JPWO2009153996A1 - Test apparatus and test method - Google Patents

Abstract

A test apparatus for testing a device under test, comprising: a test module for communicating a packet with a device under test to test the device under test; and a test module connected between the device under test and the test module; Compared to the additional module that performs at least one of higher-speed communication and lower-latency communication with the device under test, and the performance that is mounted on the test head and connects between the test module and the device under test And the additional module provides a test apparatus mounted on the performance board.

Description

The present invention relates to a test apparatus and a test method. This application is related to the following US applications and claims priority from the following US applications: For designated countries where incorporation by reference of documents is permitted, the contents described in the following application are incorporated into this application by reference and made a part of this application.
Application number 61 / 074,151 Application date June 20, 2008 Application number 12 / 329,635 Application date December 8, 2008

  Test apparatuses for testing semiconductor devices and the like are known. In the test apparatus, a test module mounted in the test head executes a test program, and sends and receives signals to and from the device under test mounted on the performance board, thereby testing the device under test.

  By the way, in recent years, an increasing number of devices have an indeterminate behavior in which the signal output cycle is not constant or the output value changes depending on some state. However, since the test module outputs a signal having a waveform determined in advance by the test program, the response is slow when communicating with a device having such an undefined behavior.

  In recent years, the number of devices under test using a memory for performing low-latency communication realizing a handshake on the order of nanoseconds as an external memory is increasing. When testing such a device under test, the test apparatus must include a test module capable of generating a test signal corresponding to the exchange between the device under test and the external memory. However, in the test apparatus, it is difficult to realize handshaking within the time required by the device under test by the test module because the wiring between the device under test and the test module is long.

  In order to solve the above-described problem, in a first aspect of the present invention, a test apparatus for testing a device under test, which tests a device under test by communicating a packet with the device under test. Addition that is connected between a test module and the device under test and the test module to perform at least one of higher-speed communication and lower-latency communication with the device under test compared to the test module And a test apparatus including the module.

  It should be noted that the above summary of the invention does not enumerate all the necessary features of the present invention. In addition, a sub-combination of these feature groups can also be an invention.

1 shows a configuration of a test apparatus 100 according to the present embodiment, together with a device under test (DUT) 500. An example of a configuration of a device under test (DUT) 500 and an example of a connection state of the test module 200 and the additional module 300 according to the present embodiment are shown. 2 shows a functional configuration of an additional module 300 according to the present embodiment. An example of a more specific configuration of the additional module 300 provided between the memory interface 600 and the test module 200 is shown. An example of a more specific configuration of the additional module 300 provided between the PCI-Express interface 710 and the test module 200 is shown. The 1st example of a structure of the test module 200 which controls the additional module 300 which concerns on this embodiment is shown. The 2nd example of a structure of the test module 200 which controls the additional module 300 which concerns on this embodiment is shown. The 3rd example of a structure of the test module 200 which controls the additional module 300 which concerns on this embodiment is shown. 1 shows an example of the configuration of a test apparatus 100 according to the present embodiment. An example of the configuration of the arithmetic processing unit 410 according to the present embodiment, and the configuration of one execution processing unit 420 and the communication processing unit 430 that are representative of the plurality of execution processing units 420 and the plurality of communication processing units 430 are shown. The structure of the packet communication part 434 which concerns on this embodiment is shown. 2 shows an exemplary configuration of a lower sequencer 28 and a packet data string storage unit 26 according to the present embodiment. An example of the structure of the data processing part 32 in the transmission side block 12 which concerns on this embodiment is shown. An example of the structure of the transmission part 36 in the transmission side block 12 which concerns on this embodiment is shown. An example of the structure of the receiving part 82 in the receiving side block 14 which concerns on this embodiment is shown. An example of the packet list | wrist which concerns on this embodiment is shown. An example of the packet function concerning this embodiment is shown. The processing flow of the test apparatus 100 which concerns on this embodiment is shown.

  Hereinafter, the present invention will be described through embodiments of the invention, but the following embodiments do not limit the invention according to the claims. In addition, not all the combinations of features described in the embodiments are essential for the solving means of the invention.

  FIG. 1 shows a configuration of a test apparatus 100 according to the present embodiment, together with a device under test 500 (DUT). The test apparatus 100 according to the present embodiment tests the device under test 500. The test apparatus 100 includes a test head 110, a performance board 120, a control device 130, and an additional module 300.

  The test head 110 is equipped with one or a plurality of test modules 200. Each of the one or more test modules 200 executes a test program and communicates signals with the device under test 500 to test the device under test 500. One of the test modules 200 is connected to the device under test 500 via the additional module 300, and tests the device under test 500 by communicating a packet with the device under test 500.

  The performance board 120 is placed on the test head 110. The performance board 120 includes the device under test 500 and the additional module 300. The performance board 120 connects between the test module 200 and the device under test 500. Further, the performance board 120 connects between any of the test modules 200 and the additional module 300, and connects between the additional module 300 and the device under test 500.

  The control device 130 controls the test module 200 and the additional module 300. For example, the control device 130 supplies a test program to each of the test modules 200. Moreover, the control apparatus 130 performs various settings etc. with respect to the test module 200 and the additional module 300 as an example.

  The additional module 300 is mounted on the performance board 120. The additional module 300 is provided between any of the test modules 200 and the device under test 500.

  The additional module 300 performs at least one of higher-speed communication and lower-latency communication with the device under test 500 as compared with the test module 200. In this case, for example, the additional module 300 communicates with the device under test 500 a non-deterministic signal whose data value and timing to be exchanged cannot be specified in advance by the test program.

  As an example, the non-deterministic signal may be a signal whose data transmission or reception timing is shifted depending on the state of the device and communication. Further, as an example, the non-deterministic signal may be a signal in which the same packet is repeatedly transmitted according to the state of the device and communication.

  For example, the additional module 300 communicates with the test module 200 a deterministic signal whose data value and timing to be exchanged can be specified in advance by the test program. As an example, the deterministic signal may be a signal whose data transmission or reception timing is predetermined. Further, as an example, the deterministic signal may be a signal whose data content does not change regardless of the state of the device and communication.

  Such an additional module 300 can convert a non-deterministic signal communicated with the device under test 500 into a deterministic signal and transmit it to the test module 200. Further, the additional module 300 can convert a deterministic signal communicated with the test module 200 into a non-deterministic signal and transmit it to the device under test 500. Note that the test apparatus 100 may have a configuration in which the additional module 300 is provided between the test module 200 and a functional block that performs lower-speed communication and higher-latency communication as compared with the test module 200.

  FIG. 2 shows an example of the configuration of the device under test (DUT) 500 and an example of the connection state of the test module 200 and the additional module 300 according to the present embodiment. The device under test 500 includes functional blocks such as a CPU core block 510, an image core block 520, a memory interface 600, and a communication interface 700 as an example. For example, the test apparatus 100 tests the device under test 500 by exchanging packets and the like with the respective functional blocks in the device under test 500.

  The memory interface 600 is an interface for a device under test 500 such as a DDR-SDRAM (Double Data Rate-SDRAM) to access an external memory. Here, as an example, the memory interface 600 communicates with an external memory with a latency lower than that which can be realized with the test module 200. Therefore, the test apparatus 100 may be configured to include the additional module 300 between the memory interface 600 and the test module 200 as an example.

