JPS6430242U - - Google Patents
Info
- Publication number
- JPS6430242U JPS6430242U JP12380787U JP12380787U JPS6430242U JP S6430242 U JPS6430242 U JP S6430242U JP 12380787 U JP12380787 U JP 12380787U JP 12380787 U JP12380787 U JP 12380787U JP S6430242 U JPS6430242 U JP S6430242U
- Authority
- JP
- Japan
- Prior art keywords
- print data
- data input
- storage means
- printing
- data storage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000013500 data storage Methods 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Record Information Processing For Printing (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12380787U JPS6430242U (enExample) | 1987-08-14 | 1987-08-14 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12380787U JPS6430242U (enExample) | 1987-08-14 | 1987-08-14 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6430242U true JPS6430242U (enExample) | 1989-02-23 |
Family
ID=31372999
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12380787U Pending JPS6430242U (enExample) | 1987-08-14 | 1987-08-14 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6430242U (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7215419B2 (en) | 2001-12-12 | 2007-05-08 | Tokyo Electron Limited | Method and apparatus for position-dependent optical metrology calibration |
-
1987
- 1987-08-14 JP JP12380787U patent/JPS6430242U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7215419B2 (en) | 2001-12-12 | 2007-05-08 | Tokyo Electron Limited | Method and apparatus for position-dependent optical metrology calibration |
| US7224450B2 (en) | 2001-12-12 | 2007-05-29 | Tokyo Electron Limited | Method and apparatus for position-dependent optical metrology calibration |