JPWO2017168608A1 - Non-contact voltage measuring device and non-contact voltage measuring method - Google Patents

Abstract

  A non-contact voltage measuring device (1) that measures the voltage of a measurement object (2) in a non-contact manner, and includes a probe A (11a) and a probe B (11b) attached to the measurement object (2), and a probe A (11a). ) And the measurement unit (20) for obtaining and outputting the voltage of the measurement object (2) based on the first measurement voltage and the second measurement voltage measured by the probe B (11b), and the probe A (11a) and probe B (11b) are formed with CY and CZ having different capacitance values, respectively, and the measurement unit (20) measures the probe A (11a) and the probe B (11b). A voltage evaluation unit (22) for evaluating the first measurement voltage and the second measurement voltage, the first measurement voltage and the second measurement voltage evaluated by the voltage evaluation unit (22), CY and CZ capacity value and Based and a calculator for calculating the voltage to be measured (2) (23).

Description

  The present invention relates to a technique for measuring a voltage in an insulation-coated cable or the like, and in particular, is effective when applied to a non-contact voltage measuring apparatus and a non-contact voltage measuring method for measuring a voltage in a non-contact manner with respect to a conductor in the cable. Technology.

  For example, Non-Patent Document 1 describes a surface potential sensor that uses an electrostatic induction phenomenon as a technique for measuring a voltage / potential without contact with an object. Here, the electrostatic field intensity from the charged object is periodically changed by the vibrating electrode. Thus, it is described that the induced charge generated in the detection electrode is periodically changed, and the displacement current flowing from the detection electrode to the ground electrode is converted into an AC voltage signal to obtain the charged potential of the charged object.

  Non-Patent Document 2 describes a vibration capacity type surface potential meter. Here, the capacitance generated between the sensor electrode in the probe and the surface to be measured is changed by a tuning fork in the probe to induce a signal in which the surface potential is AC-modulated in the sensor electrode. Then, this is input to an integral type high voltage generator to generate a high potential and fed back to the probe. It is described that the error of the measured value due to the distance between the probe and the measured surface is reduced by raising the potential of the probe body to the same potential as the measured surface and canceling the capacitance.

  In addition, International Publication No. 2015/083618 (Patent Document 1) describes a non-contact voltage measuring device that measures a voltage in an insulation-coated cable or the like in a non-contact manner with respect to a conductor in the cable. Here, the voltage to be measured is derived based on the voltage detected at the detection point set on the electric circuit that obtains the voltage induced in the probe by the coupling capacitance between the probe and the conductor. At this time, by shielding at least a part of the electric circuit with the electric field shield, the potential at the detection point and the electric potential at the electric field shield are made equal while maintaining a state in which no current flows from the detection point to the electric field shield. As a result, the leakage current does not flow through the parasitic capacitance generated between the detection point and the electric field shield, so that the parasitic capacitance can be ignored and the voltage at the detection point can be detected with high accuracy. Have been described.

International Publication No. 2015/083618

"About static electricity measuring instruments", [online], Kasuga Electric Co., Ltd. [searched on February 29, 2016], Internet <URL: http://www.ekasuga.co.jp/product/149/000132.shtml > “Explanation of Surface Electrometer for Measuring Static Electricity”, [online], Trek Japan KK, [searched on February 29, 2016], Internet <URL: http://www.trekj.com/technology/qm/index .html>

  For example, there is a need to easily and highly accurately measure the voltage in cables and the like laid in various places including outdoors, including not only AC voltage but also DC voltage.

  In order to realize this, a technique that does not depend on conditions such as the diameter of the cable to be measured and the state of the insulation coating is necessary. That is, even when measurement is performed using a probe, there is a need for a mechanism that can control the difference between these conditions without depending on the distance between the probe and the conductor in the cable, the coupling capacitance between them, and the like. In this regard, for example, in the technique described in Non-Patent Document 1 described above, the measurement distance is determined, and the output potential varies depending on the measurement distance, and therefore cannot be applied.

