JPWO2021024800A1 - - Google Patents
Info
- Publication number
- JPWO2021024800A1 JPWO2021024800A1 JP2021537687A JP2021537687A JPWO2021024800A1 JP WO2021024800 A1 JPWO2021024800 A1 JP WO2021024800A1 JP 2021537687 A JP2021537687 A JP 2021537687A JP 2021537687 A JP2021537687 A JP 2021537687A JP WO2021024800 A1 JPWO2021024800 A1 JP WO2021024800A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0871—Complete apparatus or systems; circuits, e.g. receivers or amplifiers
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/30—Monitoring; Testing of propagation channels
- H04B17/309—Measuring or estimating channel quality parameters
- H04B17/345—Interference values
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
- G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
- G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/10—Monitoring; Testing of transmitters
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/10—Monitoring; Testing of transmitters
- H04B17/101—Monitoring; Testing of transmitters for measurement of specific parameters of the transmitter or components thereof
- H04B17/103—Reflected power, e.g. return loss
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/20—Monitoring; Testing of receivers
- H04B17/23—Indication means, e.g. displays, alarms, audible means
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/20—Monitoring; Testing of receivers
- H04B17/29—Performance testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- General Physics & Mathematics (AREA)
- Quality & Reliability (AREA)
- Mathematical Physics (AREA)
- Monitoring And Testing Of Transmission In General (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019145783 | 2019-08-07 | ||
PCT/JP2020/028272 WO2021024800A1 (ja) | 2019-08-07 | 2020-07-21 | 測定装置および測定方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPWO2021024800A1 true JPWO2021024800A1 (ja) | 2021-02-11 |
Family
ID=74503826
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2021537687A Pending JPWO2021024800A1 (ja) | 2019-08-07 | 2020-07-21 |
Country Status (3)
Country | Link |
---|---|
US (1) | US20220276292A1 (ja) |
JP (1) | JPWO2021024800A1 (ja) |
WO (1) | WO2021024800A1 (ja) |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05281274A (ja) * | 1992-04-03 | 1993-10-29 | Nippon Telegr & Teleph Corp <Ntt> | 3次元妨害波源探知装置 |
US6995564B1 (en) * | 2003-01-15 | 2006-02-07 | Advanced Micro Devices, Inc. | Method and system for locating chip-level defects through emission imaging of a semiconductor device |
CN101501476B (zh) * | 2006-09-06 | 2013-03-27 | 国立大学法人横浜国立大学 | 无源互调失真的测定方法及测定系统 |
JP2013053859A (ja) * | 2011-09-01 | 2013-03-21 | Taiyo Yuden Co Ltd | 電磁妨害源を特定する測定装置及びその推測方法並びにそれらの動作をさせるコンピュータ読み取り可能な情報記録媒体 |
JP5892903B2 (ja) * | 2012-09-24 | 2016-03-23 | 三菱電機株式会社 | 電磁ノイズ検出装置 |
US9252895B1 (en) * | 2014-07-25 | 2016-02-02 | Keysight Technologies, Inc. | System and method of measuring full spectrum of modulated output signal from device under test |
JP6448021B2 (ja) * | 2014-09-03 | 2019-01-09 | 富士通コネクテッドテクノロジーズ株式会社 | 携帯電話端末 |
US9768892B1 (en) * | 2015-03-30 | 2017-09-19 | Anritsu Company | Pulse modulated passive intermodulation (PIM) measuring instrument with reduced noise floor |
EP3561528A1 (en) * | 2018-04-25 | 2019-10-30 | Rohde & Schwarz GmbH & Co. KG | Measurement arrangement and measurement method |
US10237765B1 (en) * | 2018-09-07 | 2019-03-19 | Anritsu Company | Passive intermodulation (PIM) measuring instrument and method of measuring PIM |
-
2020
- 2020-07-21 US US17/631,607 patent/US20220276292A1/en active Pending
- 2020-07-21 JP JP2021537687A patent/JPWO2021024800A1/ja active Pending
- 2020-07-21 WO PCT/JP2020/028272 patent/WO2021024800A1/ja active Application Filing
Also Published As
Publication number | Publication date |
---|---|
US20220276292A1 (en) | 2022-09-01 |
WO2021024800A1 (ja) | 2021-02-11 |
Similar Documents
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