JPS646562Y2 - - Google Patents
Info
- Publication number
- JPS646562Y2 JPS646562Y2 JP1982178507U JP17850782U JPS646562Y2 JP S646562 Y2 JPS646562 Y2 JP S646562Y2 JP 1982178507 U JP1982178507 U JP 1982178507U JP 17850782 U JP17850782 U JP 17850782U JP S646562 Y2 JPS646562 Y2 JP S646562Y2
- Authority
- JP
- Japan
- Prior art keywords
- coaxial
- line
- jig
- fixing base
- center conductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004020 conductor Substances 0.000 claims description 14
- 230000008878 coupling Effects 0.000 claims description 4
- 238000010168 coupling process Methods 0.000 claims description 4
- 238000005859 coupling reaction Methods 0.000 claims description 4
- 230000007423 decrease Effects 0.000 claims 1
- 230000005684 electric field Effects 0.000 description 12
- 238000006243 chemical reaction Methods 0.000 description 9
- 238000010586 diagram Methods 0.000 description 8
- 230000005540 biological transmission Effects 0.000 description 7
- 230000008054 signal transmission Effects 0.000 description 6
- 238000005259 measurement Methods 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 230000002411 adverse Effects 0.000 description 3
- 239000000758 substrate Substances 0.000 description 2
Landscapes
- Communication Cables (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Description
【考案の詳細な説明】
本考案は同軸線路とマイクロストリツプ線路と
の結合手段に関する。[Detailed Description of the Invention] The present invention relates to means for coupling a coaxial line and a microstrip line.
一般に高周波帯域で信号を伝送する場合、各装
置間の接続点においてインピーダンスが異なる場
合、伝送される高周波信号は、信号の伝導方向に
対し、一部が逆方向へ反射する現象が生じる。反
射信号の大きさは、信号伝送線路の特性インピー
ダンスに対し、その接続点におけるインピーダン
スの差の大きさに影響され(1)式に示す関係があ
る。 Generally, when transmitting signals in a high frequency band, if the impedances differ at the connection points between devices, a portion of the transmitted high frequency signal is reflected in the opposite direction to the direction of signal transmission. The magnitude of the reflected signal is influenced by the difference in impedance at the connection point with respect to the characteristic impedance of the signal transmission line, and has the relationship shown in equation (1).
ρ＝１ZR−ZO／ZR＋ZO｜
ρ：反射係数 ０≦ρ≦１ −(1)
ZO：線路特性インピーダンス
ZR：装置間接続点インピーダンス
又、高周波信号の伝達度は（１−ρ）（０≦伝
達度≦１）として表わされる。従つて信号伝送線
路内において、各接続点のインピーダンスは可能
な限り線路の特性インピーダンスに等しく設計す
ることが望ましい条件である。例えば、測定治具
に固定された高周波半導体素子へ信号を入力する
際、一般に入力信号は同軸線路から送られてくる
が、測定治具内においてはマイクロストリツプ線
路で信号の伝送を行う。この様な場合、信号伝送
線路が異なる為、その間に信号伝送線路に悪影響
を及ぼさない変換素子を設ける必要がある。しか
しながら従来、この要求を充分に満足する変換素
子が提供されていなかつた。 ρ=1Z R −Z O /Z R +Z O | ρ: Reflection coefficient 0≦ρ≦1 −(1) Z O : Line characteristic impedance Z R : Inter-device connection point impedance Also, the transmissibility of high-frequency signals is (1 −ρ) (0≦transmissibility≦1). Therefore, in a signal transmission line, it is desirable to design the impedance of each connection point to be as equal as possible to the characteristic impedance of the line. For example, when inputting a signal to a high-frequency semiconductor element fixed to a measurement jig, the input signal is generally sent from a coaxial line, but within the measurement jig, the signal is transmitted using a microstrip line. In such a case, since the signal transmission lines are different, it is necessary to provide a conversion element between them that does not adversely affect the signal transmission lines. However, conventionally, no conversion element has been provided that fully satisfies this requirement.
