JPS6455798A - Semiconductor integrated circuit - Google Patents
Semiconductor integrated circuitInfo
- Publication number
- JPS6455798A JPS6455798A JP62210232A JP21023287A JPS6455798A JP S6455798 A JPS6455798 A JP S6455798A JP 62210232 A JP62210232 A JP 62210232A JP 21023287 A JP21023287 A JP 21023287A JP S6455798 A JPS6455798 A JP S6455798A
- Authority
- JP
- Japan
- Prior art keywords
- inputted
- gate
- condition
- input terminal
- potential condition
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Techniques For Improving Reliability Of Storages (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Abstract
PURPOSE:To select a preliminary memory bit without fail by deciding the potential condition of a transistor connected to a setting input terminal while other edge of a fuse is connected to a source immediately after an address is fetched and holding this with an FF circuit. CONSTITUTION:To a setting input terminal S of an FF 17, the potential condition of a node N, namely, an H or L level is inputted by the cutting condition of fuses 1-6 of a redundant circuit and the potential condition is stably held. To an input terminal C, a setting clock signal SCK is inputted from a column address fetching signal 1CAS after a constant delaying time. From an output terminal Q and inversion Q, the output to hold the potential condition of the node N is inputted to the gate of transistors (TR) 14 and 15. The TR 14 and 15 are turned on and off in the condition of the H or L level of a clock signal CK and the gate inputted after the delaying time of the constant time from a row address fetching signal, and to the gate of a transistor for a transfer gate between an preliminary or ordinary memory bit line and a data line, a switching signal SCL or CL is sent.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62210232A JP2519468B2 (en) | 1987-08-26 | 1987-08-26 | Semiconductor integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62210232A JP2519468B2 (en) | 1987-08-26 | 1987-08-26 | Semiconductor integrated circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6455798A true JPS6455798A (en) | 1989-03-02 |
JP2519468B2 JP2519468B2 (en) | 1996-07-31 |
Family
ID=16585972
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62210232A Expired - Lifetime JP2519468B2 (en) | 1987-08-26 | 1987-08-26 | Semiconductor integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2519468B2 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0512898A (en) * | 1991-07-08 | 1993-01-22 | Nec Corp | Semiconductor integrated circuit device |
EP0704800A3 (en) * | 1994-09-28 | 1999-03-10 | Nec Corporation | Semiconductor memory device including redundant bit line selection signal generating circuit |
EP0780764A3 (en) * | 1995-12-18 | 1999-04-14 | Samsung Electronics Co., Ltd. | A redundancy circuit for memory devices having high frequency addressing cycles |
-
1987
- 1987-08-26 JP JP62210232A patent/JP2519468B2/en not_active Expired - Lifetime
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0512898A (en) * | 1991-07-08 | 1993-01-22 | Nec Corp | Semiconductor integrated circuit device |
EP0704800A3 (en) * | 1994-09-28 | 1999-03-10 | Nec Corporation | Semiconductor memory device including redundant bit line selection signal generating circuit |
EP0780764A3 (en) * | 1995-12-18 | 1999-04-14 | Samsung Electronics Co., Ltd. | A redundancy circuit for memory devices having high frequency addressing cycles |
Also Published As
Publication number | Publication date |
---|---|
JP2519468B2 (en) | 1996-07-31 |
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