JPS6483138A - Inspecting method of retaining ring - Google Patents
Inspecting method of retaining ringInfo
- Publication number
- JPS6483138A JPS6483138A JP24119487A JP24119487A JPS6483138A JP S6483138 A JPS6483138 A JP S6483138A JP 24119487 A JP24119487 A JP 24119487A JP 24119487 A JP24119487 A JP 24119487A JP S6483138 A JPS6483138 A JP S6483138A
- Authority
- JP
- Japan
- Prior art keywords
- ring
- retaining ring
- inspection
- liquid
- spheres
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
PURPOSE:To facilitate detection by a method wherein a retaining ring is removed from a rotary armature, the shape of the retaining ring is changed by bending to generate a tensile stress in the inner peripheral surface thereof, and in this state an examination liquid is made to penetrate into a crack. CONSTITUTION:First a retaining ring is removed from a rotor of a rotary armature by releasing the shrink fit of the ring. Next, a hydraulic jack 2, for instance, is set inside the retaining ring 1 and extended to apply a load in the radius direction F onto the ring 1, so that the shape of the ring be changed to be elliptical. In this state, subsequently, spheres wherein a tensile stress is high relatively. e.g. spheres D1 and D2 of about 45 degrees, are set as part to be examined, and liquid penetrant inspection is executed therefor. Moreover the angular position of the ring 1 in relation to the jack 2 is shifted, and the inspection is executed for the remaining parts by the same process. By this method, an inspection liquid is made to penetrate into a crack, and thus even very small cracks can be detected easily and without fail.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP24119487A JPS6483138A (en) | 1987-09-25 | 1987-09-25 | Inspecting method of retaining ring |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP24119487A JPS6483138A (en) | 1987-09-25 | 1987-09-25 | Inspecting method of retaining ring |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6483138A true JPS6483138A (en) | 1989-03-28 |
Family
ID=17070610
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP24119487A Pending JPS6483138A (en) | 1987-09-25 | 1987-09-25 | Inspecting method of retaining ring |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6483138A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0384002A2 (en) * | 1989-02-20 | 1990-08-29 | Widmann Sicherungsanlagen Gmbh | Surface testing of round rings |
BE1005371A0 (en) * | 1988-02-29 | 1993-07-06 | Westinghouse Electric Corporation | Method and apparatus for detection of cracks in restraint coulonnes. |
CN102648405A (en) * | 2009-11-20 | 2012-08-22 | 独立行政法人产业技术综合研究所 | Method of examining defects, wafer subjected to defect examination or semiconductor element manufactured using the wafer, quality control method for wafer or semiconductor element, and defect examining device |
-
1987
- 1987-09-25 JP JP24119487A patent/JPS6483138A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
BE1005371A0 (en) * | 1988-02-29 | 1993-07-06 | Westinghouse Electric Corporation | Method and apparatus for detection of cracks in restraint coulonnes. |
EP0384002A2 (en) * | 1989-02-20 | 1990-08-29 | Widmann Sicherungsanlagen Gmbh | Surface testing of round rings |
CN102648405A (en) * | 2009-11-20 | 2012-08-22 | 独立行政法人产业技术综合研究所 | Method of examining defects, wafer subjected to defect examination or semiconductor element manufactured using the wafer, quality control method for wafer or semiconductor element, and defect examining device |
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