本考案の目的は伝送信号の損失が少ない変換手
段をインピーダンスの異なる伝送路間に設けた高
周波装置を提供することである。特に同軸線路と
マイクロストリツプ線路との接続において線路間
に悪影響を及ぼさない変換素子を提供することで
ある。 An object of the present invention is to provide a high frequency device in which a conversion means with little transmission signal loss is provided between transmission lines having different impedances. Particularly, it is an object of the present invention to provide a conversion element that does not adversely affect the lines when connecting a coaxial line and a microstrip line.
以下図面を参照して、本考案に用いた信号伝送
モード変換手段について測定治具を例示して説明
する。 The signal transmission mode conversion means used in the present invention will be described below with reference to the drawings, illustrating a measuring jig.
一般に高周波信号は、マイクロストリツプ線
路、同軸線路及び導波管を用いて伝送される。同
軸線路における電界分布は、第１図ａに示すよう
に、中心導体１から外導体２へ誘電体３を通し、
一様な広がりを持つ分布となる。又、片側基板の
マイクロストリツプ線路（不平衡型）の電界分布
は、第１図ｂに示す如く、ストリツプ線路６から
出る電界は、基板（誘電体）４を通して接地導体
５の方向へ向う電界分布となる。従つて各々の線
路においては、このような電界分布の状態で信号
を伝送するのが最も好ましい条件であり、この状
態においては特性インピーダンスとのミスマツチ
を生じる原因を招くことはない。 Generally, high frequency signals are transmitted using microstrip lines, coaxial lines, and waveguides. As shown in Fig. 1a, the electric field distribution in the coaxial line passes from the center conductor 1 to the outer conductor 2 through the dielectric 3,
The distribution has a uniform spread. Furthermore, the electric field distribution of the microstrip line (unbalanced type) on one side of the substrate is as shown in FIG. This results in electric field distribution. Therefore, it is the most preferable condition for each line to transmit signals under such electric field distribution, and under this condition there will be no cause for mismatch with the characteristic impedance.
第２図ａに従来の測定治具の略図を示す。治具
本体１０に信号の入力及び出力端子として、高周
波信号において電気的特性が保障されている同軸
コネクタ１１を用いる。チツプキヤリアの状態に
あるトランジスタ１２を固定台１３に乗せ、同軸
コネクタ１１の中心導体１とトランジスタのキヤ
リア上に形成されているマイクロストリツプ線路
が接触する位置まで治具１０の下側より治具中央
部へトランジスタ１２を移動し固定台１３と治具
１０をネジで固定する。これは同軸コネクタ１１
より信号を入力しトランジスタの高周波特性の測
定を行う装置である。従来の治具は、同軸コネク
タを使用して伝送線路の変換を行う構造を用いて
いたが、同軸コネクタにおける伝送モードは同軸
線路のモードと同じであり、マイクロストリツプ
線路へ変換する場合、あるいはマイクロストリツ
プ線路から同軸線路へ変換する場合、電界分布の
みだれが生じ、信号の反射及び損失を生じてい
た。第２図ｂに、伝送モードの変換点、すなわち
Ａ−A′断面での電界の分布を示す。 FIG. 2a shows a schematic diagram of a conventional measuring jig. A coaxial connector 11 whose electrical characteristics are guaranteed for high-frequency signals is used in the jig main body 10 as a signal input and output terminal. Place the transistor 12 in the chip carrier state on the fixing base 13, and move the jig from below the jig 10 until the center conductor 1 of the coaxial connector 11 and the microstrip line formed on the carrier of the transistor contact each other. The transistor 12 is moved to the center and the fixing base 13 and jig 10 are fixed with screws. This is coaxial connector 11
This is a device that measures the high frequency characteristics of transistors by inputting signals. Conventional jigs have a structure in which a coaxial connector is used to convert the transmission line, but the transmission mode in the coaxial connector is the same as the mode of the coaxial line, so when converting to a microstrip line, Alternatively, when converting from a microstrip line to a coaxial line, the electric field distribution becomes distorted, causing signal reflection and loss. FIG. 2b shows the electric field distribution at the transmission mode conversion point, that is, at the A-A' cross section.