  On the other hand, for example, in the technique described in Patent Document 1, a measurement that does not depend on conditions such as a cable is possible by adopting a capacitive coupling method using a coupling capacitance between a probe and a conductor.

  However, in the technique described in Patent Document 1, for example, only an alternating current (AC) voltage is a measurement target. When a direct current (DC) voltage is measured using a capacitive coupling method that utilizes the coupling capacitance between the probe and the conductor, the leakage current causes the charge to escape from the coupling capacitance, causing “burning”. It is difficult to measure the correct value in the state.

  For example, in the technique described in Non-Patent Document 2, it is necessary to match the potential of the probe itself to the level of the measurement target. Therefore, depending on the object to be measured, a high potential must be generated on the probe and measurement device side, which causes a problem that the circuit load increases.

  Accordingly, an object of the present invention is to provide a non-contact voltage measuring apparatus and a non-contact voltage measuring method capable of measuring a voltage in a non-contact manner without depending on a condition of a measurement target. Another object of the present invention is to provide a non-contact voltage measuring apparatus and a non-contact voltage measuring method capable of measuring not only an AC voltage but also a DC voltage with high accuracy. Another object of the present invention is to provide a non-contact voltage measuring device and a non-contact voltage measuring method that can reduce the voltage on the measuring device side.

  The above and other objects and novel features of the present invention will be apparent from the description of this specification and the accompanying drawings.

  Of the inventions disclosed in this application, the outline of typical ones will be briefly described as follows.

  A non-contact voltage measuring apparatus according to a typical embodiment of the present invention is a non-contact voltage measuring apparatus that measures a voltage of a measurement object made of an insulating-coated conductor in a non-contact manner from above the insulating coating, Based on the first probe and the second probe to be mounted on the measurement object, and the first measurement voltage and the second measurement voltage measured by the first probe and the second probe, And a measurement unit that obtains and outputs a voltage.

  The first probe and the second probe are formed with a first capacitor and a second capacitor having different capacitance values, respectively, and the measurement unit is configured to transmit the first probe and the second probe. A voltage evaluation unit that evaluates the first measurement voltage and the second measurement voltage measured by the probe; the first measurement voltage and the second measurement voltage that are evaluated by the voltage evaluation unit; And an arithmetic unit that calculates the voltage of the measurement target based on the first capacitance and the capacitance value of the second capacitance.

  Among the inventions disclosed in the present application, effects obtained by typical ones will be briefly described as follows.

  That is, according to the representative embodiment of the present invention, it is possible to measure the voltage in a non-contact manner without depending on the condition of the measurement target. Further, not only the AC voltage but also the DC voltage can be measured with high accuracy. Further, the voltage on the measuring device side can be reduced.

It is the figure which showed the outline | summary about the structural example of the non-contact voltage measuring device which is Embodiment 1 of this invention. It is a figure explaining the method of measuring a voltage by the capacitive coupling system in Embodiment 1 of this invention. It is the figure which showed the outline | summary about the structural example of the non-contact voltage measuring device which is Embodiment 2 of this invention. (A), (b) is the figure which showed the outline | summary about the example of the means to measure a voltage with the high impedance in Embodiment 2 of this invention. (A), (b) is the figure which showed the outline | summary about the example of the means which implement | achieves the vibration capacity in Embodiment 2 of this invention in solid. It is the figure which showed the outline | summary about the structural example of the non-contact voltage measuring device which is Embodiment 3 of this invention.

  Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. Note that components having the same function are denoted by the same reference symbols throughout the drawings for describing the embodiment, and the repetitive description thereof will be omitted. On the other hand, parts described with reference numerals in some drawings may be referred to with the same reference numerals although not illustrated again in the description of other drawings.

(Embodiment 1)
FIG. 1 is a diagram showing an outline of a configuration example of a non-contact voltage measuring apparatus according to Embodiment 1 of the present invention. The non-contact voltage measuring device 1 includes a probe pair 10 and a measuring unit 20, for example. The probe pair 10 is a member including, for example, a plurality of probes 11 (indicated by two probes A (11a) and B (11b) in the example of FIG. 1) connected to the measurement unit 20 with cables. . The user mounts the probe pair 10 on a cable to be measured and measures the voltage. Note that “mounting” means attaching the measurement surface of the probe pair 10 so as to be in contact with the measurement target, such as placing the probe pair 10 on the measurement target, pinching the measurement target, or winding the measurement target.

