JPWO2020183616A1 - - Google Patents
Info
- Publication number
- JPWO2020183616A1 JPWO2020183616A1 JP2021504682A JP2021504682A JPWO2020183616A1 JP WO2020183616 A1 JPWO2020183616 A1 JP WO2020183616A1 JP 2021504682 A JP2021504682 A JP 2021504682A JP 2021504682 A JP2021504682 A JP 2021504682A JP WO2020183616 A1 JPWO2020183616 A1 JP WO2020183616A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2019/010045 WO2020183616A1 (en) | 2019-03-12 | 2019-03-12 | Defect sensor for metal plate and defect inspection device equipped with same |
Publications (1)
Publication Number | Publication Date |
---|---|
JPWO2020183616A1 true JPWO2020183616A1 (en) | 2020-09-17 |
Family
ID=72427399
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2021504682A Pending JPWO2020183616A1 (en) | 2019-03-12 | 2019-03-12 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPWO2020183616A1 (en) |
WO (1) | WO2020183616A1 (en) |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005121599A (en) * | 2003-10-20 | 2005-05-12 | Komatsu Ltd | Defect inspection device of press formed article |
JP2005156420A (en) * | 2003-11-27 | 2005-06-16 | Nippon Steel Corp | Inspection method and device of surface irregularity |
JP2011075412A (en) * | 2009-09-30 | 2011-04-14 | Jfe Steel Corp | Sorting method of surface-treated steel sheet |
JP2013036948A (en) * | 2011-08-11 | 2013-02-21 | Futec Inc | Defect inspection device |
US20130057678A1 (en) * | 2010-05-17 | 2013-03-07 | Ford Espana S.L. | Inspection system and method of defect detection on specular surfaces |
JP2017150872A (en) * | 2016-02-23 | 2017-08-31 | 株式会社ヒューテック | Defect inspection device |
-
2019
- 2019-03-12 JP JP2021504682A patent/JPWO2020183616A1/ja active Pending
- 2019-03-12 WO PCT/JP2019/010045 patent/WO2020183616A1/en active Application Filing
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005121599A (en) * | 2003-10-20 | 2005-05-12 | Komatsu Ltd | Defect inspection device of press formed article |
JP2005156420A (en) * | 2003-11-27 | 2005-06-16 | Nippon Steel Corp | Inspection method and device of surface irregularity |
JP2011075412A (en) * | 2009-09-30 | 2011-04-14 | Jfe Steel Corp | Sorting method of surface-treated steel sheet |
US20130057678A1 (en) * | 2010-05-17 | 2013-03-07 | Ford Espana S.L. | Inspection system and method of defect detection on specular surfaces |
JP2013036948A (en) * | 2011-08-11 | 2013-02-21 | Futec Inc | Defect inspection device |
JP2017150872A (en) * | 2016-02-23 | 2017-08-31 | 株式会社ヒューテック | Defect inspection device |
Also Published As
Publication number | Publication date |
---|---|
WO2020183616A1 (en) | 2020-09-17 |
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