  For example, when the additional module 300 provided between the memory interface 600 and the test module 200 receives a data transmission request from the memory interface 600, the additional module 300 transmits the data to the memory interface 600 instead of the test module 200. As a result, the additional module 300 can make a response to at least a part of commands given to the external memory by the device under test 500 instead of the test module 200.

  The communication interface 700 is an interface for the device under test 500 to communicate with an external device. For example, the communication interface 700 is a PCI-Express interface 710 for communicating with an external device by a PCI-Express method, a USB interface 720 for communicating with an external device by a USB method, and a communication with an external device by an SD method. An SD interface 730 and the like are included.

  Of these functional blocks for communication, the PCI-Express interface 710 performs communication with an external device at a higher speed than a communication speed that can be realized with the test module 200, for example. Therefore, the test apparatus 100 may be configured to include the additional module 300 between the PCI-Express interface 710 and the test module 200 as an example.

  For example, when the additional module 300 provided between the PCI-Express interface 710 and the test module 200 receives a packet from the PCI-Express interface 710, it sends a response packet to the PCI-Express interface 710 instead of the test module 200. To do. As a result, the additional module 300 can make a response to at least a part of the packets given to the external device by the device under test 500 instead of the test module 200.

  Further, the test apparatus 100 is configured such that any one of the plurality of test modules 200 (the first test module 200) is directly connected to the device under test 500, and packets are transmitted to the device under test 500. connect. The test apparatus 100 may be configured such that any test module 200 (second test module 200) different from the first test module 200 is connected to the additional module 300 to control the additional module 300. .

  In the test apparatus 100, the test module 200 may have a plurality of terminals. In this case, in the test module 200, at least one terminal (first terminal) of the plurality of terminals is directly connected to the device under test 500 and communicates packets with the device under test 500. The test module 200 may have a configuration in which at least one terminal (second terminal) different from the first terminal is connected to the additional module 300 to control the additional module 300.

  FIG. 3 shows a functional configuration of the additional module 300 according to the present embodiment. The additional module 300 includes a DUT communication function block 302 for exchanging with the device under test 500 and a main body communication function block 304 for exchanging with the test module 200.

  The DUT communication function block 302 has a function of receiving a request signal from the device under test 500 as an example. The function receives, for example, a command (memory read command, memory write command, etc.) output from the memory interface 600 of the device under test 500.

  The DUT communication function block 302 has a function of interpreting a request signal from the device under test 500 as an example. This function determines the content of the command received by the function for receiving a request signal from the device under test 500. For example, the function determines a memory write command, a memory read command, and the like.

  The DUT communication function block 302 has a function of sending data stored in advance in a memory or the like in the additional module 300 to the device under test 500 in response to a request signal from the device under test 500 as an example. . For example, when a memory read command is given from the device under test 500, the function stores data stored in the additional module 300 in advance corresponding to the address specified by the command to the device under test 500. Send back.

  The DUT communication function block 302 has a function of storing data sent from the device under test 500 as an example. For example, when a memory write command is given from the device under test 500, the function stores the data given from the device under test 500 in the additional module 300.

  Further, as an example, the DUT communication function block 302 has a function of returning data sent from the device under test 500 as it is in response to a request signal from the device under test 500 (loop back function). For example, when the memory read command is given to the same address after receiving the memory write command from the device under test 500 and storing the data, the function receives the data given from the device under test 500 as it is. Return to test device 500.

  In addition, the DUT communication function block 302 has a function of processing data sent from the device under test 500 and sending it back in response to a request signal from the device under test 500, for example. For example, when the memory read command is given to the same address after receiving the memory write command from the device under test 500 and storing the data, the function performs bit inversion on the data given from the device under test 500. Data that has undergone a predetermined logical operation or the like is sent back to the device under test 500.

  For example, the DUT communication function block 302 has a function of receiving a clock generated by the device under test 500 and using the clock as an operation clock of the additional module 300. For example, the DUT communication function block 302 has a function of receiving the timing reference signal generated by the device under test 500 and allowing the additional module 300 to operate based on the reference signal. For example, the function acquires a strobe signal exchanged between the device under test 500 and the DRAM in synchronization with the data, and generates a timing at which data is to be taken in from the device under test 500.

  The DUT communication function block 302 has a function of generating a control signal for controlling the device under test 500 as an example. The function provides, for example, an address and a command to the device under test 500.

  For example, the main body communication function block 304 has a function of programming the function of the additional module 300 from the test module 200 side. For example, the function receives a program code from the test module 200 and controls the operation of the additional module 300 according to the program code.

  The main body communication function block 304 has a function of setting data to be stored in the additional module 300 from the test module 200 side as an example. For example, when the memory read command is given from the device under test 500, the function receives data from the test module 200 and stores the data to be sent back to the device under test 500 by the additional module 300 in advance.

  The main body communication function block 304 has a function of reading data stored in the additional module 300 from the test module 200 side as an example. For example, the function transmits data stored in the additional module 300 to the test module 200 when a memory write command is given from the device under test 500.

  Further, as an example, the main body communication function block 304 has a function (log function) that stores in time series what requests and data are received from the device under test 500. The function stores, for example, commands and data sent from the device under test 500 in time series.

  In addition, the main body communication function block 304 has a function of reading a stored log from the test module 200 side as an example. Also, the function transmits, for example, commands and data stored in time series in response to a request from the test module 200.

  Note that the additional module 300 may not have all of the above functions. Further, the additional module 300 may be configured by combining some of the above functions.

  FIG. 4 shows an example of a more specific configuration of the additional module 300 provided between the memory interface 600 and the test module 200. The additional module 300 connected to the memory interface 600 includes, for example, a test memory 310, a DC test unit 320, a switching unit 330, an acquisition unit 340, a memory control unit 350, and a setting control unit 360. .

  The test memory 310 receives a memory access from the memory interface 600 by the device under test 500, and exchanges data with the device under test 500 according to the memory access. The DC test unit 320 generates a voltage and a current for DC testing the device under test 500.

  The switching unit 330 switches whether the memory interface 600 is connected to the test memory 310, the DC test unit 320, or the test module 200. Here, for example, when connecting to the test module 200, the switching unit 330 connects a terminal provided for testing of the device under test 500 and the memory interface 600. For example, the switching unit 330 connects the memory interface 600 with a terminal that transmits and receives a scan signal for performing a scan test of the device under test 500 in the test module 200.

  The acquisition unit 340 acquires a signal transmitted between the memory interface 600 and the test memory 310. For example, the acquisition unit 340 acquires and stores in time series what commands and data are received from the device under test 500.

  The memory control unit 350 accesses the test memory 310 under the control of the test module 200. Further, the memory control unit 350 receives the control from the test module 200 and transmits the signal acquired by the acquisition unit 340 to the test module 200. The setting control unit 360 receives the setting from the test module 200 and controls the switching position of the switching unit 330. Furthermore, the setting control unit 360 receives settings from the test module 200 and controls each part in the additional module 300 such as the DC test unit 320 and the memory control unit 350.

  When the memory write command is given from the device under test 500, the additional module 300 can store the data given from the device under test 500 in the additional module 300. Further, when the additional module 300 receives a memory read command from the device under test 500, the additional module 300 may send back the data stored corresponding to the address specified by the command to the device under test 500. it can.

