JPS6486035A - Wide band measuring amplifier for material testing machine - Google Patents

Wide band measuring amplifier for material testing machine

Info

Publication number
JPS6486035A
JPS6486035A JP62244736A JP24473687A JPS6486035A JP S6486035 A JPS6486035 A JP S6486035A JP 62244736 A JP62244736 A JP 62244736A JP 24473687 A JP24473687 A JP 24473687A JP S6486035 A JPS6486035 A JP S6486035A
Authority
JP
Japan
Prior art keywords
pass filter
amplified
signal
low
flat
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62244736A
Other languages
Japanese (ja)
Other versions
JPH0810181B2 (en
Inventor
Hidenori Hayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP62244736A priority Critical patent/JPH0810181B2/en
Publication of JPS6486035A publication Critical patent/JPS6486035A/en
Publication of JPH0810181B2 publication Critical patent/JPH0810181B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Transmission And Conversion Of Sensor Element Output (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Amplifiers (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)

Abstract

PURPOSE:To make a gain flat in a wide frequency band with low noise and low drift, by passing a signal DC amplified through a low pass filter while that AC amplified done through a high pass filter to add up. CONSTITUTION:A signal DC amplified 21 is passed through a low pass filter 23 to remove a high frequency noise. A signal AC amplified 22 is passed through a high pass filter 24 to remove a DC-like drift component. A DC amplifier 21 and an AC amplifier 22 are the same in the gain and the low pass filter 23 and the high pass filter 24 have an attenuation gradient with the frequency characteristic the same in output signals of both thereof while crossing over at the same cut off frequency. Thus, outputs of both the filters 23 and 24 are added up, thereby enabling the obtaining of a flat output signal flat in gain even when a microsignal containing a DC component is inputted.
JP62244736A 1987-09-29 1987-09-29 Wideband instrumentation amplifier in material testing machine Expired - Lifetime JPH0810181B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62244736A JPH0810181B2 (en) 1987-09-29 1987-09-29 Wideband instrumentation amplifier in material testing machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62244736A JPH0810181B2 (en) 1987-09-29 1987-09-29 Wideband instrumentation amplifier in material testing machine

Publications (2)

Publication Number Publication Date
JPS6486035A true JPS6486035A (en) 1989-03-30
JPH0810181B2 JPH0810181B2 (en) 1996-01-31

Family

ID=17123126

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62244736A Expired - Lifetime JPH0810181B2 (en) 1987-09-29 1987-09-29 Wideband instrumentation amplifier in material testing machine

Country Status (1)

Country Link
JP (1) JPH0810181B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011227025A (en) * 2010-04-23 2011-11-10 Shimadzu Corp Fatigue tester
JP2011227008A (en) * 2010-04-23 2011-11-10 Shimadzu Corp Material testing machine
JP2020205546A (en) * 2019-06-18 2020-12-24 東芝テック株式会社 Amplification device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5272554A (en) * 1975-12-13 1977-06-17 Anritsu Electric Co Ltd Wideeband amplifier

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5272554A (en) * 1975-12-13 1977-06-17 Anritsu Electric Co Ltd Wideeband amplifier

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011227025A (en) * 2010-04-23 2011-11-10 Shimadzu Corp Fatigue tester
JP2011227008A (en) * 2010-04-23 2011-11-10 Shimadzu Corp Material testing machine
JP2020205546A (en) * 2019-06-18 2020-12-24 東芝テック株式会社 Amplification device

Also Published As

Publication number Publication date
JPH0810181B2 (en) 1996-01-31

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