JPS649339A - Atomic absorption photometer - Google Patents

Atomic absorption photometer

Info

Publication number
JPS649339A
JPS649339A JP16233787A JP16233787A JPS649339A JP S649339 A JPS649339 A JP S649339A JP 16233787 A JP16233787 A JP 16233787A JP 16233787 A JP16233787 A JP 16233787A JP S649339 A JPS649339 A JP S649339A
Authority
JP
Japan
Prior art keywords
light
atomic absorption
sample
detectors
lights
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16233787A
Other languages
Japanese (ja)
Inventor
Toyoji Okumoto
Konosuke Oishi
Masamichi Tsukada
Hayato Tobe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP16233787A priority Critical patent/JPS649339A/en
Publication of JPS649339A publication Critical patent/JPS649339A/en
Pending legal-status Critical Current

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  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To enable the selection of an optimum measuring value corresponding to the concentration of a sample, by selecting a plurality of analysis frequencies different in absorption sensitivity for measurement. CONSTITUTION:A sample set in a graphite tube 26 is heated by a Joule's heat to turn into atomic vapor. Fluxes of light from a plurality of light sources 20 are made to pass through said vapor, wavelengths of analytical beams are selected by spectroscopes 28 and 29, and then the light is separated by fixed polarizers 30 into a light P11 having an oscillation plane parallel to a magnetic field and a light P12 having an oscillation plane vertical to the field. Next, the lights P11 and P12 are made to enter detector 34 alternately by a beam selector 32 and are detected by the detectors 34. On the occasion, the light P11 is affected by both atomic absorption and background BG, while the light P12 is affected by BG. By finding a difference between the lights P11 and P12, accordingly, an amount of the atomic absorption for which BG is corrected is obtained. Besides, the light fluxes entering the detectors 34 are turned thereby into electric signals corresponding to the intensities thereof, amplified 36, subjected to A/D conversion 38 and inputted to a computer 40. Then, an unknown sample is measured, and the concentration thereof is determined from a working curve and displayed 42.
JP16233787A 1987-07-01 1987-07-01 Atomic absorption photometer Pending JPS649339A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16233787A JPS649339A (en) 1987-07-01 1987-07-01 Atomic absorption photometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16233787A JPS649339A (en) 1987-07-01 1987-07-01 Atomic absorption photometer

Publications (1)

Publication Number Publication Date
JPS649339A true JPS649339A (en) 1989-01-12

Family

ID=15752634

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16233787A Pending JPS649339A (en) 1987-07-01 1987-07-01 Atomic absorption photometer

Country Status (1)

Country Link
JP (1) JPS649339A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06167449A (en) * 1992-11-30 1994-06-14 General Signal Japan Kk Method and equipment for controlling concentration
WO2016208048A1 (en) * 2015-06-26 2016-12-29 株式会社日立製作所 Gas analysis device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06167449A (en) * 1992-11-30 1994-06-14 General Signal Japan Kk Method and equipment for controlling concentration
WO2016208048A1 (en) * 2015-06-26 2016-12-29 株式会社日立製作所 Gas analysis device
JPWO2016208048A1 (en) * 2015-06-26 2017-08-03 株式会社日立製作所 Gas analyzer

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