  The additional module 300 receives the memory write command from the device under test 500 and saves the data, and then when the memory read command to the same address or the like is given, it is given from the device under test 500. The data can be sent back to the device under test 500 as it is. In addition, such an additional module 300 can transmit a log indicating what requests and data are received from the device under test 500 to the test module 200.

  Further, such an additional module 300 can directly connect a terminal provided for testing the device under test 500 in the test module 200 and the memory interface 600. Thus, the additional module 300 can form a path for transmitting a scan signal between the test module 200 and the device under test 500 when performing a scan test of the device under test 500.

  In addition, the additional module 300 can connect the DC test unit 320 to the memory interface 600. As a result, the additional module 300 can perform a DC test of the device under test 500 via the memory interface 600.

  FIG. 5 shows an example of a more specific configuration of the additional module 300 provided between the PCI-Express interface 710 and the test module 200. For example, the additional module 300 connected to the PCI-Express interface 710 includes a switching unit 330, a setting control unit 360, a packet communication unit 370, and a data communication unit 380.

  The packet communication unit 370 communicates packets with the device under test 500. The data communication unit 380 exchanges data included in the packet with the test module 200. The packet communication unit 370 generates a packet according to the data given from the test module 200 and transmits the packet to the PCI-Express interface 710. In addition, the data communication unit 380 generates data corresponding to the packet received from the PCI-Express interface 710 and transmits the data to the test module 200.

  The switching unit 330 switches between connecting the terminal of the PCI-Express interface 710 of the test module 200 to a terminal provided for testing the device under test 500 or connecting the packet communication unit 370 to the device under test 500. . The setting control unit 360 receives the setting from the test module 200 and controls the switching position of the switching unit 330. Furthermore, the setting control unit 360 receives settings from the test module 200 and controls each unit in the additional module 300 such as the packet communication unit 370 and the data communication unit 380.

  Even if such an additional module 300 transmits signals with different reception timings from the device under test 500, or performs retransmission of packets, for example, it performs processing corresponding to adjustment of reception timing and packet retransmissions in packet communication. Performed by the unit 370. Therefore, the additional module 300 can exchange the deterministic signal with the test module 200 by the packet communication unit 370 absorbing the nondeterministic exchange in the packet communication.

  FIG. 6 shows a first example of the configuration of the test module 200 that controls the additional module 300 according to the present embodiment. The test module 200 that controls the additional module 300 includes a bus IF unit 210 and a test unit 220 as an example. The bus IF unit 210 controls transmission / reception of data between the test module 200 and the control device 130.

  The test unit 220 includes a storage unit that stores a test program given from the control device 130, a sequencer that executes the test program, and the like. In response to an access request from the control device 130, the test unit 220 executes a test program and generates a test signal for testing the device under test 500. Then, the test module 200 outputs the generated test signal from a terminal provided for testing the device under test 500 to the additional module 300. The test unit 220 according to the first example generates a scan signal for performing a scan test on the device under test 500.

  In addition, the test module 200 according to the first example includes a path 230 that transfers an access request to the additional module 300 from the control device 130 of the test apparatus 100 to the additional module 300. For example, the path 230 includes a control signal including an access request to the register in the additional module 300 from the control device 130, and data including a program and data for testing the device under test 500 provided from the control device 130. Transfer the signal.

  In the test module 200 according to the first example as described above, the control device 130 can access the additional module 300 as a part of the elements in the test module 200. Further, in such a test module 200 according to the first example, when the device under test 500 is subjected to a scan test, the scan signal generated by the test unit 220 can be given to the device under test 500.

  FIG. 7 shows a second example of the configuration of the test module 200 that controls the additional module 300 according to the present embodiment. In the description of FIG. 7, among functional blocks included in the test module 200 according to the second example, functional blocks that are substantially the same as the functional blocks included in the test module 200 according to the first example are denoted by the same reference numerals. The description is omitted except for the differences.

  The test unit 220 according to the second example executes a test program and generates a scan signal, a data signal, and a control signal. The test module 200 outputs the scan signal and the data signal to the additional module 300 from a terminal provided for testing the device under test 500. The test module 200 outputs a control signal to the additional module 300 from a control terminal for controlling the additional module 300.

  In such a test unit 220, a test program to be executed is switched according to control from the control device 130. The test unit 220 generates a scan signal when the device under test 500 is subjected to a scan test.

  Further, when testing the device under test 500 via the additional module 300, the test unit 220 generates a data signal and a control signal to be given to the additional module 300. Such a test module 200 can control the additional module 300 via a terminal provided for testing the device under test 500.

  FIG. 8 shows a third example of the configuration of the test module 200 that controls the additional module 300 according to the present embodiment. In the description of FIG. 8, among the functional blocks included in the test module 200 according to the third example, functional blocks that are substantially the same as the functional blocks included in the test module 200 according to the first example are denoted by the same reference numerals. The description is omitted except for the differences.

  In the third example, the additional module 300 is connected to the first test module 200-1 and the second test module 200-2. The first test module 200-1 includes a bus IF unit 210 and a test unit 220. The test unit 220 included in the first test module 200-1 executes a test program and generates a scan signal and a control signal.

  When the test unit 220 included in the first test module 200-1 performs a scan test on the device under test 500, the test unit 220 generates a scan signal and adds a module from a terminal provided for testing the device under test 500. Output to 300. In addition, when testing the device under test 500 via the additional module 300, the test unit 220 included in the first test module 200-1 generates a data signal to be supplied to the additional module 300, and Output from the terminal provided for 500 tests to the additional module 300.

  The second test module 200-2 includes a bus IF unit 210 and a communication controller 240. The communication controller 240 controls transmission / reception of data to / from the additional module 300 through a predetermined communication interface. As an example, the communication controller 240 transmits and receives data using I2C (Inter-Integrated Circuit), SPI (Serial Peripheral Interface), and the like.

  When testing the device under test 500 via the additional module 300, the communication controller 240 included in the second test module 200-2 sends an access request for the additional module 300 received from the control device 130 to a predetermined communication. Is provided to the additional module 300 via the interface. Such a second test module 200-2 can control the additional module 300 via the communication interface.

  FIG. 9 shows an example of a functional configuration of the test apparatus 100 according to the present embodiment. The test apparatus 100 executes a test program to test at least one device under test 500.

  The control device 130 includes an arithmetic processing unit 410, a test program storage unit 440, and a program supply unit 450. Each of the plurality of test modules 200 includes an execution processing unit 420 and one or more communication processing units 430.

  The additional module 300 is connected to any one or a plurality of communication processing units 430 of any test module 200. Here, the additional module 300 may have some functions in the connected communication processing unit 430.

  The additional module 300 may include, for example, the transmission unit 36 and the reception unit 82 in the packet communication unit 434 whose details will be described with reference to FIG. In addition, the additional module 300 includes the packet command sequence storage unit 24, the packet data sequence storage unit 26, the lower sequencer 28, the data processing unit 32, the data conversion unit 34, the transmission unit 36, and the reception unit 82 in the packet communication unit 434. The packet communication unit 434 may be provided instead.

  Each execution processing unit 420 is connected to the arithmetic processing unit 410 via, for example, a bus. Each communication processing unit 430 is connected to one of the execution processing units 420.

  The arithmetic processing unit 410 processes arithmetic expressions in the test program. Each execution processing unit 420 specifies a packet list to be executed by each communication processing unit 430 connected to the execution processing unit 420 among a plurality of packet lists in the test program. Each communication processing unit 430 sequentially communicates the packets included in the packet list designated by the corresponding execution processing unit 420 with the corresponding device under test 500.

