JPS6466537A - Method and apparatus for analyzing hydrogen in gas - Google Patents

Method and apparatus for analyzing hydrogen in gas

Info

Publication number
JPS6466537A
JPS6466537A JP22453787A JP22453787A JPS6466537A JP S6466537 A JPS6466537 A JP S6466537A JP 22453787 A JP22453787 A JP 22453787A JP 22453787 A JP22453787 A JP 22453787A JP S6466537 A JPS6466537 A JP S6466537A
Authority
JP
Japan
Prior art keywords
gas
hydrogen
cell
sample gas
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP22453787A
Other languages
Japanese (ja)
Inventor
Akihiro Ono
Yuichi Akasaka
Isao Tozawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RIKEN KOGYO KK
Nippon Steel Corp
Original Assignee
RIKEN KOGYO KK
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RIKEN KOGYO KK, Nippon Steel Corp filed Critical RIKEN KOGYO KK
Priority to JP22453787A priority Critical patent/JPS6466537A/en
Publication of JPS6466537A publication Critical patent/JPS6466537A/en
Pending legal-status Critical Current

Links

Landscapes

  • Sampling And Sample Adjustment (AREA)
  • Investigating Or Analyzing Materials By The Use Of Fluid Adsorption Or Reactions (AREA)

Abstract

PURPOSE:To simplify operation, by a method wherein a gas containing more than 10% of oxygen running at a fixed flow rate is employed as carrier gas and a fixed amount of a sample gas previously measured is sent into a measuring cell with a semiconductor type hydrogen detector. CONSTITUTION:A sample gas is injected into a constant amount sample gas metering device 7 from a sample gas injector 5 and sent into a measuring cell 9 by a carrier gas from an air pump 1. A reference hydrogen gas is introduced into the cell 9 through a reference hydrogen gas metering device 8 to determine a correlationship between the concentration of hydrogen and an output signal of a hydrogen gas detector 10 beforehand. Then, the sample gas carried on the carrier gas flows into and passes through the cell 9 housed in a thermostatic cell 11 without being retained. Then, the concentration of hydrogen is calculated by a calibration curve formula with an output signal of the detector 10 previously stored in a data processor 14 and shown on a results of analysis display device 15, thereby achieving a handy determination.
JP22453787A 1987-09-08 1987-09-08 Method and apparatus for analyzing hydrogen in gas Pending JPS6466537A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22453787A JPS6466537A (en) 1987-09-08 1987-09-08 Method and apparatus for analyzing hydrogen in gas

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22453787A JPS6466537A (en) 1987-09-08 1987-09-08 Method and apparatus for analyzing hydrogen in gas

Publications (1)

Publication Number Publication Date
JPS6466537A true JPS6466537A (en) 1989-03-13

Family

ID=16815355

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22453787A Pending JPS6466537A (en) 1987-09-08 1987-09-08 Method and apparatus for analyzing hydrogen in gas

Country Status (1)

Country Link
JP (1) JPS6466537A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03156353A (en) * 1989-08-28 1991-07-04 Nippon Steel Corp Method and apparatus for analyzing gas component
US6637253B2 (en) * 2000-01-05 2003-10-28 Ion Science Limited Hydrogen collection and detection
JP2014077648A (en) * 2012-10-09 2014-05-01 Taiyo Nippon Sanso Corp Hydrogen analysis method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS551592A (en) * 1978-06-12 1980-01-08 Hoogusutoraatoomedeishiyue Tec Method and device for measuring hydrogen content of gas

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS551592A (en) * 1978-06-12 1980-01-08 Hoogusutoraatoomedeishiyue Tec Method and device for measuring hydrogen content of gas

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03156353A (en) * 1989-08-28 1991-07-04 Nippon Steel Corp Method and apparatus for analyzing gas component
US6637253B2 (en) * 2000-01-05 2003-10-28 Ion Science Limited Hydrogen collection and detection
JP2014077648A (en) * 2012-10-09 2014-05-01 Taiyo Nippon Sanso Corp Hydrogen analysis method

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