JPWO2011034086A1 - Electron gun, vacuum processing equipment - Google Patents

Abstract

The electron gun of the present invention is provided with a repeller electrode (24) to which a positive voltage is applied to the anode electrode (23) on the emission port (13) side of the anode electrode (23), and the repeller electrode (24) is The positive ions generated by the collision between the electron beam and the residual gas and proceeding in the direction of the cathode electrode (21) along the central axis (28) are pushed back to the vacuum chamber (18). Since the repeller electrode (24) has a cylindrical shape, the trajectory of the electron beam is not curved. Since the repeller electrode (24) has a large number of pores, the gas in the repeller electrode (24) passes through the pores and is evacuated. This prevents positive ions from entering the cathode electrode (21) and provides a long-life electron gun.

Description

  The present invention relates to an electron gun.

An electron gun is a device that accelerates emitted electrons and converges them into a beam, and irradiates an object with an electron beam placed in a vacuum chamber. For example, the object is irradiated with an electron beam and heated to form a vacuum atmosphere. Among them, it is used for a film forming apparatus for forming a film on a substrate.
When such an electron beam travels inside the electron gun or inside the vacuum chamber, it collides with the residual gas and generates positively charged ions.
The positive ions are attracted to the space charge of the electron beam, gather on the central axis of the electron beam, and further travel back along the central axis toward the cathode electrode having a lower potential.
The positive ions generated in the vacuum chamber or in the vicinity of the electron emission port are finally attracted to the cathode electrode and accelerated to collide with the cathode electrode.
The cathode electrode is damaged by the ion bombardment due to the collision, and the electron emission surface is retreated, deformed, or severely perforated at the center, which is a major cause of shortening the life of the cathode electrode. Further, the cathode electrode is sputtered by the collision of ions, and the scattered cathode electrode material mainly adheres to the anode electrode, and this causes peeling due to a temperature change of the anode electrode, etc., which causes abnormal discharge.
Japanese Patent Publication No. 07-007648

  The present invention was created to solve the above-mentioned disadvantages of the prior art. The purpose of the present invention is to collide electrons and residual gas inside the vacuum chamber or electron gun, and the generated positive ions collide with the cathode electrode. It is to provide a long-life electron gun.

The present invention has a cathode electrode that is heated to emit thermoelectrons, a Wehnelt electrode that focuses an electron beam emitted from the cathode electrode, an anode hole, and a positive voltage is applied to the cathode electrode. An anode electrode through which the thermoelectrons pass through the anode hole as an electron beam, a positive voltage is applied to the anode electrode, and the electron is provided between the anode electrode and an emission port from which the electron beam is emitted. An electron gun having a repeller electrode that allows a beam to pass along a central axis, and an emission port through which the electron beam that has passed through the repeller electrode is emitted.
The present invention includes a housing in which the cathode electrode, the Wehnelt electrode, the anode electrode, and the repeller electrode are arranged, and the housing includes a space between the anode electrode and the cathode electrode in a space in the housing. The electron gun is provided with a first vacuum exhaust port that evacuates a portion in between and a second vacuum exhaust port that evacuates a portion between the anode electrode and the discharge port.
The present invention provides an electron gun in which a pore is formed in the repeller electrode, and a gas located in a space surrounded by the repeller electrode passes through the pore and is evacuated from the second vacuum exhaust port. It is.
In the present invention, the repeller electrode is an electron gun formed of a net-like conductive material into a cylindrical shape.
In the present invention, the repeller electrode is an electron gun whose inner peripheral surface is positioned on the same cylindrical side surface.
The present invention includes a vacuum chamber and any one of the above-described electron guns, wherein the inside of the vacuum chamber and the inside of the electron gun are connected, and the electron beam emitted from the emission port into the vacuum chamber is This is a vacuum processing apparatus in which an irradiation object to be irradiated is arranged.

The present invention is configured as described above, and the repeller electrode has an axially symmetric cylindrical shape or ring shape through which the electron beam passes on the central axis, and is disposed downstream of the anode electrode from the anode electrode. Has been.
A positive voltage is applied to the repeller electrode with respect to the anode electrode, and positive ions flying from the discharge port side toward the repeller electrode are pushed back to the discharge port side.