  As an example, the test apparatus 100 may include one arithmetic processing unit 410, eight execution processing units 420, and 256 communication processing units 430. In this case, for example, 32 communication processing units 430 are connected to each of the eight execution processing units 420. The test apparatus 100 is not limited to such a connection configuration, and may be another connection configuration.

  The test program storage unit 440 stores a test program. The program supply unit 450 loads a test program to the arithmetic processing unit 410, the execution processing unit 420, and the communication processing unit 430 prior to the test.

  FIG. 10 illustrates an example of the configuration of the arithmetic processing unit 410 according to the present embodiment, and a representative one of the execution processing unit 420 and the communication processing unit 430 among the plurality of execution processing units 420 and the plurality of communication processing units 430. The configuration is shown. The calculation processing unit 410 includes a variable storage unit 412 and a calculation unit 414. Each execution processing unit 420 includes a flow control unit 426. Each communication processing unit 430 includes a packet list storage unit 432 and a packet communication unit 434. The packet list storage unit 432 is described outside the packet communication unit 434, but may be provided inside the packet communication unit 434.

  The program supply unit 450 extracts a plurality of packet lists each including a series of packets communicated by the corresponding communication processing unit 430 from the test program stored in the test program storage unit 440, and the corresponding communication processing unit 430. And stored in the packet list storage unit 432. The program supply unit 450 generates a control program describing a control flow for sequentially executing a plurality of packet lists extracted from the test program, and supplies the control program to the flow control unit 426. In addition, the program supply unit 450 generates an operation program that executes an operation expression extracted from the test program, and supplies the operation program to the operation unit 414.

  The flow control unit 426 designates the order of executing each of the plurality of packet lists to the packet communication unit 434 in the corresponding communication processing unit 430 according to the execution flow of the test program. More specifically, the flow control unit 426 executes the control program supplied from the program supply unit 450 and stores it in the packet list storage unit 432 for the packet communication unit 434 in the corresponding communication processing unit 430. A packet list to be executed next is specified from the plurality of packet lists. For example, the flow control unit 426 transmits an address in the packet list storage unit 432 of the packet list to be executed next to the packet communication unit 434.

  In addition, when the control program includes an arithmetic expression, the flow control unit 426 calls an arithmetic program that executes the arithmetic expression and causes the arithmetic unit 414 in the arithmetic processing unit 410 to execute the arithmetic program. Then, the flow control unit 426 specifies a packet list to be executed next based on the calculation result of the calculation expression by the calculation processing unit 410. In this case, the flow control unit 426 may wait for the next packet list to be specified until the calculation result by the calculation processing unit 410 is received, and may select the packet list to be specified according to the calculation result.

  The packet list storage unit 432 stores a plurality of packet lists supplied from the program supply unit 450. The packet communication unit 434 sequentially communicates a series of packets included in the packet list sequentially specified by the flow control unit 426 in the corresponding execution processing unit 420 with the corresponding device under test 500 to correspond. The device under test 500 is tested.

  For example, the packet communication unit 434 reads a packet list from the address received from the flow control unit 426 and sequentially communicates a series of packets included in the read packet list with the corresponding device under test 500. Further, the packet communication unit 434 transmits the data value included in the packet received from the device under test 500 as a variable value to the variable storage unit 412 in the arithmetic processing unit 410 via the flow control unit 426.

  The variable storage unit 412 stores the data value received from each of the plurality of packet communication units 434 included in the plurality of communication processing units 430 as a variable value. The calculation unit 414 executes the calculation formula included in the test program and transmits the execution result to the flow control unit 426 in the plurality of execution processing units 420. Further, when the arithmetic expression includes the data value received from the device under test 500, the arithmetic section 414 reads out the variable value that is a parameter of the arithmetic expression from the variable storage section 412 and performs the calculation specified by the arithmetic expression. Further, the arithmetic unit 414 may transmit the data value included in the packet to be transmitted to the device under test 500 to the packet communication unit 434 as a variable value.

  Such a test apparatus 100 causes the higher-order arithmetic processing unit 410 to execute arithmetic expressions in the test program, and causes the lower-order flow control unit 426 and the packet communication unit 434 to perform flow control. As a result, according to the test apparatus 100, the higher-order arithmetic processing unit 410 is realized by a processor having a high arithmetic capacity to centrally manage variables, and the lower-level flow control unit 426 and the packet communication unit 434 have a high operating frequency. The system can be realized by a processor or a sequencer, and an overall efficient system can be constructed.

  Also, such a test apparatus 100 stores the data value received from the device under test 500 as a variable in the higher-level arithmetic processing unit 410. Therefore, according to such a test apparatus 100, the contents of a packet received from one device under test 500 can be reflected in a packet transmitted to another device under test 500.

  Furthermore, since such a test apparatus 100 transfers the data value received from the device under test 500 from the lower-level communication processing unit 430 to the higher-level arithmetic processing unit 410, complex calculation is performed on the received data. Can do. And since the test apparatus 100 transfers such a calculation result from the high-order arithmetic processing unit 410 to the low-order communication processing unit 430, the data obtained by performing a complex calculation on the received data is obtained. Can be included in a newly generated packet.

  FIG. 11 shows a configuration of the packet communication unit 434 according to the present embodiment. The packet communication unit 434 includes a transmission side block 12 and a reception side block 14. The transmission side block 12 transmits the packets to the device under test 500 in the order specified by the packet list. The receiving block 14 receives a packet from the device under test 500 and compares the packet specified in the packet list with the received packet to determine whether the device under test 500 is good or bad.

  First, the transmission side block 12 will be described. The transmission side block 12 includes a packet list storage unit 432, a packet list processing unit 22, a packet instruction sequence storage unit 24, a packet data sequence storage unit 26, a lower sequencer 28, a data processing unit 32, and a data conversion unit. 34 and a transmission unit 36. The packet list storage unit 432 stores a plurality of packet lists supplied from the program supply unit 450.

  The packet list processing unit 22 executes the packet list specified by the flow control unit 426 among the plurality of packet lists stored in the packet list storage unit 432, and sequentially specifies each packet that communicates with the device under test 500. . As an example, the packet list processing unit 22 executes the packet list from the address received from the flow control unit 426 and sequentially specifies the packets to be transmitted to the device under test 500.

  For example, the packet list processing unit 22 designates an address on the packet instruction sequence storage unit 24 in which an instruction sequence for generating the designated packet is stored. Further, as an example, the packet list processing unit 22 addresses the data string included in the packet in the packet data string storage unit 26 (for example, the start address of the data string) for a packet communicated with the device under test 500. Is specified.

  As described above, the packet list processing unit 22 individually designates the address of the instruction sequence for generating a packet and the address of the data sequence included in the packet. In this case, when a common command sequence or data sequence is specified for two or more packets in the packet list, the packet list processing unit 22 uses the same command sequence for the two or more packets. Or the address of the same data string may be designated.

  The packet instruction sequence storage unit 24 stores an instruction sequence for generating each of a plurality of types of packets for each type of packet. For example, the packet instruction sequence storage unit 24 stores an instruction sequence for generating a write packet, an instruction sequence for generating a read packet, an instruction sequence for generating an idle packet, and the like.

