JPS6463855A - Flaw detection apparatus - Google Patents

Abstract

PURPOSE:To perform flaw detection with good accuracy without leaving a flaw non- detecting region, by dividing, contacting and separating a flaw detection probe corresponding to the inclination like distribution of the leading and rear end positions of a material to be inspected detected by measuring the positions of the leading and rear ends of said material to be inspected. CONSTITUTION:In a flaw detection apparatus, when there is inclination like distribution at the positions of the leading and rear ends of a material to be inspected due to the configuration inclination or oblique feed of the leading and a rear end parts of a material 1 to be inspected when the leading and rear end parts of the material 1 to be inspected pass detectors 3, 4 for detecting the leading and rear ends of the material 1 to be inspected, difference is generated between the leading and rear end detection timings in the detectors 3, 4 for detecting the leading and rear ends of the material to be inspected. In a tracking processing apparatus 7, the difference between said leading and rear end detection timings is utilized to perform operation and a contact and separation material order is outputted so that the split blocks P1-Pn of a separation and contact material type flaw detection probe 9 successively contact and separate with respect to a probe contact and separation material driving apparatus 8 at the point of time when the leading and rear ends of the material arrive.