JPWO2020183617A1 - - Google Patents
Info
- Publication number
- JPWO2020183617A1 JPWO2020183617A1 JP2021504683A JP2021504683A JPWO2020183617A1 JP WO2020183617 A1 JPWO2020183617 A1 JP WO2020183617A1 JP 2021504683 A JP2021504683 A JP 2021504683A JP 2021504683 A JP2021504683 A JP 2021504683A JP WO2020183617 A1 JPWO2020183617 A1 JP WO2020183617A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Materials For Photolithography (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2019/010057 WO2020183617A1 (en) | 2019-03-12 | 2019-03-12 | Photosensitive resin composition, patterned cured film and production method therefor, semiconductor element, and electronic device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2020183617A1 true JPWO2020183617A1 (en) | 2020-09-17 |
JP7287453B2 JP7287453B2 (en) | 2023-06-06 |
Family
ID=72427406
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2021504683A Active JP7287453B2 (en) | 2019-03-12 | 2019-03-12 | Photosensitive resin composition, pattern cured film and method for producing same, semiconductor element and electronic device |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP7287453B2 (en) |
WO (1) | WO2020183617A1 (en) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2008123053A1 (en) * | 2007-03-30 | 2008-10-16 | Toray Industries, Inc. | Positive photosensitive resin composition |
WO2009145153A1 (en) * | 2008-05-29 | 2009-12-03 | 旭化成イーマテリアルズ株式会社 | Photosensitive resin composition |
JP2011013644A (en) * | 2009-07-06 | 2011-01-20 | Asahi Kasei E-Materials Corp | Photosensitive resin composition |
JP2017187752A (en) * | 2016-03-31 | 2017-10-12 | 東京応化工業株式会社 | Composition for forming interlayer insulating film, interlayer insulating film, method for forming interlayer insulating film pattern, and device |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4380178B2 (en) * | 2002-03-28 | 2009-12-09 | 日立化成デュポンマイクロシステムズ株式会社 | Positive photosensitive resin composition, pattern manufacturing method, and electronic component |
-
2019
- 2019-03-12 WO PCT/JP2019/010057 patent/WO2020183617A1/en active Application Filing
- 2019-03-12 JP JP2021504683A patent/JP7287453B2/en active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2008123053A1 (en) * | 2007-03-30 | 2008-10-16 | Toray Industries, Inc. | Positive photosensitive resin composition |
WO2009145153A1 (en) * | 2008-05-29 | 2009-12-03 | 旭化成イーマテリアルズ株式会社 | Photosensitive resin composition |
JP2011013644A (en) * | 2009-07-06 | 2011-01-20 | Asahi Kasei E-Materials Corp | Photosensitive resin composition |
JP2017187752A (en) * | 2016-03-31 | 2017-10-12 | 東京応化工業株式会社 | Composition for forming interlayer insulating film, interlayer insulating film, method for forming interlayer insulating film pattern, and device |
Also Published As
Publication number | Publication date |
---|---|
WO2020183617A1 (en) | 2020-09-17 |
JP7287453B2 (en) | 2023-06-06 |
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