  The packet data string storage unit 26 stores a data string included in each of a plurality of types of packets for each type of packet. For example, the packet data string storage unit 26 may include a data string included in the write packet, a data string included in the read packet, a data string included in the idle packet, and the like. Further, as an example, the packet data string storage unit 26 may store individual data that is changed for each packet and common data that is common for each packet type separately in separate storage areas. An example of the configuration of the packet data string storage unit 26 will be described with reference to FIG.

  Further, the packet data string storage unit 26 on the transmission side receives the reception data included in the packet received by the reception unit 82 in the reception side block 14 from the data conversion unit 34 in the reception side block 14. Then, the transmission side packet data string storage unit 26 stores reception data included in the packet received by the reception unit 82 in the reception side block 14.

  The lower sequencer 28 reads the instruction sequence of the packet specified by the packet list processing unit 22, that is, the instruction sequence whose address is specified by the packet list processing unit 22, from the packet instruction sequence storage unit 24, and converts it into the read instruction sequence. Each included instruction is executed sequentially. Further, the lower sequencer 28 sequentially converts the packet data sequence designated by the packet list processing unit 22, that is, the data sequence designated by the packet list processing unit 22 into the packet data sequence storage unit according to the execution of the instruction sequence. 26, a test data string used for a test with the device under test 500 is generated.

  The lower sequencer 28 also provides control data for instructing to perform specified processing (calculation or data conversion) on the read individual data and common data every time an instruction is executed. To give. As a result, the lower sequencer 28 can set the designated data portion in the packet designated by the packet list processing unit 22 to data obtained by performing the designated processing on the read data.

  Further, the lower sequencer 28 may give an end notification to the packet list processing unit 22 in response to the completion of execution of the instruction sequence of the packet specified by the packet list processing unit 22. As a result, the packet list processing unit 22 can sequentially specify packets in accordance with the progress of execution of the instruction sequence by the lower sequencer 28.

  Further, the transmission-side lower sequencer 28 included in the transmission-side block 12 specifies the edge timing of the signal to be transmitted to the device under test 500 to the transmission unit 36. For example, the lower sequencer 28 gives a timing signal to the transmission unit 36 and controls the edge timing for each packet.

  The lower sequencer 28 on the transmission side communicates with the lower sequencer 28 on the reception side included in the reception side block 14. Thereby, the lower sequencer 28 on the transmission side can perform a handshake with the lower sequencer 28 on the reception side and execute the instruction sequence in synchronization with the lower sequencer 28 on the reception side.

  For example, the lower sequencer 28 on the transmission side notifies the lower sequencer 28 on the reception side that the test data string of the packet designated in advance has been transmitted to the device under test 500. As a result, the transmission-side lower sequencer 28 can prohibit the reception-side lower sequencer 28 from determining whether the received data string is good or bad until receiving the notification from the transmission-side lower sequencer 28.

  Further, as an example, the lower sequencer 28 on the transmission side receives a notification from the lower sequencer 28 on the reception side that it has received a data sequence that matches the generated test data sequence. Is generated. Thus, the lower sequencer 28 on the transmission side can transmit a predetermined packet to the device under test 500 after receiving a predetermined packet from the device under test 500.

  The data processing unit 32 reads out the data sequence of the packet designated by the packet list processing unit 22 from the packet data sequence storage unit 26 and generates a test data sequence used for testing the device under test 500. In this case, the data processing unit 32 on the transmission side receives the received data included in the packet received by the reception unit 82 in the reception side block 14 in the test data sequence corresponding to the packet transmitted to the device under test 500. You may include a value depending on.

  For example, the data processing unit 32 on the transmission side reads data from the packet data sequence storage unit 26 on the transmission side, and determines a predetermined portion in the data sequence of the packet to be transmitted to the device under test 500 according to the received data. A test data string having a value (for example, a value as received data or a value obtained by performing some processing on the received data) is generated. Such a data processing unit 32 on the transmission side can transmit the packet according to the received data included in the packet received from the device under test 500. An example of the configuration of the data processing unit 32 will be described with reference to FIG.

  The data conversion unit 34 converts the test data string output from the data processing unit 32 at the timing designated by the lower sequencer 28. For example, the data conversion unit 34 performs 8b-10b conversion or the like using a table or the like set in advance for the test data string. Furthermore, as an example, the data conversion unit 34 may perform a scramble process on the test data string. Then, the data conversion unit 34 outputs the converted data string.

  The transmission unit 36 transmits the test data sequence generated by the data conversion unit 34 to the device under test 500. An example of the configuration of the transmission unit 36 will be described with reference to FIG.

  Next, the receiving side block 14 will be described. Since the reception side block 14 has substantially the same configuration and function as the transmission side block 12, the reception side block 14 will be described with respect to differences from the transmission side block 12.

  The receiving side block 14 includes a packet list storage unit 432, a packet list processing unit 22, a packet instruction sequence storage unit 24, a packet data sequence storage unit 26, a lower sequencer 28, a data processing unit 32, and a data conversion unit. 34, a receiving unit 82, and a determining unit 84. The receiving unit 82 receives a packet data string from the device under test 500. An example of the configuration of the receiving unit 82 will be described with reference to FIG.

  The data conversion unit 34 on the reception side performs data conversion on the data string received by the reception unit 82 at the timing specified by the lower sequencer 28 on the reception side. As an example, the data conversion unit 34 on the reception side performs 8b-10b conversion or the like on a received data string using a table or the like set in advance. Furthermore, as an example, the data conversion unit 34 on the reception side may perform descrambling processing on the received data string.

  Then, the data conversion unit 34 on the receiving side supplies the converted data string to the determination unit 84. The data converter 34 on the reception side may supply the converted data string to at least one of the packet data string storage unit 26 on the reception side or the packet data string storage unit 26 on the transmission side.

  The packet list processing unit 22 on the receiving side executes the packet list specified by the flow control unit 426 and sequentially specifies the packets expected to be received from the device under test 500. Further, the data processing unit 32 on the receiving side supplies the generated test data sequence to the determination unit 84.

  The lower sequencer 28 on the receiving side causes the packet data string that is expected to be output from the device under test 500 to be output from the packet data string storage unit 26 on the receiving side as a test data string. Further, the lower sequencer 28 on the receiving side designates the strobe timing for fetching the data value of the signal output from the device under test 500 to the receiving unit 82.

  The determination unit 84 receives the test data sequence from the data processing unit 32 on the reception side and also receives the data sequence received from the data conversion unit 34 on the reception side. The determination unit 84 determines the quality of communication with the device under test 500 based on the result of comparing the received data string with the test data string. As an example, the determination unit 84 includes a logical comparison unit that compares whether the data sequence received by the reception unit 82 matches the test data sequence, and a fail memory that stores the comparison result. For example, the determination unit 84 may notify the reception-side lower sequencer 28 that the data sequence received by the reception unit 82 matches the specified data sequence.

  Further, the lower sequencer 28 on the reception side communicates with the lower sequencer 28 on the transmission side. Thereby, the lower sequencer 28 on the reception side can perform a handshake with the lower sequencer 28 on the transmission side and execute the instruction sequence in synchronization with the lower sequencer 28 on the transmission side.

