JPS6472017A - Apparatus for measuring spectral characteristics of laser beam - Google Patents
Apparatus for measuring spectral characteristics of laser beamInfo
- Publication number
- JPS6472017A JPS6472017A JP22215187A JP22215187A JPS6472017A JP S6472017 A JPS6472017 A JP S6472017A JP 22215187 A JP22215187 A JP 22215187A JP 22215187 A JP22215187 A JP 22215187A JP S6472017 A JPS6472017 A JP S6472017A
- Authority
- JP
- Japan
- Prior art keywords
- plate
- mirror
- plates
- bottom plate
- laser beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003595 spectral effect Effects 0.000 title abstract 2
- 238000005259 measurement Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
- G01J9/0246—Measuring optical wavelength
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
PURPOSE: To provide a highly stable instrument for measuring spectral characteristic of laser beam having high measurement accuracy and a small size by constituting an interferometer by providing two plates as a mirror and a bottom plate, respectively, and a wedge-shaped plate working as a mirror in the clearance of the bottom plate. CONSTITUTION: A single block unit 8 is provided with a bottom plate 16 and a plate 17 (having an internal surface coated with an applied material 18) which becomes a common mirror and a clearance (a) is maintained between the plates 16 and 17 with pillars 19. The bottom plate 16 has two side faces and supports, for example, four wedge-shaped plates 20 provided at average distances of a1 -a4 from the side faces of the plate 16. One side face of each plate 20 is coated with an applied material 21 for mirror which constitutes a Fizeau interferometer together with the applied material 18. The values of the average sizes a1 -a4 of the pillars 19 and plates 20 are governed by conditions which are in harmony with the average bases H1 -h4 of the interferometer. A laser beam 6 enters a container 24 through a window 25, is split into four beams 7 by the four mirrors 11, and irradiates the material 18. Then split beams form an interference pattern of a narrow zone behind the plate 17 and the pattern is photodetected 9 and data-processed 10. As a result, the position and width of the interference zone and the wavelength of the beam 6 are decided.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22215187A JPS6472017A (en) | 1987-09-07 | 1987-09-07 | Apparatus for measuring spectral characteristics of laser beam |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22215187A JPS6472017A (en) | 1987-09-07 | 1987-09-07 | Apparatus for measuring spectral characteristics of laser beam |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6472017A true JPS6472017A (en) | 1989-03-16 |
Family
ID=16777980
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP22215187A Pending JPS6472017A (en) | 1987-09-07 | 1987-09-07 | Apparatus for measuring spectral characteristics of laser beam |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6472017A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015233006A (en) * | 2014-06-02 | 2015-12-24 | シュネーデル、エレクトリック、インダストリーズ、エスアーエスSchneider Electric Industries Sas | Detection system |
-
1987
- 1987-09-07 JP JP22215187A patent/JPS6472017A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015233006A (en) * | 2014-06-02 | 2015-12-24 | シュネーデル、エレクトリック、インダストリーズ、エスアーエスSchneider Electric Industries Sas | Detection system |
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