JPS6435202A - Touch probe - Google Patents

Touch probe

Info

Publication number
JPS6435202A
JPS6435202A JP19141487A JP19141487A JPS6435202A JP S6435202 A JPS6435202 A JP S6435202A JP 19141487 A JP19141487 A JP 19141487A JP 19141487 A JP19141487 A JP 19141487A JP S6435202 A JPS6435202 A JP S6435202A
Authority
JP
Japan
Prior art keywords
probe
contact
measured
elastic
touch probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19141487A
Other languages
Japanese (ja)
Inventor
Susumu Terasawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Seimitsu Co Ltd
Original Assignee
Tokyo Seimitsu Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Seimitsu Co Ltd filed Critical Tokyo Seimitsu Co Ltd
Priority to JP19141487A priority Critical patent/JPS6435202A/en
Publication of JPS6435202A publication Critical patent/JPS6435202A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To obtain a touch probe characterized by excellent reliability and easy manufacture, by constituting a seating mechanism part, which positions and stabilizes a probe, and an electric contact mechanism part in a separated pattern. CONSTITUTION:An attaching rod 10 of the main body of a touch probe is mounted and held on the attaching head of a measuring machine. A probe 6a is brought into contact with a material to be measured (not shown) in the horizontal direction of either X or Y or in the oblique direction. Then, a base contact material 7 is turned by elastic deformation with a small diameter elastic part 9a of a linking shaft 9 as a fulcrum through a probe shaft 6. For example, when the material to be measured is positioned at the left side of the probe 6a, the right side end part of the base contact material 7 is lifted by said turning, and the left side end part is lowered. By the motion of the right side, a contact point 7a of said part is separated from an elastic fixed contact point 8 on the side of a casing. Namely, an electric circuit is made OFF, and a contact signal is issued.
JP19141487A 1987-07-30 1987-07-30 Touch probe Pending JPS6435202A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19141487A JPS6435202A (en) 1987-07-30 1987-07-30 Touch probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19141487A JPS6435202A (en) 1987-07-30 1987-07-30 Touch probe

Publications (1)

Publication Number Publication Date
JPS6435202A true JPS6435202A (en) 1989-02-06

Family

ID=16274215

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19141487A Pending JPS6435202A (en) 1987-07-30 1987-07-30 Touch probe

Country Status (1)

Country Link
JP (1) JPS6435202A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5253428A (en) * 1990-02-23 1993-10-19 Renishaw Plc Touch probe
US5323540A (en) * 1990-02-23 1994-06-28 Renishaw Metrology Ltd. Touch probe
US5353514A (en) * 1990-02-23 1994-10-11 Renishaw, Plc Touch probe
US5491904A (en) * 1990-02-23 1996-02-20 Mcmurtry; David R. Touch probe

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5253428A (en) * 1990-02-23 1993-10-19 Renishaw Plc Touch probe
US5323540A (en) * 1990-02-23 1994-06-28 Renishaw Metrology Ltd. Touch probe
US5353514A (en) * 1990-02-23 1994-10-11 Renishaw, Plc Touch probe
US5491904A (en) * 1990-02-23 1996-02-20 Mcmurtry; David R. Touch probe
US5669152A (en) * 1990-02-23 1997-09-23 Renishaw, Plc Touch probe

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