JPS643546A - Detection of solid surface and internal defect by photoelasticity method - Google Patents

Detection of solid surface and internal defect by photoelasticity method

Info

Publication number
JPS643546A
JPS643546A JP15856687A JP15856687A JPS643546A JP S643546 A JPS643546 A JP S643546A JP 15856687 A JP15856687 A JP 15856687A JP 15856687 A JP15856687 A JP 15856687A JP S643546 A JPS643546 A JP S643546A
Authority
JP
Japan
Prior art keywords
defect
polarizers
main axes
dust
affected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15856687A
Other languages
Japanese (ja)
Inventor
Kazuhiro Date
Yukihiro Tabata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NIPPON KURAUTO KUREEMAA FUERUSUTAA KK
KJTD Co Ltd
Original Assignee
NIPPON KURAUTO KUREEMAA FUERUSUTAA KK
KJTD Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NIPPON KURAUTO KUREEMAA FUERUSUTAA KK, KJTD Co Ltd filed Critical NIPPON KURAUTO KUREEMAA FUERUSUTAA KK
Priority to JP15856687A priority Critical patent/JPS643546A/en
Publication of JPS643546A publication Critical patent/JPS643546A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To detect the defect of a material to be inspected without being affected by dust, etc., sticking thereto by using a photoelasticity experimenting apparatus of a flat plane polarization type and synthesizing >=2 picture element signals specified in the angle between the main axes of polarizers. CONSTITUTION:The light from a light source 4 which emits continuous rays of an adequate wavelength is transmitted through the material 1 to be inspected disposed between the polarizers 2 via lenses 3 and is projected to a photodetector 6 of a video camera, etc. The polarizers 2 are rotated by motors M in the state of the main axes thereof intersecting orthogonally with each other and the image is picked up in such a manner that the angle theta between the main axes thereof attains the value approximate to pi(2n+1)/4 (n is an integer). The brightnesses at the respective points corresponding to the two image signals of such relative angle are added by which the value corresponding to the main stress is obtd. The stresses concentrate near to the defect of material in general and, therefore, the defect is detectable without being affected by the dust, etc.
JP15856687A 1987-06-25 1987-06-25 Detection of solid surface and internal defect by photoelasticity method Pending JPS643546A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15856687A JPS643546A (en) 1987-06-25 1987-06-25 Detection of solid surface and internal defect by photoelasticity method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15856687A JPS643546A (en) 1987-06-25 1987-06-25 Detection of solid surface and internal defect by photoelasticity method

Publications (1)

Publication Number Publication Date
JPS643546A true JPS643546A (en) 1989-01-09

Family

ID=15674496

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15856687A Pending JPS643546A (en) 1987-06-25 1987-06-25 Detection of solid surface and internal defect by photoelasticity method

Country Status (1)

Country Link
JP (1) JPS643546A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5325755A (en) * 1990-03-23 1994-07-05 Kabushiki Kaisha Komatsu Seisakusho Punch press
WO1998015871A1 (en) * 1996-10-07 1998-04-16 Hitachi, Ltd. Method of manufacturing liquid crystal display, optically inspecting instrument, and optically inspecting method
KR20010063550A (en) * 1999-12-22 2001-07-09 권문구 Measurement method of mechanical stress in cable insulation
JP2013088293A (en) * 2011-10-18 2013-05-13 Niigata Univ Method for detecting cutting plane

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5325755A (en) * 1990-03-23 1994-07-05 Kabushiki Kaisha Komatsu Seisakusho Punch press
WO1998015871A1 (en) * 1996-10-07 1998-04-16 Hitachi, Ltd. Method of manufacturing liquid crystal display, optically inspecting instrument, and optically inspecting method
KR20010063550A (en) * 1999-12-22 2001-07-09 권문구 Measurement method of mechanical stress in cable insulation
JP2013088293A (en) * 2011-10-18 2013-05-13 Niigata Univ Method for detecting cutting plane

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