第３図ａに本考案の一実施例によるチツプキヤ
リアの状態にあるトランジスタの高周波特性を測
定する際に使用する治具の略図を示し、本考案を
詳細に説明する。高周波信号の入力及び出力コネ
クタ１４を治具１０に取り付け、コネクタの中心
導体１は、ある角度をもつて下向に曲げ、その直
径もマイクロストリツプ線路の幅に除々に等しく
するように形成する。チツプキヤリア上のマイク
ロストリツプ線路との接触部は平らな面とする。
トランジスタ１２を固定台１５に乗せ、ストリツ
プ線路が入力及び出力の同軸コネクタの中心導体
と接触する位置まで固定台１５によりトランジス
タを上方へ移動させる。キヤリア上のマイクロス
トリツプ線路が同軸コネクタの中心導体と接触す
る位置は、固定台１５のネジ部が全て締まる位置
と異なる為、この状態では固定台１５の位置を固
定できず、左右へネジ山のすき間分揺れが生じ、
測定に悪影響を及ぼす為、固定台１５の位置固定
用としてバネ性を利用した固定棒１６を用い、固
定台１５を矢印方向へ押えて揺れを防ぐようにす
る。 FIG. 3a shows a schematic diagram of a jig used for measuring the high frequency characteristics of a transistor in a chip carrier state according to an embodiment of the present invention, and the present invention will be explained in detail. The high-frequency signal input and output connector 14 is attached to the jig 10, and the center conductor 1 of the connector is bent downward at a certain angle, and its diameter is gradually made equal to the width of the microstrip line. do. The contact area with the microstrip line on the chip carrier shall be a flat surface.
The transistor 12 is placed on the fixed base 15, and the transistor is moved upward by the fixed base 15 until the strip line contacts the center conductor of the input and output coaxial connectors. The position where the microstrip line on the carrier contacts the center conductor of the coaxial connector is different from the position where all the screws of the fixing base 15 are tightened. Shaking occurred due to the gap in the mountain,
To prevent this from adversely affecting the measurement, a fixing rod 16 using spring properties is used to fix the position of the fixing table 15, and the fixing table 15 is held down in the direction of the arrow to prevent it from shaking.
第４図ａ，ｂ，ｃに本考案による伝送モードの
変換コネクタの各点Ａ，Ｂ，Ｃでの断面における
電界分布を示す。中心導体をある角度で外被導体
へ近づけることにより、同軸線路モードからマイ
クロストリツプ線路モードへ除々に変換が行なわ
れ、変換の際に生じていた電界分布の乱れを除く
ことができ、その結果反射波及び損失を従来の治
具に比べ小さくすることができる。勿論この考案
は測定装置に限られるものではなく、同軸線路と
ストリツプ線路との接合部に広く用いることがで
きる。 4a, b, and c show the electric field distribution in the cross section at each point A, B, and C of the transmission mode conversion connector according to the present invention. By bringing the center conductor closer to the outer conductor at a certain angle, the coaxial line mode is gradually converted to the microstrip line mode, and the disturbance in the electric field distribution that occurs during conversion can be removed. As a result, reflected waves and losses can be reduced compared to conventional jigs. Of course, this invention is not limited to measuring devices, but can be widely used for joints between coaxial lines and strip lines.
