JPS646044U - - Google Patents

Info

Publication number
JPS646044U
JPS646044U JP10146587U JP10146587U JPS646044U JP S646044 U JPS646044 U JP S646044U JP 10146587 U JP10146587 U JP 10146587U JP 10146587 U JP10146587 U JP 10146587U JP S646044 U JPS646044 U JP S646044U
Authority
JP
Japan
Prior art keywords
probe
semiconductor wafer
stage
cleaning member
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10146587U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10146587U priority Critical patent/JPS646044U/ja
Publication of JPS646044U publication Critical patent/JPS646044U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Cleaning In General (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP10146587U 1987-06-30 1987-06-30 Pending JPS646044U (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10146587U JPS646044U (fr) 1987-06-30 1987-06-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10146587U JPS646044U (fr) 1987-06-30 1987-06-30

Publications (1)

Publication Number Publication Date
JPS646044U true JPS646044U (fr) 1989-01-13

Family

ID=31330486

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10146587U Pending JPS646044U (fr) 1987-06-30 1987-06-30

Country Status (1)

Country Link
JP (1) JPS646044U (fr)

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