  As will be described later, each probe 11 is previously formed with a capacitance having a different value by an electrode and a dielectric (not shown). By attaching this to the measuring object, as will be described later, a coupling capacitance is formed between each probe 11 and the conductor to be measured, and the voltage of the measuring object is measured by the capacitive coupling method. In order to realize this, it is necessary to keep the relative positional relationship of the probe A (11a) and the probe B (11b) with respect to the measurement object constant when the probe pair 10 is mounted on the measurement object.

  In the present embodiment, each probe 11 is fixed to a member of the probe pair 10 and integrated as the probe pair 10. That is, the positions of the probe A (11a) and the probe B (11b) are fixed with respect to the probe pair 10, and the relative positions are also fixed between them. Thereby, the relative positional relationship of the probe A (11a) and the probe B (11b) with respect to the measurement object, that is, the measurement conditions can be maintained constant. And it is possible to measure the voltage by switching between the probe A (11a) and the probe B (11b) in one measurement under the same measurement conditions. Further, the measurer does not need to attach the probe A (11a) and the probe B (11b) individually to the measurement object, and can attach the probe A (11a) and the probe B (11b) as a whole with a single operation on the probe pair 10.

  As long as the above conditions are satisfied, the shape and structure of the probe pair 10 are not particularly limited. For example, it may have a shape that the measurer presses against the measuring device, or may have a shape such as a clip or a clothespin that sandwiches and fixes a measurement object such as a cable. .

  The measurement unit 20 is a portable device configured by, for example, a CPU (Central Processing Unit), an integrated circuit, and the like, and obtains and outputs a voltage to be measured based on contents measured by the probe pair 10. It is not necessary for all the components to be integrally formed, and a part of the components may be configured by another device or an information processing apparatus, and these may be linked. The measurement unit 20 includes, for example, a reference capacitor 21 (indicated by two reference capacitors A (21a) and B (21b) in the example of FIG. 1), a voltage evaluation unit 22, a calculation unit 23, a display unit 24, and the like. It has each part.

  Each reference capacity 21 is a capacity having a different value, and is a reference capacity used for calculating the voltage to be measured based on the voltage measured by the corresponding probe 11 as described later. Further, the voltage measured by the probe 11 is divided by the pair of the coupling capacitance formed between the probe 11 and the measurement target, thereby reducing the voltage on the measurement unit 20 side.

  The voltage evaluation unit 22 evaluates the voltage divided by the pair of the coupling capacitance formed between each probe 11 and the measurement target and the reference capacitance 21 with respect to the voltage to be measured. Based on the evaluation result of the voltage evaluation unit 22 and the known capacity in the non-contact voltage measuring device 1, that is, the capacity formed in each probe 11 and the value of each reference capacity 21, the calculation unit 23 is a measurement target. Is calculated and output. The display unit 24 includes a display device such as a liquid crystal display (not shown), for example, and lays out the result output from the calculation unit 23 for display and displays the result on the display device.

[Calculation of voltage]
FIG. 2 is a diagram illustrating a method for measuring a voltage by the capacitive coupling method in the present embodiment. In the drawing, an example in which an insulation-coated cable is used as a measurement object 2 is schematically shown by a cross-sectional shape of the cable. A black portion of the cable is an insulation coating, and shows a state where the probe pair 10 is mounted on the insulation coating of the cable.

It is shown that a coupling capacitance C _X whose value is unknown is formed in the portion of the insulation coating between the probe 11 and the conductor of the measuring object 2. Further, the probe A (11a) and the probe B (11b) have capacitances of C _Y and C _Z (= βC _Y ) whose values are known due to dielectrics having different thicknesses (or dielectric constants) from the electrodes, respectively. Is formed. The reference capacitance A (21a) and the reference capacitor B (21b), respectively, the value is _{C A} and _{C B} are known, connected to the capacitor in series with _{C Y} and _{C Z} formed in each probe 11 It has been shown.

