JPH0227578U - - Google Patents
Info
- Publication number
- JPH0227578U JPH0227578U JP10611888U JP10611888U JPH0227578U JP H0227578 U JPH0227578 U JP H0227578U JP 10611888 U JP10611888 U JP 10611888U JP 10611888 U JP10611888 U JP 10611888U JP H0227578 U JPH0227578 U JP H0227578U
- Authority
- JP
- Japan
- Prior art keywords
- socket
- devices
- probes
- terminals
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Connecting Device With Holders (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1988106118U JPH0726714Y2 (ja) | 1988-08-11 | 1988-08-11 | Icソケット |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1988106118U JPH0726714Y2 (ja) | 1988-08-11 | 1988-08-11 | Icソケット |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0227578U true JPH0227578U (fr) | 1990-02-22 |
JPH0726714Y2 JPH0726714Y2 (ja) | 1995-06-14 |
Family
ID=31339344
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1988106118U Expired - Lifetime JPH0726714Y2 (ja) | 1988-08-11 | 1988-08-11 | Icソケット |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0726714Y2 (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07113840A (ja) * | 1993-09-21 | 1995-05-02 | Micron Technol Inc | 半導体ダイの試験に使用される交換可能な基板を備えたキャリア |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5961051A (ja) * | 1982-09-30 | 1984-04-07 | Fujitsu Ltd | Icソケツト |
JPS62160676A (ja) * | 1985-12-31 | 1987-07-16 | 日本テキサス・インスツルメンツ株式会社 | ソケツト |
-
1988
- 1988-08-11 JP JP1988106118U patent/JPH0726714Y2/ja not_active Expired - Lifetime
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5961051A (ja) * | 1982-09-30 | 1984-04-07 | Fujitsu Ltd | Icソケツト |
JPS62160676A (ja) * | 1985-12-31 | 1987-07-16 | 日本テキサス・インスツルメンツ株式会社 | ソケツト |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07113840A (ja) * | 1993-09-21 | 1995-05-02 | Micron Technol Inc | 半導体ダイの試験に使用される交換可能な基板を備えたキャリア |
Also Published As
Publication number | Publication date |
---|---|
JPH0726714Y2 (ja) | 1995-06-14 |