JPS6455466U - - Google Patents

Info

Publication number
JPS6455466U
JPS6455466U JP15083587U JP15083587U JPS6455466U JP S6455466 U JPS6455466 U JP S6455466U JP 15083587 U JP15083587 U JP 15083587U JP 15083587 U JP15083587 U JP 15083587U JP S6455466 U JPS6455466 U JP S6455466U
Authority
JP
Japan
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contact
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Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15083587U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0634707Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987150835U priority Critical patent/JPH0634707Y2/ja
Publication of JPS6455466U publication Critical patent/JPS6455466U/ja
Application granted granted Critical
Publication of JPH0634707Y2 publication Critical patent/JPH0634707Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
JP1987150835U 1987-09-30 1987-09-30 Ic検査用ピンブロック Expired - Lifetime JPH0634707Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987150835U JPH0634707Y2 (ja) 1987-09-30 1987-09-30 Ic検査用ピンブロック

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987150835U JPH0634707Y2 (ja) 1987-09-30 1987-09-30 Ic検査用ピンブロック

Publications (2)

Publication Number Publication Date
JPS6455466U true JPS6455466U (fr) 1989-04-05
JPH0634707Y2 JPH0634707Y2 (ja) 1994-09-07

Family

ID=31424332

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987150835U Expired - Lifetime JPH0634707Y2 (ja) 1987-09-30 1987-09-30 Ic検査用ピンブロック

Country Status (1)

Country Link
JP (1) JPH0634707Y2 (fr)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5729872U (fr) * 1980-07-28 1982-02-17
JPS6139629A (ja) * 1984-07-30 1986-02-25 Fujitsu Ten Ltd 無線装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5729872U (fr) * 1980-07-28 1982-02-17
JPS6139629A (ja) * 1984-07-30 1986-02-25 Fujitsu Ten Ltd 無線装置

Also Published As

Publication number Publication date
JPH0634707Y2 (ja) 1994-09-07

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