In the present embodiment, by using the different capacities C _Y and C _Z (and the reference capacities 21 C _A and C _B ) formed in each probe 11, each probe 11 and the measurement target 2 are connected. with estimates the C _X formed, it calculates the voltage V _X of the measurement object 2.

When the combined capacitance of the capacitance _{C X} and _{C Y} that in a state of being connected in series _{C XY,} the combined capacitance of the capacitance _{C X} and _{C Z} and _{C XZ, C XY, C XZ} is expressed by the following equation.

Assuming that V _1A and V _2A are voltages divided by a capacitance pair of C _XY that is the coupling capacitance on the probe A (11a) side and C _A that is the reference capacitance A (21a) for V _{X to be} measured. Thus, the relationship (1) of V _1A : V _2A = C _A : C _XY is established. Similarly, probe B (11b) side of the coupling capacitor and is _{C XZ} and the reference capacitance B (21b) in which _{C B} of the capacitor pair divided voltage of _{V 1B,} When _{V 2B,} as shown, The relationship (2) of V _1B : V _2B = C _B : C _XZ is established. Two equations obtained from these two relationships are used as simultaneous equations, and by solving them, unknown V _X and C _X can be obtained.

  First, V_X= V_1A+ V_2A= V_1B+ V_2BTherefore, V, which is the partial pressure that the measuring unit 20 evaluates_2AAnd V_2B, The relationship (1) becomes (V_X-V_2A): V_2A= C_A: C_XYThe relationship (2) can be expressed as (V_X-V_2B): V_2B= C_B: C _XZIt can be expressed as. From this relationship (1), C_XYIs represented by the following equation.

From the relationship (2), V _X is expressed by the following equation.

Therefore, C _{XY in} Equation 2 is expressed by the following equation.

Here, by substituting C _XY and C _XZ in Equation 1, C _X can be obtained by the following series of equations.

Further, V _X can be obtained from the following formulas from Formula 3 and Formula 5.

That is, based on V _2A and V _2B obtained as an evaluation result in the voltage evaluation unit 22, C _A and C _B of each reference capacitor 21, which are known capacitances, and C _Y and C _Z of each probe 11. Thus, the computing unit 23 can calculate the value of V _X (and C _{X according to} Equation 5) using Equation 6.

In this embodiment, the reference capacitance A (21a) and the reference capacitor B (21b), respectively, but it is assumed to have a capacitance different values C _A and C _B, above by the same volume It is also possible to simplify the calculation.

  As described above, according to the non-contact voltage measuring apparatus 1 according to the first embodiment of the present invention, the capacitive coupling is performed using the probe pair 11 including the probes 11 in which capacitances having different conditions are formed in advance. The voltage is measured in a contactless manner. And two capacity pairs (C in the example of FIG. _XYAnd C_AAnd C_XZAnd C_B) Is divided by the voltage (V in the example of FIG._2A, V_2B) And the voltage V to be measured based on this_XIs calculated. As a result, the capacitance between the conductor of the measuring object 2 and the probe 11 (C_X) And distance, etc._XCan be measured with high accuracy. Moreover, the voltage reduction on the measurement unit 20 side can be realized by the capacity division.

  Note that, for example, when the voltage of the measurement unit 20 is not required to be reduced due to the characteristics of the measurement target 2 or the like, the capacity division using the reference capacitor 21 is not necessarily performed.

(Embodiment 2)
By using the method of the first embodiment described above, the voltage V _X to be measured can be calculated in a non-contact manner. Here, as in the prior art, when the voltage V _X to be measured is an alternating current (AC) voltage can be measured without any problem. On the other hand, when the voltage to be measured is a direct current (DC) voltage, it is necessary to evaluate the voltage divided by each capacity pair (V _2A and V _{2B in} the example of FIG. 2) with high impedance. However, in actuality, due to the influence of the leakage current, the charge escapes from the coupling capacitance, and it is difficult to measure the correct value in a state where “burning” occurs.

