JPWO2020109120A5

JPWO2020109120A5 -

Info

Publication number: JPWO2020109120A5
Application number: JP2021530077A
Authority: JP
Publication date: 2022-03-02
Anticipated expiration: 2039-11-21

Claims

An imaging detector for capturing optical imaging data and X-ray imaging data.
-With the board
-The photosensitive sensor and
-X-ray scintillator and
-Including an array of optical component configurations
The photosensitive sensor comprises sensor pixels distributed across the image detector.
The X-ray scintillator is configured to convert the energy of incident X-ray radiation into optical photons.
The image detector is
Each optical component configuration comprises at least one optical component configured to direct incident light radiation towards the photosensitive sensor.
The sensor pixels include optical pixels, and each optical pixel is coupled with its respective optical component configuration to receive the incident light emission, thereby producing the optical imaging data.
The sensor pixel comprises an X-ray pixel that receives the converted optical photon and thereby is coupled with the X-ray scintillator to generate the X-ray imaging data.
Imaging detector.

The at least one optical component configuration includes a light focusing component for focusing or narrowing the incident light radiation to the photosensitive sensor.
The light focusing component is at least one selected from microlenses and optical collimators.
The imaging detector according to claim 1.

The X-ray scintillator is a pixelated scintillator that includes an array of scintillator elements.
The array of optical components and the array of scintillator elements i) direct the incident light radiation to the sensor pixels in the gap between the scintillator elements, thereby forming separate optical and x-ray pixels. Or ii) to guide to the sensor pixel coupled with the X-ray scintillator, thereby forming a common optical pixel and X-ray pixel.
Positioned against each other,
The imaging detector according to claim 1 or 2.

The at least one optical component configuration comprises an optical guide located inside the gap between the scintillator elements and optionally coupled with an optical filter and / or a light source.
The imaging detector of claim 3, wherein the optical guide is coupled with a respective light focusing component to guide the incident light radiation towards the sensor pixel in the gap between the scintillator elements.

The light focusing component is a microlens and
The microlens has the following shape and position, that is,
i) Microlenses shaped symmetrically at positions symmetrical with respect to each optical guide,
ii) having at least one of asymmetrically shaped microlenses at asymmetric positions with respect to each optical guide, and ii) asymmetrically shaped microlenses.
The imaging detector according to claim 4.

The microlens is a composite microlens and
The position of the composite microlens is
i) Inside the gap between scintillator elements,
ii) at least one of the inside between the trapezoidal scintillator elements and ii) above the gap between the trapezoidal scintillator elements.
The imaging detector according to claim 3.

The array of optical components and the array of scintillator elements are arranged on opposite sides of the photosensitive sensor, the photosensitive sensors are photosensitive on both sides, and each optical component configuration emits the incident light to its respective scintillator. It is configured to orient towards one or more X-ray pixels associated with the element, or
The array of optical components and the array of scintillator elements are located on the same side of the photosensitive sensor, and each optical component configuration directs the incident light radiation through each scintillator element to one or more X-ray pixels. Configured to orient
The at least one scintillator element has a surface shape configured in such a way that the at least one scintillator element itself acts as a microlens for optical imaging.
The imaging detector according to claim 3.

The array of scintillator elements
i) Different thickness,
ii) Different sizes between scintillator elements,
iii) A size different from the size of the sensor pixel,
iv) Different distance gaps,
v) Non-uniform dispersion,
vi) containing different radiation conversion materials and / or vi) scintillator elements with different compositions of radiation conversion materials.
The composition of the radiation conversion material is
-The dope level of the radiation conversion material,
-Dipping material, and-Different in at least one of the dope material combinations,
The imaging detector according to any one of claims 3 to 7.

The imaging detector according to claim 1 or 2, wherein the X-ray scintillator is a continuous scintillator containing a radiation conversion material.

The at least one microlens is configured to be an optical filter for selectively transmitting light of different wavelengths and / or
The optical guide is configured to be an optical filter for selectively transmitting light of different wavelengths.
The imaging detector according to any one of claims 2 to 9.

Semi-transmissive optical mirrors are provided,
The semi-transmissive optical mirrors are provided as an array of optical filters, each optical filter configured to prevent one or more X-ray pixels from receiving the incident light radiation and / or the semi-transmissive. Sexual optical mirrors are provided as an array of optical switches, where each optical switch selects the incident light radiation received by one or more X-ray pixels in synchronization with time-interleaved X-ray and optical imaging. Configured to allow on / off switching
The imaging detector according to any one of claims 1 to 10.

The array of the optical component configuration is
i) Different focal lengths,
ii) Different distance gaps,
iii) Non-uniform distribution,
iv) different sizes between microlenses and / or v) different sizes compared to the size of the sensor pixels, including microlenses,
The imaging detector according to any one of claims 3 to 11.

The substrate comprises a flat or substantially flat or curved shape and
The substrate comprises silicon, glass or polymer foil.
The imaging detector according to any one of claims 1 to 12.

The imaging detector according to claim 1 and
X-ray source and
Including optical sources
The X-ray source is configured to provide X-ray radiation.
The optical source is configured to provide light radiation.
The image pickup detector is configured to detect the X-ray radiation and generate X-ray image pickup data, and detect the light radiation to generate optical image pickup data.
Imaging system.

A method for manufacturing an image pickup detector for capturing the optical image pickup data and the X-ray image pickup data according to any one of claims 1 to 13 .
a) Steps to form the substrate and
b) The step of forming the photosensitive sensor on the substrate and
c) Including the step of placing an array of X-ray scintillators and optics configurations on the photosensitive sensor by a pick-and-place assembly transfer process.
The photosensitive sensor comprises sensor pixels distributed across the image detector.
The X-ray scintillator is configured to convert the energy of incident X-ray radiation into optical photons.
Each optical component configuration comprises at least one optical component configured to direct incident light radiation towards the photosensitive sensor.
The sensor pixels include optical pixels, and each optical pixel is coupled with its respective optical component configuration to receive the incident light emission, thereby producing the optical imaging data.
The sensor pixel comprises an X-ray pixel that receives the converted optical photon and thereby is coupled with the X-ray scintillator to generate the X-ray imaging data.
Method.