JPWO2020189722A1 - - Google Patents
Info
- Publication number
- JPWO2020189722A1 JPWO2020189722A1 JP2021507398A JP2021507398A JPWO2020189722A1 JP WO2020189722 A1 JPWO2020189722 A1 JP WO2020189722A1 JP 2021507398 A JP2021507398 A JP 2021507398A JP 2021507398 A JP2021507398 A JP 2021507398A JP WO2020189722 A1 JPWO2020189722 A1 JP WO2020189722A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
- G01N21/3586—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation by Terahertz time domain spectroscopy [THz-TDS]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0218—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using optical fibers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
- G01J3/433—Modulation spectrometry; Derivative spectrometry
- G01J2003/4334—Modulation spectrometry; Derivative spectrometry by modulation of source, e.g. current modulation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/061—Sources
- G01N2201/06113—Coherent sources; lasers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/069—Supply of sources
- G01N2201/0696—Pulsed
- G01N2201/0697—Pulsed lasers
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019053682 | 2019-03-20 | ||
JP2019053682 | 2019-03-20 | ||
PCT/JP2020/012005 WO2020189722A1 (ja) | 2019-03-20 | 2020-03-18 | テラヘルツ光検出器およびテラヘルツ測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2020189722A1 true JPWO2020189722A1 (ja) | 2020-09-24 |
JP7388427B2 JP7388427B2 (ja) | 2023-11-29 |
Family
ID=72520239
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2021507398A Active JP7388427B2 (ja) | 2019-03-20 | 2020-03-18 | テラヘルツ光検出器、テラヘルツ測定装置およびテラヘルツ光の検出方法 |
Country Status (3)
Country | Link |
---|---|
US (1) | US11867621B2 (ja) |
JP (1) | JP7388427B2 (ja) |
WO (1) | WO2020189722A1 (ja) |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010237228A (ja) * | 2010-07-28 | 2010-10-21 | Sony Corp | テラヘルツ分光装置 |
JP2012230050A (ja) * | 2011-04-27 | 2012-11-22 | Nagoya Univ | スペクトル計測装置およびスペクトル計測方法 |
JP2013068528A (ja) * | 2011-09-22 | 2013-04-18 | Aisin Seiki Co Ltd | テラヘルツ波伝播装置、及びテラヘルツ波発生部又は検出部の固定部材 |
JP2014029478A (ja) * | 2012-07-03 | 2014-02-13 | Canon Inc | テラヘルツ波発生素子、テラヘルツ波検出素子、及びテラヘルツ時間領域分光装置 |
WO2014125729A1 (ja) * | 2013-02-13 | 2014-08-21 | ソニー株式会社 | 測定装置及び測定方法 |
JP2016085156A (ja) * | 2014-10-28 | 2016-05-19 | セイコーエプソン株式会社 | 計測装置 |
JP2018036121A (ja) * | 2016-08-31 | 2018-03-08 | フェムトディプロイメンツ株式会社 | テラヘルツ時間領域分光装置 |
-
2020
- 2020-03-18 JP JP2021507398A patent/JP7388427B2/ja active Active
- 2020-03-18 US US17/439,988 patent/US11867621B2/en active Active
- 2020-03-18 WO PCT/JP2020/012005 patent/WO2020189722A1/ja active Application Filing
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010237228A (ja) * | 2010-07-28 | 2010-10-21 | Sony Corp | テラヘルツ分光装置 |
JP2012230050A (ja) * | 2011-04-27 | 2012-11-22 | Nagoya Univ | スペクトル計測装置およびスペクトル計測方法 |
JP2013068528A (ja) * | 2011-09-22 | 2013-04-18 | Aisin Seiki Co Ltd | テラヘルツ波伝播装置、及びテラヘルツ波発生部又は検出部の固定部材 |
JP2014029478A (ja) * | 2012-07-03 | 2014-02-13 | Canon Inc | テラヘルツ波発生素子、テラヘルツ波検出素子、及びテラヘルツ時間領域分光装置 |
WO2014125729A1 (ja) * | 2013-02-13 | 2014-08-21 | ソニー株式会社 | 測定装置及び測定方法 |
JP2016085156A (ja) * | 2014-10-28 | 2016-05-19 | セイコーエプソン株式会社 | 計測装置 |
JP2018036121A (ja) * | 2016-08-31 | 2018-03-08 | フェムトディプロイメンツ株式会社 | テラヘルツ時間領域分光装置 |
Non-Patent Citations (1)
Title |
---|
PALACI, J. ET AL: "SOA-based optical processing for terahertz time-domain spectroscopy", ELECTRONICS LETTERS, vol. 48, no. 10, JPN6022035901, 10 May 2012 (2012-05-10), pages 593 - 594, XP006040861, ISSN: 0004862793, DOI: 10.1049/el.2012.0761 * |
Also Published As
Publication number | Publication date |
---|---|
WO2020189722A1 (ja) | 2020-09-24 |
JP7388427B2 (ja) | 2023-11-29 |
US11867621B2 (en) | 2024-01-09 |
US20220146420A1 (en) | 2022-05-12 |
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