By repelling positive ions going up on the central axis of the electron beam to the vacuum chamber side by the repeller electrode, damage to the cathode electrode can be prevented and the life can be extended. At the same time, the occurrence of abnormal discharge due to the cathode electrode material sputtered by ion bombardment adhering to the anode electrode is reduced.
Further, since the repeller electrode is formed with pores so that the space surrounded by the repeller electrode can be evacuated through the pores, the evacuation of the intermediate chamber is not hindered even if the repeller electrode is provided.

The figure for demonstrating the electron gun of this invention Diagram for explaining the behavior of positive ions inside the electron gun when the repeller electrode is removed The figure for demonstrating the behavior of the positive ion inside the electron gun of an example of this invention The figure for demonstrating the external shape of the electron beam of the electron gun of an example of this invention (a): A diagram for explaining a vacuum processing apparatus according to an example of the present invention (b): A diagram for explaining a repeller electrode formed of a conductive net.

2: Vacuum processing apparatus 3: Substrate 4: Vapor deposition material 5: Substrate holder 6: Vacuum pump 10: Electron gun 11: Housing 12: Bottom surface 13: Emission port 16, 17: Vacuum pump 18: Vacuum chamber 21: Cathode Electrode 22: Wehnelt electrode 23: Anode electrode 24: Repeller electrode 25: Wehnelt hole 26: Anode hole 28: Center axis 31: First focusing coil 32: Second focusing coil 33: Swing coil 34: First vacuum exhaust port 35: Second vacuum exhaust port

FIG. 5A shows an example of the vacuum processing apparatus 2 according to the present invention, in which the vapor deposition material 4 is disposed inside the vacuum chamber 18 and the substrate holder 5 is disposed above the vapor deposition material 4.
A vacuum tank vacuum pump 6 is connected to the vacuum chamber 18, and the vacuum chamber 18 is evacuated by the vacuum chamber vacuum pump 6, and the substrate 3 is carried into the vacuum chamber 18 while maintaining a vacuum atmosphere. And held on the substrate holder 5.
The electron gun 10 of the present invention is attached to the wall surface or ceiling of the vacuum chamber 18, and the inside of the electron gun 10 is directly evacuated, and the electron gun 10 is placed in a higher vacuum atmosphere than the inside of the vacuum chamber 18. When the electron beam is emitted from the gun 10 into the vacuum chamber 18 and irradiated onto the vapor deposition material 4, the vapor deposition material 4 evaporates in a vacuum atmosphere, and the vapor reaches the substrate 3, and a thin film of the vapor deposition material 4 is formed on the surface of the substrate 3. Is formed.

FIG. 1 shows a schematic diagram of the inside of an electron gun 10 according to the present invention.
The electron gun 10 has a cylindrical casing 11, and a discharge port 13 is formed at one end of the casing 11. A cathode electrode 21 is disposed on the bottom surface 12 opposite to the discharge port 13. Further, the Wehnelt electrode 22 is disposed at a position close to and separated from the cathode electrode 21.
The Wehnelt electrode 22 has a ring shape having a Wehnelt hole 25 that is a through hole in the center, has the same central axis 28 as the cathode electrode 21, and is arranged so that the inner surface of the Wehnelt hole 25 and the cathode side face are adjacent to each other.
An anode electrode 23 and a repeller electrode 24 are arranged in this order from the Wehnelt electrode 22 side to the emission port 13 side of the cathode electrode 21 and the Wehnelt electrode 22.
The anode electrode 23 has a ring shape having an anode hole 26 as a through hole in the center, and the repeller electrode 24 has a cylindrical shape with one end facing the cathode electrode 21 and the other end facing the discharge port 13. The central axis 28 of the electrode 24 passes through the center of the cathode electrode 21, and coincides with the central axis of the Wehnelt electrode 22 and the central axis of the anode electrode 23. Here, the repeller electrode 24 has a cylindrical shape so that the electric field inside the repeller electrode 24 is axisymmetric.

