JPS6438576U - - Google Patents
Info
- Publication number
- JPS6438576U JPS6438576U JP13303787U JP13303787U JPS6438576U JP S6438576 U JPS6438576 U JP S6438576U JP 13303787 U JP13303787 U JP 13303787U JP 13303787 U JP13303787 U JP 13303787U JP S6438576 U JPS6438576 U JP S6438576U
- Authority
- JP
- Japan
- Prior art keywords
- electrical components
- whose
- diode
- common
- gate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13303787U JPS6438576U (OSRAM) | 1987-08-31 | 1987-08-31 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13303787U JPS6438576U (OSRAM) | 1987-08-31 | 1987-08-31 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6438576U true JPS6438576U (OSRAM) | 1989-03-08 |
Family
ID=31390547
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13303787U Pending JPS6438576U (OSRAM) | 1987-08-31 | 1987-08-31 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6438576U (OSRAM) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020116236A1 (ja) * | 2018-12-06 | 2020-06-11 | 日本電産リード株式会社 | 検査装置、検査方法、及び検査装置用プログラム |
-
1987
- 1987-08-31 JP JP13303787U patent/JPS6438576U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020116236A1 (ja) * | 2018-12-06 | 2020-06-11 | 日本電産リード株式会社 | 検査装置、検査方法、及び検査装置用プログラム |
| JPWO2020116236A1 (ja) * | 2018-12-06 | 2021-10-14 | 日本電産リード株式会社 | 検査装置、検査方法、及び検査装置用プログラム |