In order to avoid this, it is necessary to physically or electrically refresh the circuit for measuring the voltages (V _2A , V _2B ) divided by the capacity pair. And a mechanism such as control to perform measurement while performing refresh is also required. Therefore, the non-contact voltage measuring apparatus 1 according to the second embodiment of the present invention refreshes the vibrating unit by changing (vibrating) the capacitance value of the reference capacitance on the measuring unit 20 side.

  FIG. 3 is a diagram showing an outline of a configuration example of the non-contact voltage measuring apparatus according to the second embodiment of the present invention. Since the configuration of the non-contact voltage measuring apparatus 1 is basically the same as that shown in FIG. 2 of the first embodiment, only the differences will be described, and the others will be omitted. In the present embodiment, unlike the first embodiment, the two reference capacitors 21 of the measurement unit 20 are represented by two of the variable capacitors 25 (in the example of FIG. 3, variable capacitors A (25a) and B (25b)). Replaced). Moreover, it has the vibration control part 26 which vibrates the capacitance value of each variable capacity | capacitance 25. FIG.

  As a configuration of the variable capacitor 25 and the vibration control unit 26, that is, a method of evaluating the DC voltage by vibrating the capacitance value of the variable capacitor 25, a known technique can be appropriately used. Specifically, for example, “Basics of Electrical and Electronic Measurements—From Error to Uncertainty” (Hiroo Yamazaki, The Institute of Electrical Engineers of Japan, 2005/03, hereinafter referred to as “references”) pp. Means for measuring voltage with high impedance, such as described in 114, can be used.

  FIG. 4 is a diagram showing an outline of an example of means for measuring voltage with high impedance. 4A shows an example of a basic form, and FIG. 4B shows an example of a circuit when incorporated in feedback control. Here, the measurement potential portion is isolated by a capacitor to maintain a high impedance. Then, the capacitance is vibrated by the vibrator, and an oscillating voltage having an amplitude proportional to the voltage to be measured (electric field strength) is taken out via a capacitor (AC coupling). Then, by amplifying and detecting this, a DC voltage proportional to the voltage to be measured (electric field strength) is taken out.

  In addition, as described in pp. 116 of the reference document, means for realizing the vibration capacity in a solid state can be used. FIG. 5 is a diagram showing an outline of an example of means for realizing the vibration capacity in a solid state. FIG. 5A shows a basic form, and FIG. 5B shows an example of a circuit when incorporated in feedback control. Here, the vibration voltage is generated by replacing the mechanical vibration capacity in the above-described example of FIG. 4 with a solid variable capacitance diode. Considering that the diode is non-linear except near zero voltage and that the capacitance itself changes with an electric field, it is desirable to incorporate the feedback control as shown in FIG.

4 and FIG. 5 are used as appropriate to configure the variable capacitor 25 and the vibration control unit 26, so that the voltage evaluation unit 22 allows the DC voltage (V _2A ) proportional to the voltage to be measured (electric field). , V _2B ) can be evaluated with high accuracy. Subsequent calculation processing for calculating V _X (and C _X ) in the calculation unit 23 is the same as the procedure in the calculation unit 23 shown in FIG. 2 of the first embodiment.

As described above, according to the non-contact voltage measuring apparatus 1 according to the second embodiment of the present invention, the reference capacitor on the measuring unit 20 side is configured as the variable capacitor 25, and the circuit is vibrated physically or electrically. Let me refresh. As a result, it is possible to eliminate the influence of the leakage current and evaluate the voltage (V _2A , V _2B ) divided by the capacity pair with high impedance, and not only the alternating current (AC) voltage but also the direct current (DC) voltage. Can also be measured with high accuracy.

(Embodiment 3)
In the configurations of the first and second embodiments described above, the reference potential when evaluating the voltages (V _2A , V _2B ) divided by the capacity pair is the ground or the like according to the measurement object 2. On the other hand, in the non-contact voltage measuring apparatus 1 which is Embodiment 3 of this invention, the voltage difference between two arbitrary points in the measuring object 2 is measured in the actual measurement.