  For example, the lower sequencer 28 on the reception side notifies the lower sequencer 28 on the transmission side that the data sequence that matches the test data sequence generated by the lower sequencer 28 on the reception side has been received. As a result, the low-order sequencer 28 on the transmission side receives a notification from the low-order sequencer 28 on the reception side that it has received a data sequence that matches the generated test data sequence, and generates a test data sequence for a packet designated in advance. can do.

  Further, as an example, the reception-side lower sequencer 28 receives the notification from the transmission-side lower sequencer 28 that a test data string of a packet designated in advance has been transmitted to the device under test 500. The determination of pass / fail of the data string received by the receiving unit 82 is prohibited. Thereby, the lower sequencer 28 on the receiving side can determine whether or not a response corresponding to the predetermined packet is output from the device under test 500 after transmitting the predetermined packet to the device under test 500.

  The packet data string storage unit 26 on the reception side receives the reception data included in the packet received by the reception unit 82 from the data conversion unit 34 on the reception side block 14 side. The packet data string storage unit 26 on the reception side stores the reception data included in the packet received by the reception unit 82.

  Further, the data processing unit 32 on the receiving side includes a value corresponding to the received data included in the packet already received by the receiving unit 82 in the test data string included in the packet expected to be output from the device under test 500. For example, the data processing unit 32 on the receiving side reads the data from the packet data sequence storage unit 26 on the receiving side, and replaces the predesignated portion in the data sequence of the packet expected to be received from the device under test 500 with the received data. A test data string having a value (for example, a value of the received data as it is or a value obtained by performing some processing) is generated.

  For example, the data processing unit 32 on the receiving side responds to the received data included in the first packet already received by the receiving unit 82 in the test data string corresponding to the second packet to be received from the device under test 500. May be included. Thereby, according to the data processing unit 32 on the receiving side, for example, with reference to an ID or the like included in a packet received from the device under test 500, it is determined whether or not an ID that should be included in the subsequent packet is correct. can do.

  As described above, according to the test apparatus 100 according to the present embodiment, the process of including a value corresponding to the received data included in the received packet in the subsequent packets is positioned relatively close to the device under test 500. Can be done. Thereby, according to the test apparatus 100, the response of the exchange with the device under test 500 can be speeded up.

  The test apparatus 100 preferably includes a data processing unit 32 realized by an arithmetic processing unit or the like having a relatively high operating frequency. Thereby, the test apparatus 100 can perform the process which produces | generates the data included in the subsequent packet from the data included in the received packet at high speed.

  FIG. 12 shows an example of the configuration of the lower sequencer 28 and the packet data string storage unit 26 according to the present embodiment. For example, the packet data string storage unit 26 includes a common data storage unit 40, a common data pointer 42, a first individual data storage unit 44-1, a second individual data storage unit 44-2, Individual data pointer 46-1 and a second individual data pointer 46-2.

  The common data storage unit 40 stores common data common to each type of packet in a data string included in each of a plurality of types of packets. For example, the common data storage unit 40 stores, for each packet type, a start code indicating the start of the packet, an end code indicating the end of the packet, a command code for identifying the type of the packet, and the like.

  The common data pointer 42 acquires from the packet list processing unit 22 the head address of a block in which common data included in the packet specified by the packet list processing unit 22 is stored. Further, the common data pointer 42 acquires the offset position in the block from the lower sequencer 28. Then, the common data pointer 42 gives an address (for example, an address obtained by adding the offset position to the head address) determined based on the head address and the offset position to the common data storage unit 40, and the common data stored in the address is subjected to data processing To the unit 32.

  The first and second individual data storage units 44-1 and 44-2 store individual data to be changed for each packet in a data string included in each of a plurality of types of packets. As an example, each of the first and second individual data storage units 44-1 and 44-2 includes the entity data transmitted to the device under test 500 or the entity data received from the device under test 500, included in each packet. You may remember.

  The first individual data storage unit 44-1 stores predetermined individual data regardless of the packet list to be executed. The second individual data storage unit 44-2 stores individual data that is changed for each packet list to be executed. As an example, the second individual data storage unit 44-2 receives the transfer of individual data from the flow control unit 426 in the execution processing unit 420 before or during the test as appropriate.

  Further, the second individual data storage unit 44-2 receives the reception data received by the reception unit 82 from the reception-side data conversion unit 34 included in the reception-side block 14, and stores the received reception data as individual data. . As a result, the data processing unit 32 can read the received data from the second individual data storage unit 44-2 and include it in the test data string.

  The first and second individual data pointers 46-1 and 46-2 receive from the packet list processing unit 22 the head address of the block in which the individual data included in the packet designated by the packet list processing unit 22 is stored. . Further, the first and second individual data pointers 46-1 and 46-2 acquire the offset position in the block from the lower sequencer 28. The first and second individual data pointers 46-1 and 46-2 are addresses determined based on the head address and the offset position (for example, an address obtained by adding the offset position to the head address) and the first and second individual data pointers. The data is supplied to the storage units 44-1 and 44-2, and the individual data stored in the address is supplied to the data processing unit 32.

  As an example, the lower sequencer 28 sets an offset position indicating the position of data corresponding to the executed instruction in the block in which the data string included in the packet designated by the packet list processing unit 22 is stored. To the individual data pointer 46-1 and the individual data pointer 46-2. In this case, the lower sequencer 28 may generate an initial value in the first instruction and generate a count value that is incremented every time the instruction to be executed transits as an offset position. As a result, the lower sequencer 28 sequentially stores the packet data string designated by the packet list processing unit 22, that is, the data string designated by the packet list processing unit 22 according to the execution of the instruction sequence. By outputting from the unit 26, a test data string used for a test with the device under test 500 can be generated.

  The lower sequencer 28 designates the common data storage unit 40, the first individual data storage unit 44-1, the second individual data storage unit 44-2, or the designation in the data processing unit 32 every time an instruction is executed. The data processing unit 32 is designated to read out and output data from any of the registers storing the processed data.

  As a result, the lower sequencer 28 can generate a data portion to be changed for each packet in the packet designated by the packet list processing unit 22 from the individual data read from the individual data storage unit 44. Further, the lower sequencer 28 can generate a data portion common to each packet type in the packet specified by the packet list processing unit 22 from the common data read from the common data storage unit 40. Further, the lower sequencer 28 can perform the designated process on the designated data portion in the packet designated by the packet list processing unit 22.

  FIG. 13 shows an example of the configuration of the data processing unit 32 in the transmission side block 12 according to the present embodiment. As an example, the data processing unit 32 in the transmission side block 12 includes at least one register 52, a front stage selection unit 54, at least one computing unit 56, and a rear stage selection unit 60.

  Each of the at least one register 52 stores the operation processing result of the previous cycle. In this example, the data processing unit 32 includes a first register 52-1 and a second register 52-2.

  For each cycle, the pre-stage selection unit 54 includes the common data from the common data storage unit 40, the individual data storage units 44 (in this example, the first individual data storage unit 44-1 and the second individual data storage unit). 44-2) and the data designated by the lower sequencer 28 among the data in the respective registers 52 (in this example, the first register 52-1 and the second register 52-2). select. Then, the upstream selection unit 54 supplies each of the selected data to the computing unit 56 or the downstream selection unit 60 designated by the lower sequencer 28 for each cycle.