The housing 11 is attached to the vacuum chamber 18 so that the inside of the housing 11 is connected to the inside of the vacuum chamber 18 through the discharge port 13, and the housing 11 is connected to the ground potential together with the vacuum chamber 18. .
A power supply device 30 is disposed outside the housing 11 and the vacuum chamber 18, and the electrodes 21 to 24 are connected to the power supply device 30.
The housing 11 is provided with first and second vacuum exhaust ports 34 and 35, and the first and second vacuum exhaust ports 34 and 35 are connected to the vacuum pumps 16 and 17. Here, the first and second vacuum exhaust ports 34 and 35 are connected to separate vacuum pumps 16 and 17, respectively.

When the vacuum processing apparatus 2 is used, the vacuum tank vacuum pump 6 and the vacuum pumps 16 and 17 connected to the first and second vacuum exhaust ports 34 and 35 are operated to And the inside of the housing 11 are evacuated.
A heating device 38 is disposed on the back surface of the cathode electrode 21. While the heating device 38 generates heat and the cathode electrode 21 is heated, a negative voltage with respect to the ground potential is applied to the cathode electrode 21 by the power supply device 30. The same voltage as that of the cathode electrode 21 is applied to the Wehnelt electrode 22. A positive voltage with respect to the cathode electrode 21 is applied to the anode electrode 23. Here, the anode electrode 23 is connected to the ground potential.

A negative high voltage (for example, −40 kV) is applied to the cathode electrode 21, and the thermoelectrons emitted from the cathode electrode 21 are focused into a beam by the Wehnelt electrode 22 and the anode electrode 23, and the anode electrode 23. , Passes through the Wehnelt hole 25 and the anode hole 26, travels along the central axis 28 of the repeller electrode 24, and passes through the repeller electrode 24.
A positive voltage with respect to the anode electrode 23 is applied to the repeller electrode 24 by the power supply device 30. However, since the center axis of the beam coincides with the center axis 28 of the repeller electrode 24, the axial symmetry of the beam is not lost. Absent.
Comparing the potentials of the electrodes 21 to 24, the Wehnelt electrode = the cathode electrode <the anode electrode <the repeller electrode. In this case, the anode electrode 23 is connected to the ground potential.

Reference numerals 31, 32, and 33 denote a first focusing coil, a second focusing coil, and an oscillating coil, respectively. The first focusing coil 31 is located outside a part of the anode electrode 23 and is a part of the anode electrode 23. Is placed around.
The second focusing coil 32 and the oscillating coil 33 are arranged on the downstream side of the electron beam with respect to the first focusing coil 31 and in this order from the first focusing coil 31 side so as to surround the trajectory of the electron beam. Yes. The repeller electrode 24 is located between the first focusing coil 31 and the second focusing coil 32.
The electron beam is focused by the first and second focusing coils 31 and 32, emitted from the emission port 13, and irradiated on the object in the vacuum chamber 18.

The symbol L _{1 in} FIG. 4 is a curve showing the outer shape of the orbit of the electron beam when a positive voltage of 300 V is applied to the repeller electrode 24 with respect to the ground potential, and has substantially the same shape as when the repeller electrode 24 is not provided. It has been confirmed that there is. Therefore, it can be seen that the repeller electrode 24 to which a positive voltage is applied does not adversely affect the electron beam focusing action of the first and second focusing coils 31 and 32.
FIG. 4 and FIGS. 2 and 3 to be described later show only one side where the exhaust port of the central axis 28 of the electron gun 10 and the repeller electrode 24 is located.
When the oscillating coil 33 is operated, the traveling direction of the electron beam emitted from the emission port 13 is oscillated, and the object can be irradiated in a range larger than the cross-sectional area of the electron beam.

The first vacuum exhaust port 34 described above is connected to an electron gun chamber that is a portion between the anode electrode 23 and the cathode electrode 21 in the space inside the housing 11, and evacuates the gas located in the electron gun chamber. Is configured to do.
The second vacuum exhaust port 35 is a portion between the anode electrode 23 and the discharge port 13 in the space inside the housing 11 and is a portion closer to the cathode electrode 21 than the second focusing coil 32. It is connected to the chamber and is configured to evacuate the gas located in the intermediate chamber.

