JPWO2020179342A1 - - Google Patents
Info
- Publication number
- JPWO2020179342A1 JPWO2020179342A1 JP2021503477A JP2021503477A JPWO2020179342A1 JP WO2020179342 A1 JPWO2020179342 A1 JP WO2020179342A1 JP 2021503477 A JP2021503477 A JP 2021503477A JP 2021503477 A JP2021503477 A JP 2021503477A JP WO2020179342 A1 JPWO2020179342 A1 JP WO2020179342A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/29—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the position or the direction of light beams, i.e. deflection
- G02F1/31—Digital deflection, i.e. optical switching
- G02F1/313—Digital deflection, i.e. optical switching in an optical waveguide structure
- G02F1/3137—Digital deflection, i.e. optical switching in an optical waveguide structure with intersecting or branching waveguides, e.g. X-switches and Y-junctions
- G02F1/3138—Digital deflection, i.e. optical switching in an optical waveguide structure with intersecting or branching waveguides, e.g. X-switches and Y-junctions the optical waveguides being made of semiconducting materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/29—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the position or the direction of light beams, i.e. deflection
- G02F1/295—Analog deflection from or in an optical waveguide structure]
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
- Optical Integrated Circuits (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019037401 | 2019-03-01 | ||
JP2019037401 | 2019-03-01 | ||
PCT/JP2020/004402 WO2020179342A1 (ja) | 2019-03-01 | 2020-02-05 | 光学装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JPWO2020179342A1 true JPWO2020179342A1 (ja) | 2020-09-10 |
JPWO2020179342A5 JPWO2020179342A5 (ja) | 2023-02-10 |
JP7411936B2 JP7411936B2 (ja) | 2024-01-12 |
Family
ID=72336888
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2021503477A Active JP7411936B2 (ja) | 2019-03-01 | 2020-02-05 | 光学装置 |
Country Status (3)
Country | Link |
---|---|
US (1) | US11947240B2 (ja) |
JP (1) | JP7411936B2 (ja) |
WO (1) | WO2020179342A1 (ja) |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR930010473B1 (ko) | 1989-09-22 | 1993-10-25 | 마쯔시다덴기산교 가부시기가이샤 | 편광소자 및 그것을 사용한 광학헤드장치 |
JPH04168427A (ja) * | 1990-10-31 | 1992-06-16 | Matsushita Electric Ind Co Ltd | 光偏向素子 |
IL141536A (en) * | 1998-08-21 | 2005-07-25 | Olivier M Parriaux | Device for measuring translation, rotation or velocity via light beam interference |
DE10058239B4 (de) | 2000-11-17 | 2012-01-26 | Dr. Johannes Heidenhain Gmbh | Positionsmeßeinrichtung |
JP4168427B2 (ja) | 2006-05-18 | 2008-10-22 | 栄一 浦谷 | 圧縮空気の供給方法及び供給装置 |
JP6123163B2 (ja) | 2012-03-21 | 2017-05-10 | 株式会社豊田中央研究所 | 距離測定装置 |
US9091667B2 (en) * | 2013-10-25 | 2015-07-28 | Globalfoundries Inc. | Detection of particle contamination on wafers |
EP3411660A4 (en) | 2015-11-30 | 2019-11-27 | Luminar Technologies, Inc. | LIDAR SYSTEM WITH DISTRIBUTED LASER AND MULTIPLE SENSOR HEADS AND PULSED LASER FOR LIDAR SYSTEM |
KR20170071394A (ko) * | 2015-12-15 | 2017-06-23 | (주)다울아토닉스 | 무회전 무주사 라이다 광원 검출 장치 |
JP6711025B2 (ja) | 2016-03-03 | 2020-06-17 | 株式会社豊田中央研究所 | グレーティングカプラ、グレーティングカプラアレイ、結像光学系、光スキャナ、及びレーザレーダ装置 |
JP2017187649A (ja) | 2016-04-06 | 2017-10-12 | 株式会社豊田中央研究所 | 光フェーズドアレイ、及び光アンテナ |
US10775506B2 (en) | 2017-01-31 | 2020-09-15 | Panasonic Intellectual Property Management Co., Ltd. | Imaging system |
-
2020
- 2020-02-05 WO PCT/JP2020/004402 patent/WO2020179342A1/ja active Application Filing
- 2020-02-05 JP JP2021503477A patent/JP7411936B2/ja active Active
-
2021
- 2021-05-19 US US17/324,164 patent/US11947240B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
WO2020179342A1 (ja) | 2020-09-10 |
JP7411936B2 (ja) | 2024-01-12 |
US11947240B2 (en) | 2024-04-02 |
US20210271149A1 (en) | 2021-09-02 |
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