  Each of the at least one computing unit 56 is provided corresponding to each of the at least one register 52. In this example, the data processing unit 32 includes a first arithmetic unit 56-1 corresponding to the first register 52-1, and a second arithmetic unit 56-2 corresponding to the second register 52. . As an example, each of the arithmetic units 56 performs operations such as logical operations, four arithmetic operations, pseudorandom number generation, and error correction code generation. Each of the computing units 56 performs an operation designated by the lower sequencer 28 on the data selected by the previous stage selection unit 54 and stores it in the corresponding register 52 for each cycle.

  The post-selection unit 60 selects the data selected by the pre-selection unit 54 for each cycle (in this example, the common data storage unit 40, the first individual data storage unit 44-1 or the second individual data storage unit 44- 2) and the data designated by the lower sequencer 28 among the data in the at least one register 52 are selected. Then, the subsequent stage selection unit 60 outputs the selected data as each data of the test data string.

  FIG. 14 shows an example of the configuration of the transmission unit 36 in the transmission side block 12 according to the present embodiment. As an example, the transmission unit 36 includes a serializer 72, a format controller 74, and a driver 76.

  The serializer 72 converts the test data sequence received from the data processing unit 32 into a serial waveform pattern. The format controller 74 generates a signal having a waveform corresponding to the waveform pattern received from the serializer 72. Further, the format controller 74 outputs a signal having a waveform whose logic changes at the edge timing specified by the lower sequencer 28. The driver 76 supplies the signal output from the format controller 74 to the device under test 500.

  FIG. 15 shows an example of the configuration of the receiving unit 82 in the receiving side block 14 according to the present embodiment. As an example, the receiving unit 82 includes a level comparator 86, a timing comparator 88, a deserializer 90, a phase adjustment unit 92, and a hunt unit 94.

  The level comparator 86 compares the signal output from the device under test 500 with a threshold value and outputs a logic signal. The timing comparator 88 sequentially takes in the logic signal data output by the level comparator 86 at the strobe timing specified by the lower sequencer 28.

  The deserializer 90 converts the data string captured by the timing comparator 88 into a parallel data string. The phase adjustment unit 92 detects the specific code at the head of the packet and adjusts the phase of the parallel data string cut out by the deserializer 90. The hunt unit 94 compares the data string fetched by the timing comparator 88 with the specific code at the head of the packet, and adjusts the head position of the packet in bit units.

  Such a receiving unit 82 can receive a packet output from the device under test 500 at an indeterminate timing. Thereby, according to the receiving side block 14, the data sequence included in the packet output from the device under test 500 at an indeterminate timing is compared with the test data sequence expected to be output from the device under test 500. be able to.

  FIG. 16 shows an example of a packet list according to the present embodiment. In the packet list, a plurality of instructions to be executed sequentially are described. For example, a NOP instruction, an IDXI instruction, an EXIT instruction, and the like are described in the packet list. The NOP instruction causes execution to transition to the next instruction. The IDXI instruction repeats execution a specified number of times, and then transitions execution to the next instruction. The EXIT instruction ends the execution of the packet sequence.

  In the packet list, packet functions are described corresponding to each command. As an example, the packet list describes a packet function that generates a write packet, a read packet, an idle packet that generates a predetermined code, and the like.

  Further, in the packet list, corresponding to each packet function, the head address of the instruction sequence for generating the packet specified by the packet function, common data and individual data included in the packet specified by the packet function Is described. By executing such a packet list, the packet list processing unit 22 can call a packet function corresponding to the executed instruction each time the instructions are executed sequentially.

  FIG. 17 shows an example of a packet function that is compiled and loaded into the packet communication unit 434 according to the present embodiment. The packet function loaded in the packet communication unit 434 describes a plurality of instructions that are sequentially executed.

  For example, a NOP instruction, an IDXI instruction, an RTN instruction, and the like are described in the packet function. The NOP instruction outputs the data stored at the address specified by the pointer once and causes execution to transition to the next instruction. The IDXI instruction repeatedly outputs the data stored at the address designated by the pointer for the designated number of times, and shifts execution to the next instruction. The RTN instruction outputs the data stored at the address specified by the pointer once, and returns execution to the packet list.

  In the packet function, control data is described corresponding to each instruction. The control data includes an arithmetic expression given to the arithmetic unit 56 as an example. In the example of FIG. 17, the control data is an arithmetic expression (REG1 = REG1 ^) that writes back the exclusive OR of the data of the first register 52-1 and the output data to the first register 52-1. DB1 or REG1 = REG1 ^ DB2). Instead of this, the control data may designate a conversion process by the data converter 34.

  In the packet function, information specifying the storage location of data to be output corresponding to each instruction is described corresponding to each instruction. For example, the packet function designates one of the common data storage unit 40, the individual data storage unit 44, and the register 52 as a storage location.

  In the example of FIG. 17, a hexadecimal value such as 0x0F or 0x01 indicates the address of the common data storage unit 40 as a data storage location. DB1 indicates the first individual data storage unit 44-1 as a data storage location. DB2 indicates the second individual data storage unit 44-2 as a data storage location. REG1 indicates the first register 52-1 as a data storage location. The lower sequencer 28 can output the data sequence specified by each packet function by executing the instruction sequence indicated by such a packet function.

  FIG. 18 shows a processing flow of the test apparatus 100 according to the present embodiment. First, the packet list processing unit 22 executes the packet list and sequentially designates each packet to be communicated with the device under test 500 (S11, S16). When the lower sequencer 28 receives the packet designation from the packet list processing unit 22, the lower sequencer 28 repeatedly executes the processing from step S12 to step S15.

  When the lower sequencer 28 receives the designation of the packet, the lower sequencer 28 calls the instruction sequence for generating the packet from the packet instruction sequence storage unit 24 and sequentially executes the instruction from the head instruction. The lower sequencer 28 performs steps S13 and S14 every time each instruction is executed (S12, S15).

  In step S13, the lower sequencer 28 outputs data corresponding to the instruction. Further, in step S14, the lower sequencer 28 executes an operation or data conversion corresponding to the instruction. The lower sequencer 28 executes step S13 and step S14 in parallel.

  When executing the last instruction, the lower sequencer 28 returns the processing to the packet list processing unit 22 and receives the designation of the next packet from the packet list processing unit 22 (S15). Then, when the processing up to the last packet in the packet sequence is completed, the packet list processing unit 22 ends the flow (S16).

  According to the test apparatus 100 according to the present embodiment as described above, the packet list representing the packet sequence and the instruction sequence in the packet are executed by separate sequencers. Thereby, according to the test apparatus 100, description of a program can be simplified. Furthermore, according to the test apparatus 100, it is possible to share an instruction sequence and data for generating a common type of packet, so that the amount of information to be stored can be reduced.

  Furthermore, the test apparatus 100 according to the present embodiment individually designates the address of the instruction sequence executed by the lower sequencer 28 and the address of the data sequence read by the lower sequencer 28 from the packet list processing unit 22. Thereby, according to the test apparatus 100, a different data sequence can be generated by the same command sequence. Therefore, according to the test apparatus 100, since it is not necessary to store a plurality of identical instruction sequences, the amount of information to be stored can be reduced.

  Furthermore, in the test apparatus 100 according to the present embodiment, the data processing unit 32 executes a specified process (that is, calculation or conversion) on data read from the common data storage unit 40 and the individual data storage unit 44. . That is, the data processing unit 32 can generate data conversion and error detection codes to be processed in accordance with the definition of the lower layer (layer close to the physical layer) in packet communication.

