法。The determined thermal resistance value is below the first predetermined thermal resistance threshold, and the method is based on the determined thermal resistance value being below the first predetermined thermal resistance threshold. 14. The method of claim 13, further comprising determining that the thermal interface is acceptable. 判定された前記熱抵抗値が、前記第２の所定の熱抵抗閾値を上回り、前記方法は、判定された前記熱抵抗値が前記第２の所定の熱抵抗閾値を上回っていることに基づいて、前記消耗品が前記器具内に挿入されていないと判定することを更に含む、請求項１３に記載の方法。 The determined thermal resistance value is above the second predetermined thermal resistance threshold, and the method is based on the determined thermal resistance value being above the second predetermined thermal resistance threshold. 14. The method of claim 13, further comprising determining that the consumable is not inserted within the instrument. 判定された前記熱抵抗値が、前記第２の所定の熱抵抗閾値を下回り、かつ前記第１の所定の熱抵抗閾値を上回っており、前記方法は、判定された前記熱抵抗値が前記第２の所定の熱抵抗閾値を下回り、かつ前記第１の所定の熱抵抗閾値を上回っていることに基づいて、欠陥又はごみが前記熱境界面に存在すると判定することを更に含む、請求項１３に記載の方法。 The determined thermal resistance value is below the second predetermined thermal resistance threshold and above the first predetermined thermal resistance threshold, and the method comprises: 14. Further comprising determining that a defect or debris is present at the thermal interface based on being below two predetermined thermal resistance thresholds and above the first predetermined thermal resistance threshold. The method described in . 前記熱構成要素が、熱電冷却機を含む、請求項１３に記載の方法。 14. The method of claim 13 , wherein the thermal component comprises a thermoelectric cooler. 前記消耗品が、合成による配列決定のために使用されるフローセルを含む、請求項１３に記載の方法。 14. The method of claim 13, wherein said consumable comprises a flow cell used for sequencing-by-synthesis . 前記所定の質問周波数が、前記消耗品、及び前記器具の前記熱構成要素について推定されたＲＣコーナー値に基づいて判定される、請求項１３に記載の方法。 14. The method of claim 13, wherein the predetermined interrogation frequency is determined based on RC corner values estimated for the consumable and the thermal component of the instrument. 請求項１３に記載の方法を器具に実行させる命令を含むコンピュータプログラムが格納された、コンピュータ可読媒体。 14. A computer readable medium storing a computer program containing instructions for causing a device to perform the method of claims 1-3 .
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US201962887901P 2019-08-16 2019-08-16
US62/887,901 2019-08-16
NL2023792 2019-09-06
NL2023792A NL2023792B1 (en) 2019-08-16 2019-09-06 Method for measuring thermal resistance at interface between consumable and thermocycler
PCT/US2020/043376 WO2021034445A1 (en) 2019-08-16 2020-07-24 Method for measuring thermal resistance between a thermal component of an instrument and a consumable

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