  FIG. 6 is a diagram showing an outline of a configuration example of the non-contact voltage measuring apparatus according to the third embodiment of the present invention. In this basic configuration, two sets (two sets) of the probe pair 10 and the measurement unit 20 shown in FIG. 2 of the first embodiment are provided in parallel, and these reference potentials are shared. Is.

  Specifically, for the set of configurations of the probe pair 10 (probe A (11a), probe B (11b)) and the reference capacitor 21, the voltage evaluation unit 22, and the calculation unit 23 shown in FIG. In addition, a similar probe pair 10 ′ (probe A (11′a), probe B (11′b)), reference capacitor 21 ′ (reference capacitor A (21′a), reference capacitor in the measurement unit 20) B (21′b)), a set of configurations of a voltage evaluation unit 22 ′ and a calculation unit 23 ′ are provided in parallel.

Capacitances (C _Y , C _Z , and C ′ _Y , C ′ _Z ) formed in the probe pair 10 and the probe pair 10 ′ have different capacitance values depending on dielectrics having different thicknesses (or dielectric constants). It is formed to have. In addition, the capacitors (C _A , C _B , and C ′ _A , C ′ _B ) formed in the reference capacitor 21 and the reference capacitor 21 ′ are also formed to have different capacitance values.

In the calculation unit 23 and the calculation unit 23 ′, the voltages (V _X and V ′ _X ) of the measurement target 2 are individually calculated by the method as described in the first embodiment. Then, the difference calculation unit 27 calculates the difference between the obtained V _X and V ′ _X. The display unit 24 displays the value calculated by the difference calculation unit 27 as a final display value.

  In the example of FIG. 6, two sets of the probe pair 10 and the measurement unit 20 shown in FIG. 2 of the above-described first embodiment are provided, but FIG. 3 of the second embodiment. Of course, the present invention can be applied to the configuration of the probe pair 10 and the measurement unit 20 shown in FIG.

  As explained above, according to the non-contact voltage measuring apparatus 1 which is Embodiment 3 of this invention, it is set as the structure which measures a voltage between two arbitrary points of the measuring object 2, and uses the difference. Thereby, it is not necessary to make the reference potential depend on the measurement object 2, and it is possible to efficiently perform non-contact voltage measurement on a wider range of measurement objects 2.

  As mentioned above, the invention made by the present inventor has been specifically described based on the embodiments. However, the present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the scope of the invention. Needless to say. For example, the above-described embodiment has been described in detail for easy understanding of the present invention, and is not necessarily limited to the one having all the configurations described. Further, a part of the configuration of one embodiment can be replaced with the configuration of another embodiment, and the configuration of another embodiment can be added to the configuration of one embodiment. . Further, it is possible to add, delete, and replace other configurations for a part of the configuration of each embodiment.

  INDUSTRIAL APPLICABILITY The present invention can be used for a non-contact voltage measuring device and a non-contact voltage measuring method for measuring a voltage in a non-contact manner with respect to a conductor in a cable.

1 ... Non-contact voltage measuring device,
10, 10 '... probe pair, 11a, 11'a ... probe A, 11b, 11'b ... probe B,
20 ... Measurement unit, 21a, 21'a ... Reference capacitance A, 21b, 21'b ... Reference capacitance B, 22, 22 '... Voltage evaluation unit, 23, 23' ... Calculation unit, 24 ... Display unit, 25a ... Variable Capacity A, 25b ... Variable capacity B, 26 ... Vibration control section, 27 ... Difference calculation section

Claims (8)