  Thus, the test apparatus 100 may generate an instruction sequence and a data sequence for outputting upper layer data in packet communication, and separately specify processing in the lower layer in packet communication. Therefore, according to the test apparatus 100, the description of the program can be simplified, and the amount of information to be stored can be reduced.

  Furthermore, the test apparatus 100 according to the present embodiment includes a transmission-side block 12 that generates a test data sequence for transmitting a signal to the device under test 500, and test data for comparison with a signal received from the device under test 500. The receiving block 14 that generates a column is separated from each other, and each has a packet list processing unit 22 and a lower sequencer 28. According to the test apparatus 100, since the program on the transmission side and the reception side can be described independently, the program can be simplified.

  The test apparatus 100 can communicate between the lower sequencer 28 on the transmission side and the lower sequencer 28 on the reception side. Thereby, according to the test apparatus 100, for example, it is easy to start an operation on the reception side using an event generated on the transmission side as a trigger, or to start an operation on the transmission side using an event generated on the reception side as a trigger. It becomes.

  Note that the test apparatus 100 may be configured to include a plurality of sets of the transmission side block 12 and the reception side block 14. In this case, the execution processing unit 420 gives a separate sequence (separate packet list) to each of the set of the transmission side block 12 and the reception side block 14 and executes them independently of each other. Thereby, the test apparatus 100 can operate each of the set of the transmission side block 12 and the reception side block 14 asynchronously with each other.

  In addition, the execution processing unit 420 may operate the set of the transmission side block 12 and the reception side block 14 in synchronization with each other. In this case, the execution processing unit 420 gives the same sequence (same packet list) to each of the set of the transmission side block 12 and the reception side block 14, and starts execution in synchronization with each other. Accordingly, the test apparatus 100 can test a plurality of devices under test 500 having the same type or different types of packet communication interfaces in parallel.

  As mentioned above, although this invention was demonstrated using embodiment, the technical scope of this invention is not limited to the range as described in the said embodiment. It will be apparent to those skilled in the art that various modifications or improvements can be added to the above-described embodiment. It is apparent from the scope of the claims that the embodiments added with such changes or improvements can be included in the technical scope of the present invention.

  The execution order of each process such as operations, procedures, steps, and stages in the apparatus, system, program, and method shown in the claims, the description, and the drawings is particularly “before” or “prior”. It should be noted that they can be implemented in any order unless the output of the previous process is used in the subsequent process. Regarding the operation flow in the claims, the description, and the drawings, even if it is described using “first”, “next”, etc. for the sake of convenience, it means that it is essential to carry out in this order. is not.

100 test apparatus, 110 test head, 120 performance board, 130 control apparatus, 200 test module, 300 additional module, 500 device under test, 510 CPU core block, 520 image core block, 600 memory interface, 700 communication interface, 710 PCI- Express interface, 720 USB interface, 730 SD interface, 302 DUT communication functional block, 304 main body communication functional block, 310 test memory, 320 DC test unit, 330 switching unit, 340 obtaining unit, 350 memory control unit, 360 setting control unit 370 packet communication unit, 380 data communication unit, 210 bus IF unit, 220 test unit, 230 paths, 240 communication link Troller, 410 arithmetic processing unit, 420 execution processing unit, 430 communication processing unit, 440 test program storage unit, 450 program supply unit, 412 variable storage unit, 414 calculation unit, 426 flow control unit, 432 packet list storage unit, 434 packets Communication unit, 12 transmission side block, 14 reception side block, 22 packet list processing unit, 24 packet instruction sequence storage unit, 26 packet data sequence storage unit, 28 lower sequencer, 32 data processing unit, 34 data conversion unit, 36 transmission unit , 40 common data storage unit, 42 common data pointer, 44 individual data storage unit, 46 individual data pointer, 52 register, 54 front stage selection unit, 56 arithmetic unit, 60 rear stage selection unit, 72 serializer, 74 format controller, 76 driver, 82 Parts, 84 determination unit, 86 the level comparator, 88 timing comparator, 90 deserializer 92 phase adjustment portion, 94 Hunt portion

Claims (18)

A test apparatus for testing a device under test,
A test module that communicates packets with the device under test to test the device under test;
An additional module connected between the device under test and the test module for performing at least one of higher-speed communication and lower-latency communication with the device under test than the test module;
A test apparatus comprising: A first test module connected to the device under test and communicating packets with the device under test;
A second test module connected to and controlling the additional module;
The test apparatus according to claim 1, comprising: The test module is
At least one first terminal connected to the device under test and communicating packets with the device under test;
At least one second terminal connected to the additional module for controlling the additional module;
The test apparatus according to claim 1, comprising: The test module is
A packet list processing unit that executes a test program for testing the device under test and sequentially designates each packet communicated with the device under test;
A packet data string storage unit for storing a data string included in each of a plurality of types of packets;
A low-order sequencer that reads a data sequence of a packet designated by the packet list processing unit from the packet data sequence storage unit and generates a test data sequence used for a test with the device under test;
The test apparatus according to claim 1, comprising: The test module is
A packet list storage unit for storing a plurality of packet lists each including a series of packets communicated with the device under test;
In accordance with an execution flow of a test program for testing the device under test, a flow control unit that designates an order of executing each of the plurality of packet lists;
A packet communication unit for testing a device under test by sequentially communicating a series of packets included in a packet list sequentially designated by the flow control unit with the device under test;
The test apparatus according to claim 1, comprising: A test head on which the test module is mounted;
A performance board mounted on the test head and connecting between the test module and the device under test;
With
The test apparatus according to claim 1, wherein the additional module is mounted on the performance board.   The additional module communicates with the device under test signals whose data values and timings to be exchanged cannot be specified in advance by the test program, and signals for which data values and timings to be exchanged can be previously specified by the test program The test apparatus according to claim 1, which communicates with the test apparatus.   The test apparatus according to claim 1, wherein the additional module is connected to a memory interface for the device under test to access an external memory.   The said additional module has a memory for a test which receives the memory access from the said memory interface by the said device under test, and transfers data between the said devices under test according to the said memory access. Test equipment.   The test apparatus according to claim 9, wherein the additional module includes a switching unit that switches whether the memory interface is connected to the test memory or the test module.   The test apparatus according to claim 9, wherein the additional module includes an acquisition unit that acquires a signal transmitted between the memory interface and the test memory.   The test apparatus according to claim 9, wherein the additional module includes a memory control unit that receives the control from the test module and accesses the test memory. The additional module is
A packet communication unit for communicating packets with the device under test;
A data communication unit that exchanges data contained in the packet with the test module;
The test apparatus according to claim 1, comprising:   The test apparatus according to claim 13, wherein the additional module includes a switching unit that switches between connecting a terminal of the test module to the device under test or connecting the packet communication unit to the device under test.   The test apparatus according to claim 1, wherein the test module has a path for transferring an access request to the additional module from a control device of the test apparatus to the additional module.   The test apparatus according to claim 1, wherein the test module controls the additional module via a terminal provided for testing the device under test.   The test apparatus according to claim 1, wherein the test module controls the additional module via a communication interface. A test method using a test apparatus for testing a device under test,
The test apparatus comprises:
A test module that communicates packets with the device under test to test the device under test;
An additional module connected between the device under test and the test module for performing at least one of higher-speed communication and lower-latency communication with the device under test than the test module;
With
A test method in which the test module tests the device under test via the additional module.

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