Here, as described above, the electron beam travels on the central axis 28 of the repeller electrode 24 along the direction in which the central axis 28 extends, and the second vacuum exhaust port 35 is disposed outside the repeller electrode 24. Has been.
As shown in FIG. 5B, the repeller electrode 24 is composed of a metal mesh 41, and the gas located in the intermediate chamber passes through the mesh 42 of the mesh 41 to form the second vacuum exhaust port. 35 is evacuated.
In the embodiment described above, a metal net is used, but a plurality of metal thin rods are arranged at equal intervals in parallel with the traveling direction of the electron beam so as to be positioned on the side surface of the same cylinder, A cylindrical repeller electrode 24 may be configured. Alternatively, the conductive plate having a large number of pores may be formed into a disc shape to form the repeller electrode 24. Further, a part of the metal hollow cylinder may be slit or notched, for example, processed into a crown shape, or a repeller electrode 24 processed into a spiral shape.
In these repeller electrodes 24, gas can pass through the pores, slits, or notches, and the passed gas is evacuated from the second vacuum exhaust port 35.
In any case of the repeller electrode 4, the slit, notch, pore, or other gas passing means intersects the repeller electrode 24 perpendicularly to the central axis of the electron beam so as not to affect the trajectory of the electron beam. It is desirable to provide the gas passing means so as to be rotationally symmetric about the central axis of the electron beam when it is cut along a plane.

The function of the repeller electrode 24 will be described. When a positive voltage with respect to the anode electrode 23 is applied to the repeller electrode 24, the potential at the position of the central axis 28 of the repeller electrode 24 is higher than that of a conventional electron gun without the repeller electrode 24. Increased to the positive voltage side.
Inside the housing 11 of the electron gun 10, the pressure in the electron gun chamber is lower than the pressure in the intermediate chamber due to the vacuum exhaust from the first and second vacuum exhaust ports 34, 35. The pressure in the portion closer to the vacuum chamber 18 than the intermediate chamber is lower.
The interior of the vacuum chamber 18 and the portion closer to the vacuum chamber 18 than the intermediate chamber inside the housing 11 are high-pressure spaces, and an electron beam collides with a large amount of residual gas, ionizing the residual gas and generating positive ions. .
The generated positive ions gather on the central axis of the electron beam having a low potential, and travel toward the cathode electrode 21 having a higher negative potential.

In the electron gun 10 of the present invention, a positive voltage is applied to the repeller electrode 24 with respect to the anode electrode 23, and the potential of the central axis 28 of the repeller electrode 24 is higher than when there is no repeller electrode 24 to which a positive voltage is applied. Has also been raised.
In particular, in the present invention, even when the electron beam emitted from the cathode electrode 21 travels on the central axis 28 of the repeller electrode 24, the potential on the central axis 28 of the repeller electrode 24 is maximum in the repeller electrode 24. Is applied to the repeller electrode 24.

  Accordingly, an electric field is formed between the discharge port 13 and the repeller electrode 24 so that the potential on the repeller electrode 24 side is higher than the potential on the discharge port 13 side, and is closer to the discharge port 13 than in the vacuum chamber 18 or the repeller electrode 24. The positive ions generated in the space are pushed back by the electric field and do not enter the cathode electrode 21 side beyond the electric field formed by the repeller electrode 24.

FIG. 3 is a result of simulating the behavior of positive ions located inside the electron gun 10 when the electron beam is irradiated from the cathode electrode 21 of the electron gun having the structure of FIG. A range in which positive ions incident on the electrode 21 are located is indicated by being surrounded by an alternate long and short dash line with a symbol A.
In addition, the range in which positive ions that did not reach the cathode electrode 21 even when the electron beam was irradiated was surrounded by an alternate long and short dash line with a symbol B.
The electron gun chamber and the intermediate chamber are directly evacuated from the first and second vacuum exhaust ports 34 and 35, respectively. The electron gun chamber is 1 × 10 ⁻⁴ Pa or less, and the intermediate chamber is 1 × 10 ⁻³ Pa. In actuality, almost no positive ions are generated, and the amount of positive ions incident on the cathode electrode 21 is very small.