A non-contact voltage measuring device for measuring a voltage to be measured comprising a conductor with insulation coating in a non-contact manner from above the insulation coating,
A first probe and a second probe attached to the measurement object;
A measurement unit that obtains and outputs the voltage of the measurement object based on the first measurement voltage and the second measurement voltage measured by the first probe and the second probe;
Have
In the first probe and the second probe, a first capacitor and a second capacitor having different capacitance values are formed, respectively.
The measuring unit is
A voltage evaluation unit that evaluates the first measurement voltage and the second measurement voltage measured in the first probe and the second probe;
Based on the first measurement voltage and the second measurement voltage evaluated by the voltage evaluation unit, and the capacitance values of the first capacitor and the second capacitor, the voltage of the measurement target is calculated. An arithmetic unit to perform,
A non-contact voltage measuring device. In the non-contact voltage measuring device according to claim 1,
The measuring unit is
Furthermore, corresponding to the first capacitor and the second capacitor, each of the first reference capacitor and the second reference capacitor are connected in series and have different capacitance values.
The voltage evaluation unit
The measurement is performed by a first capacitance pair consisting of a capacitance formed between the first probe and the measurement object, a first coupling capacitance with the first capacitance, and the first reference capacitance. Capacitance partial pressure obtained by dividing the voltage of the object and corresponding to the first reference capacitance is set as the first measurement voltage,
The measurement is performed by a second capacitance pair including a capacitance formed between the second probe and the measurement object, a second coupling capacitance with the second capacitance, and the second reference capacitance. Capacitance partial pressure corresponding to the second reference capacity obtained by dividing the target voltage is used as the second measurement voltage.
Evaluating the first measurement voltage and the second measurement voltage;
The computing unit is
The first measurement voltage and the second measurement voltage evaluated by the voltage evaluation unit;
Capacitance values of the first capacitor and the second capacitor;
Capacitance values of the first reference capacitor and the second reference capacitor;
Calculating the voltage of the measurement object based on
Non-contact voltage measuring device. In the non-contact voltage measuring device according to claim 2,
The first reference capacity and the second reference capacity of the measurement unit are each variable.
The measurement unit further includes a vibration control unit that vibrates the capacitance values of the first reference capacitor and the second reference capacitor.
Non-contact voltage measuring device. In the non-contact voltage measuring device according to claim 1,
Two sets of configurations including the first probe and the second probe, the voltage evaluation unit, and the calculation unit are provided,
Furthermore, it has a difference calculation unit that calculates the difference between the voltages calculated by the two calculation units and outputs the difference as the voltage to be measured.
Non-contact voltage measuring device. In the non-contact voltage measuring device according to claim 1,
The first probe and the second probe are both non-contact voltage measuring devices fixed to one member. A non-contact voltage measuring method for measuring a voltage to be measured comprising a conductor coated with insulation coating in a non-contact manner from above the insulation coating,
A first probe and a second probe each having a first capacitance and a second capacitance having different capacitance values are attached to the measurement object, and the measured first measurement voltage and second measurement are measured. A first step of evaluating the voltage;
Based on the first measurement voltage and the second measurement voltage evaluated in the first step, and the capacitance values of the first capacitance and the second capacitance, the voltage of the measurement target is calculated. A second step of calculating;
A non-contact voltage measuring method. In the non-contact voltage measuring method according to claim 6,
In the first step,
A capacitance formed between the first probe and the measurement object, a first coupling capacitance with the first capacitance, and a first reference connected in series with the first capacitance A capacitance divided corresponding to the first reference capacitance obtained by dividing the voltage to be measured by a first capacitance pair consisting of capacitance is defined as the first measurement voltage,
A capacitance formed between the second probe and the measurement object, a second coupling capacitance with the second capacitance, and a second reference connected in series with the second capacitance Capacitance partial pressure corresponding to the second reference capacitance obtained by dividing the voltage to be measured by the second capacitance pair consisting of capacitance is used as the second measurement voltage.
Evaluating the first measurement voltage and the second measurement voltage;
In the second step,
The first measurement voltage and the second measurement voltage evaluated in the first step;
Capacitance values of the first capacitor and the second capacitor;
Capacitance values of the first reference capacitor and the second reference capacitor;
Calculating the voltage of the measurement object based on
Non-contact voltage measurement method. In the non-contact voltage measuring method according to claim 7,
Furthermore, it has a third step of oscillating the capacitance values of the first reference capacitor and the second reference capacitor that are each variably configured.
Non-contact voltage measurement method.