第１図ａは同軸線路の電界分布図、第１図ｂは
マイクロストリツプ線路電界分布図、第２図ａは
従来の測定治具の構成図、第２図ｂは、そのＡ−
A′面での伝送モード変換点における電界分布図、
第３図は本考案の一実施例による構成図、第４図
ａ〜ｃは本考案のコネクタの各断面の電界分布図
を示す。
１……同軸線路中心導体、２……誘電体、３…
…外被導体、４……基板（誘電体）、５……接地
導体、６……マイクロストリツプ線路、１０……
測定治具本体、１１……同軸コネクタ、１２……
被測定半導体素子、１３……半導体素子固定台、
１４……同軸コネクタ、１５……半導体素子固定
台、１６……固定台固定棒。
Figure 1a is an electric field distribution diagram of a coaxial line, Figure 1b is a microstrip line electric field distribution diagram, Figure 2a is a configuration diagram of a conventional measurement jig, and Figure 2b is an A-
Electric field distribution diagram at the transmission mode conversion point on the A′ plane,
FIG. 3 is a block diagram of an embodiment of the present invention, and FIGS. 4 a to 4 c are electric field distribution diagrams of each cross section of the connector of the present invention. 1... Coaxial line center conductor, 2... Dielectric, 3...
... Sheath conductor, 4 ... Substrate (dielectric), 5 ... Ground conductor, 6 ... Microstrip line, 10 ...
Measuring jig body, 11... Coaxial connector, 12...
Semiconductor element to be measured, 13... semiconductor element fixing stand,
14... Coaxial connector, 15... Semiconductor element fixing base, 16... Fixing base fixing rod.
Claims (1)
高周波結合装置において、治具本体と、前記治具
本体に取り付けられ前記同軸線路に接続される同
軸コネクタであつて所定の角度をもつて下方に曲
げられかつ先端部に向かうに従つて直径が除々に
小さくなつている中心導体を有する同軸コネクタ
と、前記ストリツプ線路が設けられさらにトラン
ジスタ素子が搭載された固定台であつて前記スト
リツプ線路が前記同軸コネクタの前記中心導体の
前記先端部に接触する位置まで前記治具本体にネ
ジ込みされた固定台と、前記治具本体に取り付け
られた固定棒であつて前記固定台をバネ性を利用
して前記治具本体に押え付けて前記固定台の位置
を固定する固定棒とを備えることを特徴とする高
周波結合装置。 A high frequency coupling device for coupling a coaxial line and a strip line includes a jig body and a coaxial connector attached to the jig body and connected to the coaxial line, which is bent downward at a predetermined angle. and a coaxial connector having a center conductor whose diameter gradually decreases toward the tip, and a fixing base on which the strip line is provided and a transistor element is mounted, the strip line being connected to the coaxial connector. A fixing base screwed into the jig main body to a position where it contacts the tip end of the center conductor, and a fixing rod attached to the jig main body, the fixing base is screwed into the jig body to a position where it contacts the tip end of the center conductor. A high-frequency coupling device comprising: a fixing rod that is pressed against a tool body to fix the position of the fixing base.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17850782U JPS5984903U (en) | 1982-11-26 | 1982-11-26 | High frequency coupling device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17850782U JPS5984903U (en) | 1982-11-26 | 1982-11-26 | High frequency coupling device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5984903U JPS5984903U (en) | 1984-06-08 |
| JPS646562Y2 true JPS646562Y2 (en) | 1989-02-21 |
Family
ID=30387537
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17850782U Granted JPS5984903U (en) | 1982-11-26 | 1982-11-26 | High frequency coupling device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5984903U (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0760966B2 (en) * | 1985-10-09 | 1995-06-28 | 松下電器産業株式会社 | Microwave circuit device |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5691503A (en) * | 1979-12-26 | 1981-07-24 | Nec Corp | Coaxial microstrip converter |
-
1982
- 1982-11-26 JP JP17850782U patent/JPS5984903U/en active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5691503A (en) * | 1979-12-26 | 1981-07-24 | Nec Corp | Coaxial microstrip converter |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5984903U (en) | 1984-06-08 |
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