JPWO2020217371A1 - - Google Patents

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Publication number
JPWO2020217371A1
JPWO2020217371A1 JP2021515399A JP2021515399A JPWO2020217371A1 JP WO2020217371 A1 JPWO2020217371 A1 JP WO2020217371A1 JP 2021515399 A JP2021515399 A JP 2021515399A JP 2021515399 A JP2021515399 A JP 2021515399A JP WO2020217371 A1 JPWO2020217371 A1 JP WO2020217371A1
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JP
Japan
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JP2021515399A
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JP7164028B2 (ja
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Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/08—Learning methods
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/04—Architecture, e.g. interconnection topology
    • G06N3/045—Combinations of networks
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0012—Biomedical image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N5/00—Computing arrangements using knowledge-based models
    • G06N5/01—Dynamic search techniques; Heuristics; Dynamic trees; Branch-and-bound

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Computing Systems (AREA)
  • Mathematical Physics (AREA)
  • Data Mining & Analysis (AREA)
  • Evolutionary Computation (AREA)
  • Biophysics (AREA)
  • Molecular Biology (AREA)
  • Biomedical Technology (AREA)
  • General Engineering & Computer Science (AREA)
  • Artificial Intelligence (AREA)
  • Computational Linguistics (AREA)
  • Software Systems (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Medical Informatics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Image Analysis (AREA)
JP2021515399A 2019-04-25 2019-04-25 学習システム、データ生成装置、データ生成方法、及びデータ生成プログラム Active JP7164028B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2019/017585 WO2020217371A1 (ja) 2019-04-25 2019-04-25 学習システム、データ生成装置、データ生成方法、及びデータ生成プログラム

Publications (2)

Publication Number Publication Date
JPWO2020217371A1 true JPWO2020217371A1 (ja) 2020-10-29
JP7164028B2 JP7164028B2 (ja) 2022-11-01

Family

ID=72941179

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021515399A Active JP7164028B2 (ja) 2019-04-25 2019-04-25 学習システム、データ生成装置、データ生成方法、及びデータ生成プログラム

Country Status (5)

Country Link
US (1) US20220172046A1 (ja)
EP (1) EP3961555A4 (ja)
JP (1) JP7164028B2 (ja)
CN (1) CN113557536B (ja)
WO (1) WO2020217371A1 (ja)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20220237890A1 (en) * 2021-01-22 2022-07-28 Samsung Electronics Co., Ltd. Method and apparatus with neural network training
CN114913565B (zh) 2021-01-28 2023-11-17 腾讯科技（深圳）有限公司 人脸图像检测方法、模型训练方法、装置及存储介质
JP7092228B1 (ja) * 2021-03-30 2022-06-28 沖電気工業株式会社 学習装置、学習方法およびプログラム
JP7449338B2 (ja) 2021-09-03 2024-03-13 東京エレクトロンデバイス株式会社 情報処理方法、プログラム、情報処理装置及び情報処理システム

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US5835901A (en) * 1994-01-25 1998-11-10 Martin Marietta Corporation Perceptive system including a neural network
JP2006105943A (ja) * 2004-10-08 2006-04-20 Omron Corp 知識作成装置及びパラメータ探索方法並びにプログラム製品
JP2012026982A (ja) 2010-07-27 2012-02-09 Panasonic Electric Works Sunx Co Ltd 検査装置
JP2016031746A (ja) * 2014-07-30 2016-03-07 キヤノン株式会社 情報処理装置、情報処理方法
CN105654176B (zh) * 2014-11-14 2018-03-27 富士通株式会社 神经网络系统及神经网络系统的训练装置和方法
JP6613030B2 (ja) * 2015-01-19 2019-11-27 株式会社メガチップス 判定装置、制御プログラム及び判定方法
CN106295799B (zh) * 2015-05-12 2018-11-02 核工业北京地质研究院 一种深度学习多层神经网络的实现方法
KR102114564B1 (ko) * 2015-10-30 2020-05-22 가부시키가이샤 모르포 학습 시스템, 학습 장치, 학습 방법, 학습 프로그램, 교사 데이터 작성 장치, 교사 데이터 작성 방법, 교사 데이터 작성 프로그램, 단말 장치 및 임계치 변경 장치
US11093826B2 (en) * 2016-02-05 2021-08-17 International Business Machines Corporation Efficient determination of optimized learning settings of neural networks
JP2018005640A (ja) * 2016-07-04 2018-01-11 タカノ株式会社 分類器生成装置、画像検査装置、及び、プログラム
CN106446209A (zh) * 2016-09-30 2017-02-22 浙江大学 一种海洋环境监测要素短期预测方法
JP6751235B2 (ja) * 2016-09-30 2020-09-02 富士通株式会社 機械学習プログラム、機械学習方法、および機械学習装置
CN109325508A (zh) * 2017-07-31 2019-02-12 阿里巴巴集团控股有限公司 知识表示、机器学习模型训练、预测方法、装置以及电子设备
KR102491546B1 (ko) * 2017-09-22 2023-01-26 삼성전자주식회사 객체를 인식하는 방법 및 장치
CN108182389B (zh) * 2017-12-14 2021-07-30 华南师范大学 基于大数据与深度学习的用户数据处理方法、机器人系统

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
BELUCH,H.WILLIAM ET AL.: "The power of ensembles for active learning in image classification", IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION, JPN6019027455, 2018, pages 9368 - 9377, XP033473863, ISSN: 0004842243, DOI: 10.1109/CVPR.2018.00976 *

Also Published As

Publication number Publication date
EP3961555A4 (en) 2022-11-02
WO2020217371A1 (ja) 2020-10-29
US20220172046A1 (en) 2022-06-02
JP7164028B2 (ja) 2022-11-01
CN113557536A (zh) 2021-10-26
CN113557536B (zh) 2024-05-31
EP3961555A1 (en) 2022-03-02

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