JPS648676U - - Google Patents

Info

Publication number
JPS648676U
JPS648676U JP10402887U JP10402887U JPS648676U JP S648676 U JPS648676 U JP S648676U JP 10402887 U JP10402887 U JP 10402887U JP 10402887 U JP10402887 U JP 10402887U JP S648676 U JPS648676 U JP S648676U
Authority
JP
Japan
Prior art keywords
current
current source
switching circuit
connects
sucking
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10402887U
Other languages
Japanese (ja)
Other versions
JPH0650786Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10402887U priority Critical patent/JPH0650786Y2/en
Publication of JPS648676U publication Critical patent/JPS648676U/ja
Application granted granted Critical
Publication of JPH0650786Y2 publication Critical patent/JPH0650786Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案の一実施例を説明するための
接続図、第2図はこの考案の具体的な実施例を説
明するための接続図、第3図は従来の技術を説明
するための接続図である。 1……被試験IC、1A……被試験ICの端子
、2……パフオーマンスボード、3……接続手段
、4……試験装置、4A……被試験IC接続端子
、5……駆動回路、6……レベル比較器、7……
流出電流源、8……吸引電流源、9A,9B……
スイツチ、11……電流切替回路、11A,11
B……切替端子、12……電圧源、15……容量
負荷、16……容量切替回路。
Fig. 1 is a connection diagram for explaining an embodiment of this invention, Fig. 2 is a connection diagram for explaining a specific embodiment of this invention, and Fig. 3 is a connection diagram for explaining a conventional technique. It is a connection diagram. 1... IC under test, 1A... Terminal of IC under test, 2... Performance board, 3... Connection means, 4... Test equipment, 4A... IC under test connection terminal, 5... Drive circuit, 6 ...Level comparator, 7...
Outflow current source, 8...Suction current source, 9A, 9B...
Switch, 11...Current switching circuit, 11A, 11
B...Switching terminal, 12...Voltage source, 15...Capacitance load, 16...Capacity switching circuit.

Claims (1)

【実用新案登録請求の範囲】 A 一定電流を流出する流出電流源及び一定電流
を吸引する吸引電流源と、 B この流出電流源と吸引電流源の間に接続され
、ダイオードブリツジによつて構成された電流切
替回路と、 C この電流切替回路と上記流出電流源及び吸引
電流源の間を断続するスイツチと、 D 上記電流切替回路の一方の切替端子に接続し
た被試験IC接続端子と、 E 上記電流切替回路の他方の切替端子に接続し
た容量負荷と、 から成るIC試験装置。
[Scope of Claim for Utility Model Registration] A. A draining current source that drains a constant current and a sucking current source that sucks a constant current; B. Connected between the draining current source and the sucking current source, and configured by a diode bridge. C. A switch that connects and connects this current switching circuit to the above-mentioned outflow current source and suction current source; D. An IC under test connection terminal connected to one switching terminal of the above-mentioned current switching circuit; An IC testing device comprising: a capacitive load connected to the other switching terminal of the current switching circuit.
JP10402887U 1987-07-06 1987-07-06 IC test equipment Expired - Lifetime JPH0650786Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10402887U JPH0650786Y2 (en) 1987-07-06 1987-07-06 IC test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10402887U JPH0650786Y2 (en) 1987-07-06 1987-07-06 IC test equipment

Publications (2)

Publication Number Publication Date
JPS648676U true JPS648676U (en) 1989-01-18
JPH0650786Y2 JPH0650786Y2 (en) 1994-12-21

Family

ID=31335383

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10402887U Expired - Lifetime JPH0650786Y2 (en) 1987-07-06 1987-07-06 IC test equipment

Country Status (1)

Country Link
JP (1) JPH0650786Y2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04250373A (en) * 1991-01-28 1992-09-07 Mitsubishi Electric Corp Semiconductor test device
JP2005265756A (en) * 2004-03-22 2005-09-29 Yokogawa Electric Corp Ic tester

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04250373A (en) * 1991-01-28 1992-09-07 Mitsubishi Electric Corp Semiconductor test device
JP2005265756A (en) * 2004-03-22 2005-09-29 Yokogawa Electric Corp Ic tester

Also Published As

Publication number Publication date
JPH0650786Y2 (en) 1994-12-21

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