The simulation conditions are as follows: the potential of the repeller electrode 24 is +300 V, the potential of the Wehnelt electrode 22 is −40 kV, the potential of the cathode electrode 21 is −40 kV, the anode electrode 23 is 0 V (ground potential), and the electron beam current is 6 A. As the initial ion velocity, a random heat velocity of 1000 K was given.
Under these conditions, positive ions located on the emission port 13 side of the repeller electrode 24 do not move to the cathode electrode 21 side, and are generated in a large amount in the vacuum chamber 18 or in a space close to the vacuum chamber 18. Was not incident on the cathode electrode 21.

FIG. 2 is a simulation result of the electron gun in which the repeller electrode 24 is removed from the electron gun 10 having the structure shown in FIG. 1. The structure is the same as that of the electron gun 10 shown in FIG. 1 except that there is no repeller electrode 24 to which a positive voltage is applied. It is a simulation result of the electron gun.
Positive ions (range A) at a position closer to the discharge port 13 than the portion where the repeller electrode 24 is located are incident on the cathode electrode 21, and the residual gas pressure at this position is high. It was found that the cathode electrode 21 was damaged early because positive ions were incident.
In addition, although the said Example demonstrated the case where the vacuum processing apparatus of this invention was a vapor deposition apparatus, it is not limited to a vapor deposition apparatus, Other vacuum processing apparatuses are also included.
In the above embodiment, the repeller electrode 24 has a cylindrical shape on both the inner periphery and the outer periphery. However, if the inner peripheral surface is cylindrical, the outer peripheral surface may not be cylindrical.
The cross-sectional shape of the repeller electrode is preferably a circular shape that does not affect the trajectory of the electron beam as in the above-described embodiment. ) Or a combination of a polygon and an arc.
In addition, a spiral repeller electrode whose inner peripheral surface can be in close contact with a cylindrical side surface is included, and a plurality of circular rings electrically connected to each other are parallel to each other and the centers are located on the same central axis. Thus, a repeller electrode may be configured.
Further, a repeller electrode may be configured by providing rod-shaped electrodes electrically connected to each other on the circumference of one circle in parallel to each other and at right angles to the cylinder.
In short, the repeller electrode 24 of the above-described embodiment is an example of a repeller electrode whose inner peripheral surface is positioned on the same cylindrical side surface.
Further, not limited to the cylinder, the inner peripheral surface may be a frustoconical repeller electrode in which one opening is wider than the other opening.

Claims (6)

A cathode electrode that is heated to emit thermoelectrons;
A Wehnelt electrode for focusing the electron beam emitted from the cathode electrode;
An anode electrode having an anode hole, a positive voltage is applied to the cathode electrode, and the thermoelectrons pass through the anode hole as an electron beam;
A positive voltage is applied to the anode electrode;
A repeller electrode provided between the anode electrode and an emission port from which the electron beam is emitted, and passes the electron beam along a central axis;
An electron gun having an emission port through which the electron beam that has passed through the repeller electrode is emitted. A housing in which the cathode electrode, the Wehnelt electrode, the anode electrode, and the repeller electrode are disposed;
The housing includes a first vacuum exhaust port that evacuates a portion between the anode electrode and the cathode electrode in a space in the housing, and a vacuum portion between the anode electrode and the discharge port. The electron gun according to claim 1, further comprising a second vacuum exhaust port for exhausting air. A pore is formed in the repeller electrode,
3. The electron gun according to claim 1, wherein a gas located in a space surrounded by the repeller electrode passes through the pores and is evacuated from the second evacuation port.   4. The electron gun according to claim 3, wherein the repeller electrode is formed into a cylindrical shape by a net-like conductive material.   4. The electron gun according to claim 3, wherein the repeller electrode has an inner peripheral surface located on the same cylindrical side surface. A vacuum chamber;
An electron gun according to any one of claims 1 to 5,
The inside of the vacuum chamber and the inside of the electron gun are connected,
A vacuum processing apparatus in which an irradiation object to be irradiated with the electron beam emitted from the emission port is disposed in the vacuum chamber.

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